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公开(公告)号:US20210064119A1
公开(公告)日:2021-03-04
申请号:US16551581
申请日:2019-08-26
Applicant: Micron Technology, Inc.
IPC: G06F1/3287 , G06F1/3234 , G06F1/28 , G11C11/22 , G11C11/4096
Abstract: Methods, systems, and devices for bank-configurable power modes are described. Aspects include operating a memory device that has multiple memory banks in a first mode. While operating in the first mode, the memory device may receive a command to enter a second mode having a lower power consumption level than the first mode. The memory device may enter the second mode by switching a first subset of the memory banks to a first low power mode that operates at a first power consumption level and a second subset of the memory banks to a second low power mode that operates at a second power consumption level that may be lower than the first power consumption level. In some cases, the memory device may switch the first subset of memory banks from the first low power mode while maintaining the second subset of memory banks in the low power mode.
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公开(公告)号:US20200058341A1
公开(公告)日:2020-02-20
申请号:US16104693
申请日:2018-08-17
Applicant: Micron Technology, Inc.
Inventor: Corrado Villa , Andrea Martinelli
Abstract: Methods, systems, and devices for activity-based data protection in a memory device are described. In one example, a memory device may include a set memory sections each having memory cells configured to be selectively coupled with access lines of the respective memory section. A method of operating the memory device may include determining a quantity of access operations performed on a set of sections of a memory device, selecting at least one of the sections for a voltage adjustment operation based on the determined quantity of access operations, and performing the voltage adjustment operation on the selected section. The voltage adjustment operation may include applying an equal voltage to opposite terminals of the memory cells, which may allow built-up charge, such as leakage charge accumulating from access operations of the selected memory section, to dissipate from the memory cells of the selected section.
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公开(公告)号:US20140143484A1
公开(公告)日:2014-05-22
申请号:US14165265
申请日:2014-01-27
Applicant: Micron Technology Inc.
Inventor: Gerald Barkley , Sunil Shetty , Andrea Martinelli
IPC: G06F12/02
CPC classification number: G06F12/0246 , G11C13/0004 , G11C13/0061 , G11C13/0064 , G11C13/0069 , G11C2013/0088
Abstract: Subject matter disclosed herein relates to a memory device and method of programming same.
Abstract translation: 本文公开的主题涉及一种对其进行编程的存储器件及其方法。
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公开(公告)号:US12260907B2
公开(公告)日:2025-03-25
申请号:US18622033
申请日:2024-03-29
Applicant: Micron Technology, Inc.
Inventor: Christophe Vincent Antoine Laurent , Andrea Martinelli , Efrem Bolandrina , Ferdinando Bedeschi
Abstract: Methods, systems, and devices for shared decoder architecture for three-dimensional memory arrays are described. A memory device may include pillars coupled to an access line using two transistors positioned between the pillar and the access line. The gates of the two transistors may be coupled with respective gate lines coupled with circuitry configured to bias the gate line as part of an access operation for a memory cell coupled with the pillar. In some cases, the circuitry may be positioned between tiles of the memory device, at an end of one or more tiles of the memory device, between word line combs of a tile of the memory device, or a combination thereof.
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公开(公告)号:US20240321355A1
公开(公告)日:2024-09-26
申请号:US18678802
申请日:2024-05-30
Applicant: Micron Technology, Inc.
Inventor: Andrea Ghetti , Andrea Martinelli , Efrem Bolandrina , Ferdinando Bedeschi , Paolo Fantini
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0026 , G11C13/0028 , G11C13/003 , G11C13/004 , G11C13/0004 , G11C2213/15 , G11C2213/30
Abstract: Systems, methods, and apparatus related to memory devices. In one approach, a vertical three-dimensional cross-point memory device uses digit line decoders that include, on the digit line side of memory cells, a current limiter and sensing circuit configured to control program current in either of positive or negative program polarities, as selected by a controller. Two current limiters are each used on the digit line side of each memory cell. A negative polarity current limiter is used for pull-up, and a positive polarity current limiter is used for pull-down. A negative polarity sensing circuit is used between the respective digit line decoder and a positive supply voltage. A positive polarity sensing circuit is used between the respective digit line decoder and a negative supply voltage. The current limiter and sensing circuit pair of the same polarity is coupled to each digit line decoder based on the selected program polarity.
