Method for producing activated carbon for electrode of electric double-layer capacitor
    31.
    发明授权
    Method for producing activated carbon for electrode of electric double-layer capacitor 失效
    双电层电容器用电极活性炭的制备方法

    公开(公告)号:US07214646B1

    公开(公告)日:2007-05-08

    申请号:US10048470

    申请日:2000-08-09

    IPC分类号: C01B31/08

    摘要: To produce activated carbon for an electrode of an electric double-layer capacitor, the following steps are carried out sequentially: a step of subjecting a massive mesophase pitch to a pulverizing treatment to provide a pulverized powder; a step of subjecting the pulverized powder to an infusibilizing treatment under conditions of a temperature in a range of 300° C. (inclusive) to 450° C. (inclusive) in the atmospheric air current, a step of subjecting the pulverized powder to a carbonizing treatment under conditions of a temperature in a range of 600° C. (inclusive) to 900° C. (inclusive) in an inert gas current to provide a carbonized powder, a step of subjecting the carbonized powder to an alkali activating treatment under conditions of a temperature in a range of 500° C. (inclusive) to 1,000° C. (inclusive) in an inert gas atmosphere, followed by the post treatments, thereby producing alkali-activated carbon, and a step of subjecting the alkali-activated carbon to a pulverizing treatment. If an electrode is produced using the activated carbon, the electrode density can be increased.

    摘要翻译: 为了制造双电层电容器的电极用活性炭,依次进行以下步骤:将大量的中间相沥青进行粉碎处理以提供粉碎粉末的步骤; 在大气气流中,在温度范围为300℃〜450℃的条件下对粉碎粉进行渗透处理的工序,将粉碎粉末 在惰性气流中在600℃(含)〜900℃(以下)的温度条件下进行碳化处理,得到碳化粉末,将碳化粉末进行碱活化处理的工序 在惰性气体气氛中,在500℃(含)-100℃(含)范围内的温度条件进行后处理,从而制造碱活性炭, 活性炭进行粉碎处理。 如果使用活性炭制造电极,则可以提高电极密度。

    Electric double layer capacitor
    33.
    发明申请
    Electric double layer capacitor 失效
    双电层电容器

    公开(公告)号:US20060209493A1

    公开(公告)日:2006-09-21

    申请号:US11373258

    申请日:2006-03-13

    IPC分类号: H01G4/228

    摘要: An electric double layer capacitor in which gas generation due to decomposition of a solvent of an electrolyte solution in the capacitor is reduced and performance maintaining ratio is superior, is provided by a method which is different from a method of adding additives to the electrolyte solution. The electric double layer capacitor has activated carbon polarizing electrodes and a non-water-based solvent, and a positive electrode of the activated carbon polarizing electrodes contains an antacid agent.

    摘要翻译: 通过与向电解液中添加添加剂的方法不同的方法,提供了电容器中由于电解质溶液的溶剂分解而产生气体而保持性能优异的电双层电容器。 双电层电容器具有活性碳极化电极和非水性溶剂,活性碳极化电极的正极含有抗酸剂。

    Semiconductor integrated circuit device with test data output nodes for parallel test results output
    34.
    发明授权
    Semiconductor integrated circuit device with test data output nodes for parallel test results output 失效
    半导体集成电路器件具有测试数据输出节点,用于并行测试结果输出

    公开(公告)号:US07047461B2

    公开(公告)日:2006-05-16

    申请号:US10322676

    申请日:2002-12-19

    IPC分类号: G11C29/00

    CPC分类号: G11C29/1201 G11C29/24

    摘要: A semiconductor integrated circuit device includes test data output nodes arranged in a width of a plurality of bits and an internal data bus, greater in bit width than the test data output nodes, for transferring internal data. A predetermined number of bits of the internal data on the internal data bus are compared with bits of test expected value data equal in bit width to the test data output nodes for each bit. The predetermined number of bits of the internal data are selected in accordance with a test address signal. The bits selected is compared with the respective bits of the test expected valued data. Data indicating respective comparison results are output to the test data output nodes in parallel.

    摘要翻译: 半导体集成电路器件包括以多个位宽度布置的测试数据输出节点和内部数据总线,其位宽比测试数据输出节点更大,用于传送内部数据。 将内部数据总线上的内部数据的预定数量的比特与针对每个比特的测试数据输出节点的比特宽度相等的测试期望值数据的比特进行比较。 根据测试地址信号选择内部数据的预定位数。 所选择的比较与测试期望值数据的各个比特。 指示各个比较结果的数据被并行地输出到测试数据输出节点。

    Semiconductor memory device having row-related circuit operating at high speed
    35.
    发明授权
    Semiconductor memory device having row-related circuit operating at high speed 失效
    具有行相关电路的半导体存储器件以高速工作

    公开(公告)号:US06507532B1

    公开(公告)日:2003-01-14

    申请号:US09722687

    申请日:2000-11-28

    IPC分类号: G11C800

    CPC分类号: G11C8/12 G11C8/18 G11C11/4087

    摘要: A central row-related control circuit transmits an internal row address signal to each memory sub block in banks of memory mats asynchronously with an external clock signal, and latches a block selection signal for specifying a memory sub block synchronously with an internal clock signal for one clock cycle period for transmission to each memory sub block. A spare determination circuit performs spare determination asynchronously with the clock signal. A semiconductor memory device easily adaptable to bank expansion without increase of the chip area and capable of implementing a high speed access can be provided.

