摘要:
A stacked memory device may include at least one memory unit and at least one peripheral circuit unit arranged either above or below the at least one memory unit. The at least one memory unit may include a memory string array, a plurality of bit lines, and a plurality of string selection pads. The memory string may include a plurality of memory strings arranged in a matrix and each of the memory strings may include a plurality of memory cells and a string selection device arranged perpendicular to a substrate. The plurality of bit lines may extend in a first direction and may be connected to ends of the plurality of memory strings. The plurality of string selection pads may be arrayed in a single line along the first direction and may be connected to the string selection devices included in the plurality of memory strings.
摘要:
In a memory device and in a method for controlling a memory device, the memory device comprises a magnetic structure that stores information in a plurality of domains of the magnetic structure. A read unit reads information from at least one of the plurality of domains of the magnetic structure by applying a read current to the magnetic structure. A position detector unit compares the information read by a read current from the read unit from multiple domains of the plurality of domains of the magnetic structure to identify the presence of an expected information pattern at select domains of the plurality of domains.
摘要:
A stacked memory device may include a substrate, a plurality of memory layers stacked on and above the substrate and divided into a plurality of groups, a plurality of inter-decoders electrically connected to and disposed between the plurality of memory layers in a corresponding one of the plurality of groups, and at least one pre-decoder electrically connected to the plurality of inter-decoders and disposed between the plurality of inter-decoders. A stacked memory device may include a substrate, a plurality of memory layers stacked on and above the substrate and divided into a plurality of groups, a plurality of inter-drivers electrically connected to and disposed between the plurality of memory layers in a corresponding one of the plurality of groups, and at least one pre-driver electrically connected to the plurality of inter-drivers, and disposed between the plurality of inter-drivers.
摘要:
In a memory device and in a method for controlling a memory device, the memory device comprises a magnetic structure that stores information in a plurality of domains of the magnetic structure. A read unit reads information from at least one of the plurality of domains of the magnetic structure by applying a read current to the magnetic structure. A position detector unit compares the information read by a read current from the read unit from multiple domains of the plurality of domains of the magnetic structure to identify the presence of an expected information pattern at select domains of the plurality of domains.
摘要:
A method of reading data from a flash memory device that includes a multiple block memory cell array, each block having a cell string connected to a bit line and comprising a string select transistor connected to a string select line, a memory cell connected to a wordline and a global select transistor connected to a global select line and having a source connected to a common source line. The method includes pre-charging the bit lines to a first voltage in a standby state, discharging a selected bit line connected to a selected memory cell to a second voltage in response to a read command, and reading data stored in the selected memory cell in response to the read command.
摘要:
Provided is a word line decoder suitable to a low operating voltage of a flash memory device. The word line decoder generates a block word line driving signal of a high voltage in response to a block selection signal. The word line decoder includes a first inverter receiving the block selection signal, a second inverter receiving an output of the first inverter, and first and second serially connected transistors receiving an output of the second inverter and outputting the block word line driving signal. The gates of the first and second transistors are connected to a supply voltage terminal. The word line decoder includes a third transistor having a source connected to a high voltage terminal and a gate connected to a line transmitting the block word line driving signal, a fourth transistor connected between the drain of the third transistor and the block word line driving signal line, a fifth transistor connected between the drain of the third transistor and the gate of the fourth transistor and having a gate connected to the block word line driving signal line, and a sixth transistor connected between the output of the first inverter and the gate of the second transistor and having a gate connected to the supply voltage terminal.
摘要:
A stacked memory device may include at least one memory unit and at least one peripheral circuit unit arranged either above or below the at least one memory unit. The at least one memory unit may include a memory string array, a plurality of bit lines, and a plurality of string selection pads. The memory string may include a plurality of memory strings arranged in a matrix and each of the memory strings may include a plurality of memory cells and a string selection device arranged perpendicular to a substrate. The plurality of bit lines may extend in a first direction and may be connected to ends of the plurality of memory strings. The plurality of string selection pads may be arrayed in a single line along the first direction and may be connected to the string selection devices included in the plurality of memory strings.
摘要:
A power device includes a switching device having a control terminal and an output terminal; and a driving circuit configured to provide a driving voltage to the control terminal such that a voltage between the control terminal and the output terminal remains less than or equal to a critical voltage. A rise time required for the driving voltage to reach a target level is determined according to current-voltage characteristics of the switching device. And, when the voltage between the control terminal and the output terminal exceeds the critical voltage, leakage current is generated between the control terminal and the output terminal.
摘要:
A non-volatile memory device includes a memory cell array and a voltage control unit. The memory cell array includes a plurality of memory blocks each including a plurality of cell strings. Each of the cell strings includes a first selection transistor, a second selection transistor, and at least one memory cell transistor serially connected between the first selection transistor and the second selection transistor. The voltage control unit provides first selection line voltages and word line voltages to first selection lines connected to the first selection transistors and word lines connected to the memory cell transistors, respectively, in response to a plurality of block selection signals corresponding to the plurality of memory blocks, and provides a second selection line voltage directly to second selection lines connected to the second selection transistors independently of the block selection signals
摘要:
A nonvolatile memory device includes a memory cell array and a voltage controller. The memory cell array includes a plurality of memory blocks each including a plurality of cell strings, where each of the cell strings includes a first selection transistor, a second selection transistor, and at least one memory cell transistor connected in series between the first and second selection transistors. The voltage controller applies a first selection voltage to first selection lines connected to the first selection transistors, a second selection voltage to second selection lines connected to the second selection transistors, and a word line voltage to word lines connected to the memory cell transistors, in response to a plurality of block selection signals corresponding to the memory blocks. The voltage controller precharges the second selection lines to a precharge voltage by applying the second selection line voltage to the second selection lines in a standby state, where the second selection line voltage is equal to the precharge voltage.