Abstract:
A compact device useful for measuring an absorption spectrum of a liquid, such as water with organic contaminants, is provided. The device comprises an array of light emitting diodes (LEDs) each emitting light with a unique spectral peak. A reflector shaped as a half ellipsoid reflects the emitted light to form a reference beam. The reflector has an opening to allow part of the emitted light to form a measurement beam after passing through the liquid. Two photodetectors measure the reference beam and the measurement beam to give a reference intensity and a measured intensity, respectively. The LEDs sequentially emit showers of light one-by-one, giving plural pairs of reference and measured intensities for estimating the absorption spectrum. The device receives energy from a separate power-providing device through wireless power transfer. The power-providing device harvests motional energy of the flowing liquid to generate electrical energy.
Abstract:
A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.
Abstract:
Devices and methods for detecting particulate matter are described herein. One device includes a laser, a reflector, an ellipsoidal reflector, and a detector, wherein the laser is configured to emit a beam, the reflector is configured to reflect the beam toward the ellipsoidal reflector, and the ellipsoidal reflector has a first focal region located on a path of the reflected beam, and a second focal region located at a surface of the detector.
Abstract:
A system for measuring thermal degradation of composites, may include a housing having an interior with an opening shaped to expose a test area of the composite to be tested to the interior; a light-emitting diode that emits primarily ultraviolet radiation, the diode mounted on the housing to direct the ultraviolet radiation into the interior and through the opening; an image sensor mounted on the housing and open to the interior to receive radiation emitted from the test area passing through the opening into the interior; and an image processor connected to receive a signal from the image sensor, the image processor determining a presence or absence of thermal degradation of the test area in response to the signal.
Abstract:
A device including an optical measuring device and an optical system which can measure the light intensity of the scattered light from the sample and the spatial distribution of the scattered light and which is excellent in the sensitivity is provided. In the device, the image distortion is suppressed by providing such a structure that the light emitted from the first substance is reflected by the ellipsoidal mirror two or more even times before reaching the second substance. The image distortion is suppressed by arranging two ellipsoidal mirrors so that respective one focuses are set to a common focus while remaining other two focuses are arranged on one line so as to be opposite to each other across the common focus, setting the common focus to a blank, arranging a first substance on one of the focuses, and arranging a second substance on the other of the focuses.
Abstract:
A sensor head is described herein. The sensor head can include a first piece, where the first piece can include a body having an outer surface and an inner surface. The first piece can also include a light source cavity disposed in the body at the inner surface. The first piece can further include an optical device cavity disposed in the body at the inner surface. The first piece can also include an ellipsoidal cavity disposed in the body at the inner surface, where the ellipsoidal cavity is disposed adjacent to the optical device cavity. The first piece can further include a receiving device cavity disposed in the body adjacent to the inner surface that forms the ellipsoidal cavity. The first piece can also include at least one channel disposed in the body.
Abstract:
Methods and configurations are disclosed for an efficient collection of fluorescence emitted by the nitrogen vacancies of a diamond of a DNV sensor. Some implementations may include a diamond having a nitrogen vacancy and a reflector positioned about the diamond to reflect a portion of light emitted from the diamond. In some implementations the reflector may be parabolic or ellipsoidal. In some implementations, DNV sensor may have a reflector and a concentrator. Other implementations may include a diamond with a nitrogen vacancy and a reflector positioned about the diamond to reflect a portion of light emitted from the diamond using a dielectric mirror film applied to the reflector. Still other implementations may have a diamond with a nitrogen vacancy and a dielectric mirror film coated on the diamond.
Abstract:
An optical element includes a main body formed of a light transmissive material and including an arc-shaped optical path, and a gap formed on the arc-shaped optical path in the main body. The gap may have a notch shape. The main body may have a semicircular plate shape. The main body may have a hemispherical shape.
Abstract:
In an apparatus for measuring an optical characteristic of a sample, one object of the present invention is to provide an apparatus capable of measuring hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in precision of the quantitative analysis of hemispherical total reflectance (transmittance). In a double ellipsoidal optical system which is an optical system in which one focal points of two ellipsoidal mirrors are positioned as a common focal point, and three focal points are aligned in a straight line, the double ellipsoidal optical system is composed of a partial ellipsoidal mirror 2, such as a quarter ellipsoidal mirror, and a belt-shape ellipsoidal mirror 1. By disposing, on a position of a focal point of the partial ellipsoidal mirror, a hemispherical detection optical system having a hemispherical lens or a rotational parabolic mirror, light scattered by an object, reflected by the partial ellipsoidal mirror, and focused on the point is photographed by for example a CCD camera 6 via a hemispherical lens and a taper fiber 5 so as to measure an optical characteristic of the object.
Abstract:
An optical system for detecting contaminants and defects on a test surface includes an improved laser system for generating a laser beam and optics directing the laser beam along a path onto the test surface, and producing an illuminated spot thereon. A detector and ellipsoidal mirrored surface are also provided with an axis of symmetry about a line perpendicular to the test surface. In one embodiment, an optical system for detecting anomalies of a sample includes the improved laser system for generating first and second beams, first optics for directing the first beam of radiation onto a first spot on the sample, second optics for directing the second beam onto a second spot on the sample, with the first and second paths at different angles of incidence to the sample surface. In another embodiment, a surface inspection apparatus includes an illumination system configured to focus beams at non-normal incidence angles.