OPTICAL ANALYZER
    32.
    发明申请
    OPTICAL ANALYZER 审中-公开

    公开(公告)号:US20180003628A1

    公开(公告)日:2018-01-04

    申请号:US15545387

    申请日:2016-01-19

    Inventor: Taichi YUASA

    Abstract: A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.

    OPTICAL MEASURING DEVICE AND DEVICE HAVING OPTICAL SYSTEM
    35.
    发明申请
    OPTICAL MEASURING DEVICE AND DEVICE HAVING OPTICAL SYSTEM 审中-公开
    光学测量装置和具有光学系统的装置

    公开(公告)号:US20160252451A1

    公开(公告)日:2016-09-01

    申请号:US15028990

    申请日:2014-10-09

    Inventor: Etsuo Kawate

    Abstract: A device including an optical measuring device and an optical system which can measure the light intensity of the scattered light from the sample and the spatial distribution of the scattered light and which is excellent in the sensitivity is provided. In the device, the image distortion is suppressed by providing such a structure that the light emitted from the first substance is reflected by the ellipsoidal mirror two or more even times before reaching the second substance. The image distortion is suppressed by arranging two ellipsoidal mirrors so that respective one focuses are set to a common focus while remaining other two focuses are arranged on one line so as to be opposite to each other across the common focus, setting the common focus to a blank, arranging a first substance on one of the focuses, and arranging a second substance on the other of the focuses.

    Abstract translation: 提供了一种能够测量来自样品的散射光的光强度和散射光的空间分布并且灵敏度优异的光学测量装置和光学系统的装置。 在该装置中,通过提供这样的结构来抑制图像失真,使得从第一物质发射的光在到达第二物质之前两次或更多次被椭球镜反射。 通过布置两个椭球镜来抑制图像失真,使得相应的一个焦点被设置为公共焦点,而剩下的另外两个焦点被布置在一条线上,以便在公共焦点上彼此相对,将公共焦点设置为 在第一个焦点上安排第一个物质,并将另一个物质放在焦点的另一个上。

    LIGHT COLLECTION FROM DNV SENSORS
    37.
    发明申请
    LIGHT COLLECTION FROM DNV SENSORS 审中-公开
    来自DNV传感器的灯光收集

    公开(公告)号:US20170023487A1

    公开(公告)日:2017-01-26

    申请号:US15003062

    申请日:2016-01-21

    Inventor: Brian P. Boesch

    Abstract: Methods and configurations are disclosed for an efficient collection of fluorescence emitted by the nitrogen vacancies of a diamond of a DNV sensor. Some implementations may include a diamond having a nitrogen vacancy and a reflector positioned about the diamond to reflect a portion of light emitted from the diamond. In some implementations the reflector may be parabolic or ellipsoidal. In some implementations, DNV sensor may have a reflector and a concentrator. Other implementations may include a diamond with a nitrogen vacancy and a reflector positioned about the diamond to reflect a portion of light emitted from the diamond using a dielectric mirror film applied to the reflector. Still other implementations may have a diamond with a nitrogen vacancy and a dielectric mirror film coated on the diamond.

    Abstract translation: 公开了用于有效收集由DNV传感器的金刚石的氮空位发射的荧光的方法和构造。 一些实施方案可以包括具有氮空位的金刚石和围绕金刚石定位的反射器以反射从金刚石发射的光的一部分。 在一些实施方案中,反射器可以是抛物线形或椭球形的。 在一些实施方式中,DNV传感器可以具有反射器和集中器。 其他实施方案可以包括具有氮空位的金刚石和围绕金刚石定位的反射器,以使用施加到反射器的电介质镜膜反射从金刚石发射的一部分光。 还有其它实施方案可以具有氮空位的金刚石和涂覆在金刚石上的电介质镜膜。

    Optical characteristic measuring apparatus
    39.
    发明授权
    Optical characteristic measuring apparatus 有权
    光学特性测量仪器

    公开(公告)号:US08982345B2

    公开(公告)日:2015-03-17

    申请号:US14003201

    申请日:2012-03-08

    Abstract: In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1. By disposing, on a position of a focal point of the partial ellipsoidal mirror, a hemispherical detection optical system having a hemispherical lens or a rotational parabolic mirror, light scattered by an object, reflected by the partial ellipsoidal mirror, and focused on the point is photographed by for example a CCD camera 6 via a hemispherical lens and a taper fiber 5 so as to measure an optical characteristic of the object.

    Abstract translation: 在用于测量样品的光学特性的装置中,本发明的一个目的是提供一种能够测量半球形全反射率,半球形全透射率和光分布的装置,并且实现测量时间的减少和改进 精确定量分析了半球全反射率(透射率)。 在双椭圆光学系统中,两个椭圆面镜的一个焦点被定位为公共焦点并且三个焦点以直线对准的光学系统,双椭圆体光学系统由部分椭圆体 镜子2,例如四分之一椭圆镜和带状椭圆面镜1.通过在半椭球镜的焦点的位置上设置半球形检测光学系统,该半球形检测光学系统具有半球形透镜或旋转抛物面镜, 通过半球形透镜和锥形光纤5,通过例如CCD照相机6拍摄被物体散射的物体,被部分椭球镜反射并聚焦在该点上的光,以测量物体的光学特性。

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