CROSS-THREADED MEMORY SYSTEM
    411.
    发明申请

    公开(公告)号:US20190317912A1

    公开(公告)日:2019-10-17

    申请号:US16365535

    申请日:2019-03-26

    Applicant: Rambus Inc.

    Abstract: A multi-chip package includes a logic integrated circuit (IC) die formed with plural memory controller circuits, a first memory IC die and a second memory IC die. The second memory IC die is mounted to the first memory IC die. The first memory IC die and the logic IC die are mounted to one another. The logic IC die includes a serial link interface for coupling to multiple serial links. The first memory die includes a first memory group accessed by a first one of the plural memory controller circuits, and a second memory group accessed by a second one of the plural memory controller circuits.

    HIGH CAPACITY MEMORY SYSTEM WITH IMPROVED COMMAND-ADDRESS AND CHIP-SELECT SIGNALING MODE

    公开(公告)号:US20190266112A1

    公开(公告)日:2019-08-29

    申请号:US16290346

    申请日:2019-03-01

    Applicant: Rambus Inc.

    Abstract: A memory controller and buffers on memory modules each operate in two modes, depending on the type of motherboard through which the controller and modules are connected. In a first mode, the controller transmits decoded chip-select signals independently to each module, and the motherboard data channel uses multi-drop connections to each module. In a second mode, the motherboard has point-to-point data channel and command address connections to each of the memory modules, and the controller transmits a fully encoded chip-select signal group to each module. The buffers operate modally to correctly select ranks or partial ranks of memory devices on one or more modules for each transaction, depending on the mode.

    Dual temperature band integrated circuit device

    公开(公告)号:US10378967B1

    公开(公告)日:2019-08-13

    申请号:US15794280

    申请日:2017-10-26

    Applicant: Rambus Inc.

    Abstract: During operation of an IC component within a first range of temperatures, a first bias voltage is applied to a first substrate region disposed adjacent a first plurality of transistors to effect a first threshold voltage for the first plurality of transistors. During operation of the IC component within a second range of temperatures that is distinct from and lower than the first range of temperatures, a second bias voltage is applied to the first substrate region to effect a second threshold voltage for the first plurality of transistors that is at least as low as the first threshold voltage.

    Testing through-silicon-vias
    415.
    发明授权

    公开(公告)号:US10262750B2

    公开(公告)日:2019-04-16

    申请号:US15393634

    申请日:2016-12-29

    Applicant: RAMBUS INC.

    Abstract: Embodiments generally relate to integrated circuit devices having through silicon vias (TSVs). In one embodiment, an integrated circuit (IC) device includes a field of TSVs and an address decoder that selectably couples at least one of the TSVs to at least one of a test input and a test evaluation circuit. In another embodiment, a method includes selecting one or more TSVs from a field of TSVs in at least one IC device, and coupling each selected TSV to at least one of a test input and a test evaluation circuit.

    Memory component having internal read-modify-write operation

    公开(公告)号:US10248358B2

    公开(公告)日:2019-04-02

    申请号:US15990211

    申请日:2018-05-25

    Applicant: RAMBUS INC.

    Abstract: An memory component includes a memory bank and a command interface to receive a read-modify-write command, having an associated read address indicating a location in the memory bank and to either access read data from the location in the memory bank indicated by the read address after an adjustable delay period transpires from a time at which the read-modify-write command was received or to overlap multiple read-modify-write commands. The memory component further includes a data interface to receive write data associated with the read-modify-write command and an error correction circuit to merge the received write data with the read data to form a merged data and write the merged data to the location in the memory bank indicated by the read address.

    Maintenance operations in a DRAM
    417.
    发明授权

    公开(公告)号:US10248342B2

    公开(公告)日:2019-04-02

    申请号:US16145931

    申请日:2018-09-28

    Applicant: Rambus Inc.

    Abstract: A system includes a memory controller and a memory device having a command interface and a plurality of memory banks, each with a plurality of rows of memory cells. The memory controller transmits an auto-refresh command to the memory device. Responsive to the auto-refresh command, during a first time interval, the memory device performs refresh operations to refresh the memory cells and the command interface of the memory device is placed into a calibration mode for the duration of the first time interval. Concurrently, during at least a portion of the first time interval, the memory controller performs a calibration of the command interface of the memory device. The auto-refresh command may specify an order in which memory banks of the memory device are to be refreshed, such that the memory device sequentially refreshes a respective row in the plurality of memory banks in the specified bank order.

    Memory Controller With Error Detection And Retry Modes Of Operation

    公开(公告)号:US20190095264A1

    公开(公告)日:2019-03-28

    申请号:US16120819

    申请日:2018-09-04

    Applicant: Rambus Inc.

    Abstract: A memory system includes a link having at least one signal line and a controller. The controller includes at least one transmitter coupled to the link to transmit first data, and a first error protection generator coupled to the transmitter. The first error protection generator dynamically adds an error detection code to at least a portion of the first data. At least one receiver is coupled to the link to receive second data. A first error detection logic determines if the second data received by the controller contains at least one error and, if an error is detected, asserts a first error condition. The system includes a memory device having at least one memory device transmitter coupled to the link to transmit the second data. A second error protection generator coupled to the memory device transmitter dynamically adds an error detection code to at least a portion of the second data.

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