    摘要翻译: 中央行相关控制电路与外部时钟信号异步地将内部行地址信号发送到存储器存储体中的每个存储器子块,并且与一个内部时钟信号同步地锁存用于指定存储器子块的块选择信号 时钟周期,用于传输到每个存储器子块。 备用确定电路与时钟信号异步地执行备用确定。 可以提供容易适应银行扩张的半导体存储器件,而不增加芯片面积并且能够实现高速存取。

    Dynamic semiconductor memory device
    37.
    发明授权
    Dynamic semiconductor memory device 失效
    动态半导体存储器件

    公开(公告)号:US6151244A

    公开(公告)日:2000-11-21

    申请号:US176029

    申请日:1998-10-21

    CPC分类号: G11C11/401 G11C11/4074

    摘要: Memory cell minimum units (MCU) formed of multi-bit one transistor/one capacitor type memory cells are repeatedly arranged in a column direction, and bit line contacts (BCT) are shifted in the column direction relative to a row direction. The bit line contacts are repeatedly shifted with a prescribed number of bit lines as a unit. A set of a read bit line onto which memory cell data are read and a reference bit line supplying a reference potential can be obtained by controlling the voltage of cell plate lines and bit lines for each set of bit lines. Accordingly, a memory cell occupation area can be reduced and sensing operation in the folded bit line arrangement is possible. Consequently, a memory cell occupation area per one bit can be dramatically reduced and sensing operation in the folded bit line arrangement can be performed.

    摘要翻译: 由多位一晶体管/一电容型存储单元形成的存储单元最小单元(MCU)沿列方向重复排列,并且位线接触(BCT)相对于行方向在列方向上偏移。 位线接点以规定数量的位线为单位重复移位。 通过控制每组位线的单元板线和位线的电压,可以获得读取存储单元数据的读取位线和提供参考电位的参考位线的集合。 因此,可以减小存储器单元占用面积,并且折叠位线布置中的感测操作是可能的。 因此,可以显着减少每一位的存储单元占用面积,并且可以执行折叠位线布置中的感测操作。

    Semiconductor memory device having hierarchical word line structure
    38.
    发明授权
    Semiconductor memory device having hierarchical word line structure 失效
    具有分层字线结构的半导体存储器件

    公开(公告)号:US5966340A

    公开(公告)日:1999-10-12

    申请号:US960286

    申请日:1997-10-29

    CPC分类号: G11C7/18 G11C8/14

    摘要: Conductive lines for electrostatic shielding including at least one signal line are arranged between a global data I/O bus line and a ground line transmitting a ground voltage to a nonselected word line through a sub-decoder. Capacitive coupling between bus lines included in the global data I/O bus and the ground line is suppressed, and floating up of a ground voltage on the nonselected word line is prevented.

    摘要翻译: 包括至少一条信号线的用于静电屏蔽的导电线被布置在全局数据I / O总线与通过子解码器将接地电压发送到非选择字线的接地线之间。 包含在全局数据I / O总线和地线之间的总线之间的电容耦合被抑制,并且防止非选定字线上的接地电压浮起。

    Method of manufacturing semiconductor memory device capable of readily
repairing defective portion resulting from mask defect
    39.
    发明授权
    Method of manufacturing semiconductor memory device capable of readily repairing defective portion resulting from mask defect 失效
    制造能够容易地修复由掩模缺陷产生的缺陷部分的半导体存储器件的制造方法

    公开(公告)号:US5960253A

    公开(公告)日:1999-09-28

    申请号:US899814

    申请日:1997-07-24

    申请人: Takeshi Fujino

    发明人: Takeshi Fujino

    CPC分类号: H01L27/10897

    摘要: A method of manufacturing a semiconductor memory device includes a first step of forming a plurality of memory cells with a redundancy portion through fine patterning, a second step of searching a defect in masks used in the fine patterning and a third step of forming offset via holes so as to interconnect the redundancy portion instead of a defective portion identified by an inspection in non-fine patterning conducted after the fine patterning.

    摘要翻译: 一种制造半导体存储器件的方法包括:通过精细图案化形成具有冗余部分的多个存储单元的第一步骤,在精细图案化中使用的掩模中搜索缺陷的第二步骤和形成偏移通孔的第三步骤 以便在精细图案化之后进行的非精细图案中互连冗余部分而不是通过检查识别的缺陷部分。

    TAMPER-RESISTANT MEMORY INTEGRATED CIRCUIT AND ENCRYPTION CIRCUIT USING SAME
    40.
    发明申请
    TAMPER-RESISTANT MEMORY INTEGRATED CIRCUIT AND ENCRYPTION CIRCUIT USING SAME 有权
    使用相同的阻抗记忆体集成电路和加密电路

    公开(公告)号:US20130129083A1

    公开(公告)日:2013-05-23

    申请号:US13812628

    申请日:2010-07-28

    申请人: Takeshi Fujino

    发明人: Takeshi Fujino

    摘要: The present invention provides an integrated memory circuit applicable to an S-box of a cryptographic circuit, the integrated memory circuit having a row decoder, a column decoder, and a sense amplifier composed of a domino-RSL circuit, wherein data reading and data writing from/to memory cells of a memory cell array are performed via two complementary bit lines, and the transition probability of a signal line is equalized by input of random-number data supplied from a random-number generating circuit using an arbiter circuit.

    摘要翻译: 本发明提供了一种适用于密码电路的S盒的集成存储器电路,该集成存储电路具有行解码器,列解码器和由多米诺骨牌RSL电路组成的读出放大器,其中数据读取和数据写入 通过两条互补位线执行存储单元阵列的存储单元的存储单元,通过使用仲裁器电路从随机数产生电路输入的随机数数据的输入来均衡信号线的转移概率。