Heterojunction TFETs employing an oxide semiconductor

    公开(公告)号:US10734513B2

    公开(公告)日:2020-08-04

    申请号:US15768822

    申请日:2015-11-16

    Abstract: Heterojunction tunnel field effect transistors (hTFETs) incorporating one or more oxide semiconductor and a band offset between at least one of a channel material, a source material of a first conductivity type, and drain of a second conductivity type, complementary to the first. In some embodiments, at least one of p-type material, channel material and n-type material comprises an oxide semiconductor. In some embodiments, two or more of p-type material, channel material, and n-type material comprises an oxide semiconductor. In some n-type hTFET embodiments, all of p-type, channel, and n-type materials are oxide semiconductors with a type-II or type-III band offset between the p-type and channel material.

    Integrated 1T1R RRAM memory cell
    44.
    发明授权

    公开(公告)号:US10706921B2

    公开(公告)日:2020-07-07

    申请号:US16080922

    申请日:2016-04-01

    Abstract: One embodiment provides an apparatus. The apparatus includes a bipolar junction transistor (BJT) and an integrated resistive element. The BJT includes a base contact, a base region, a collector contact, a collector region and an integrated emitter contact. The integrated resistive element includes a resistive layer and an integrated electrode. The resistive element is positioned between the base region and the integrated emitter contact.

    VERTICAL FIELD EFFECT TRANSISTORS (VFETS) WITH SELF-ALIGNED WORDLINES

    公开(公告)号:US20200020805A1

    公开(公告)日:2020-01-16

    申请号:US16490502

    申请日:2017-03-31

    Abstract: Disclosed are systems, methods, and apparatus directed to the fabrication of vertical field effect transistors (VFETs) and VFETs with self-aligned wordlines. In one embodiment, the source and/or drain of the VFETs can include n-doped silicon. In one embodiment, the VFETs can include a channel that can be made of intrinsic silicon. In one embodiment, the source, drain, and/or channel can be deposited using physical vapor deposition (PVD), chemical vapor deposition (CVD), molecular beam chemical vapor deposition (MOCVD), and/or atomic layer deposition (ALD), and the like. In one embodiment, an STI process can be used to fabricate one or more recesses, which can reach the drains of the VFETs. In one embodiment, the systems, methods, and apparatus can permit the self-alignment of one or more wordlines of the VFETs with the one or more fins, and/or gate metals and gate materials of the VFETs.

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