Abstract:
A method for controlling an output amplification stage comprising first and second complementary SOI-type power MOS transistors, in series between first and second power supply rails, the method including the steps of: connecting the bulk of the first transistor to the first rail when the first transistor is maintained in an off state; connecting the bulk of the second transistor to the second rail when the second transistor is maintained in an off state; and connecting the bulk of each of the transistors to the common node of said transistors, during periods when this transistor switches from an off state to an on state.
Abstract:
A vibrating nano-scale or micro-scale electromechanical component including a vibrating mechanical element that cooperates with at least one detection electrode. The detection electrode is flexible and is configured to vibrate in phase opposition relative to the vibrating mechanical element. Such a component may find, for example, application to resonators or motion sensors.
Abstract:
A method for manufacturing a bulk acoustic wave resonator, each resonator including: above a substrate, a piezoelectric resonator, and next to the piezoelectric resonator, a contact pad connected to an electrode of the piezoelectric resonator; and, between the piezoelectric resonator and the substrate, a Bragg mirror including at least one conductive layer extending between the pad and the substrate and at least one upper silicon oxide layer extending between the pad and the substrate, the method including the steps of: depositing the upper silicon oxide layer; and decreasing the thickness unevenness of the upper silicon oxide layer due to the deposition method, so that this layer has a same thickness to within better than 2%, and preferably to within better than 1%, at the level of each pad.
Abstract:
A dynamic biasing circuit of the substrate of a MOS power transistor may include a first switch configured to connect the substrate to a current source which forward biases the intrinsic source-substrate diode of the transistor, when the gate voltage of the transistor turns the transistor on. The current source may include a stack of diodes in the same conduction direction as the intrinsic diode between the substrate and a supply voltage.
Abstract:
A method for manufacturing a bipolar transistor, including the steps of: forming a first surface-doped region of a semiconductor substrate having a semiconductor layer extending thereon with an interposed first insulating layer; forming, at the surface of the device, a stack of a silicon layer and of a second insulating layer; defining a trench crossing the stack and the semiconductor layer opposite to the first doped region, and then an opening in the exposed region of the first insulating layer; forming a single-crystal silicon region in the opening; forming a silicon-germanium region at the surface of single-crystal silicon region, in contact with the remaining regions of the semiconductor layer and of the silicon layer; and forming a second doped region at least in the remaining space of the trench.
Abstract:
A volatile memory including volatile memory cells adapted to the performing of data write and read operations. The memory cells are arranged in rows and in columns and, further, are distributed in separate groups of memory cells for each row. The memory includes a first memory cell selection circuit configured to perform write operations and a second memory cell selection circuit, different from the first circuit, configured to perform read operations. The first circuit is capable of selecting, for each row, memory cells from one of the group of memory cells for a write operation. The second circuit is capable of selecting, for each row, memory cells from one of the groups of memory cells for a read operation.
Abstract:
Device for generating a signal of parametrizable frequency comprising a phase locked loop including a generator of a reference signal, a phase-frequency comparator comprising a first input for receiving the reference signal, an oscillator controlled on the basis of the result output by the phase-frequency comparator, a fractional divider coupled between an output of the oscillator and a second input of the phase-frequency comparator, and a selector selectively linking an input of the oscillator either with an input of the generator, or with the output of the oscillator as a function of the multiplication ratio of the fractional divider.
Abstract:
A method is for decoding a block of N information items encoded with an error correction code and mutually correlated. The method includes carrying out a first decorrelation of the N information items of a block is carried out, and storing the block decorrelated. The method also includes a performing a processing for decoding a group of P information items of the block, and decorrelating at least part of the P decoded information items. The processing for decoding the group of P information items and the decorrelation are repeated with different successive groups of P information items of the block until the N information items of the block have been processed, until a decoding criterion is satisfied.
Abstract:
A logarithmic analog to digital conversion method for an analog input signal includes a logarithmic amplification with progressive compression of the input signal delivering a sequence of several secondary analog signals. The trend of the values of at least some of the secondary signals is a function of the values of the analog input signal including regions corresponding to a linear trend of the secondary signals as a function of that of the input signal expressed in a logarithmic scale. The method also includes a comparison of at least some of the secondary signals of the sequence with a common reference signal whose value lies within each of regions, supplying a thermometric code information item, and a generation of a first digital word from the thermometric code information item.
Abstract:
A method for testing an integrated circuit includes determining performance data of the integrated circuit, wherein at least first and second derivatives of S parameters of the integrated circuit are taken into account when determining the expected performance data. The performance data can be determined by measuring S parameters of the integrated circuit. An equivalent non-linear model of the integrated circuit can be determined from the provided S parameters and first and second derivatives of the provided S parameters. The non-linear behavior of the integrated circuit can be quantified from the equivalent non-linear model.