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公开(公告)号:US12002510B2
公开(公告)日:2024-06-04
申请号:US17588718
申请日:2022-01-31
Applicant: Micron Technology, Inc.
Inventor: Andrea Ghetti , Andrea Martinelli , Efrem Bolandrina , Ferdinando Bedeschi , Paolo Fantini
IPC: G11C13/00
CPC classification number: G11C13/0069 , G11C13/0026 , G11C13/0028 , G11C13/003 , G11C13/004 , G11C13/0004 , G11C2213/15 , G11C2213/30
Abstract: Systems, methods, and apparatus related to memory devices. In one approach, a vertical three-dimensional cross-point memory device uses digit line decoders that include, on the digit line side of memory cells, a current limiter and sensing circuit configured to control program current in either of positive or negative program polarities, as selected by a controller. Two current limiters are each used on the digit line side of each memory cell. A negative polarity current limiter is used for pull-up, and a positive polarity current limiter is used for pull-down. A negative polarity sensing circuit is used between the respective digit line decoder and a positive supply voltage. A positive polarity sensing circuit is used between the respective digit line decoder and a negative supply voltage. The current limiter and sensing circuit pair of the same polarity is coupled to each digit line decoder based on the selected program polarity.
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公开(公告)号:US11804264B2
公开(公告)日:2023-10-31
申请号:US17943591
申请日:2022-09-13
Applicant: Micron Technology, Inc.
Inventor: Paolo Fantini , Andrea Martinelli , Claudio Nava
CPC classification number: G11C13/0028 , G11C13/0004 , G11C13/004 , H10B63/34 , H10B63/845 , H10N70/231 , G11C2213/75
Abstract: Methods, systems, and devices for decoding architecture for memory tiles are described. Word line tiles of a memory array may each include multiple word line plates, which may each include a sheet of conductive material that includes a first portion extending in a first direction within a plane along with multiple fingers extending in a second direction within the plane. A pillar tile may include one or more pillars that extend vertically between the word line plate fingers. Memory cells may each be couple with a respective word line plate finger and a respective pillar. Word line decoding circuitry, pillar decoding circuitry, or both, may be located beneath the memory array and in some cases may be shared between adjacent pillar tiles.
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公开(公告)号:US11651809B2
公开(公告)日:2023-05-16
申请号:US17231704
申请日:2021-04-15
Applicant: Micron Technology, inc.
Inventor: Corrado Villa , Andrea Martinelli
CPC classification number: G11C11/2259 , G06F3/0604 , G06F3/0659 , G06F3/0673 , G11C11/221 , G11C11/2255 , G11C11/2257 , G11C11/2295
Abstract: Methods, systems, and devices for activity-based data protection in a memory device are described. In one example, a memory device may include a set memory sections each having memory cells configured to be selectively coupled with access lines of the respective memory section. A method of operating the memory device may include determining a quantity of access operations performed on a set of sections of a memory device, selecting at least one of the sections for a voltage adjustment operation based on the determined quantity of access operations, and performing the voltage adjustment operation on the selected section. The voltage adjustment operation may include applying an equal voltage to opposite terminals of the memory cells, which may allow built-up charge, such as leakage charge accumulating from access operations of the selected memory section, to dissipate from the memory cells of the selected section.
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公开(公告)号:US11475947B1
公开(公告)日:2022-10-18
申请号:US17231668
申请日:2021-04-15
Applicant: Micron Technology, Inc.
Inventor: Paolo Fantini , Andrea Martinelli , Claudio Nava
Abstract: Methods, systems, and devices for decoding architecture for memory tiles are described. Word line tiles of a memory array may each include multiple word line plates, which may each include a sheet of conductive material that includes a first portion extending in a first direction within a plane along with multiple fingers extending in a second direction within the plane. A pillar tile may include one or more pillars that extend vertically between the word line plate fingers. Memory cells may each be couple with a respective word line plate finger and a respective pillar. Word line decoding circuitry, pillar decoding circuitry, or both, may be located beneath the memory array and in some cases may be shared between adjacent pillar tiles.
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公开(公告)号:US20220253237A1
公开(公告)日:2022-08-11
申请号:US17677586
申请日:2022-02-22
Applicant: Micron Technology, Inc.
Inventor: Christophe Vincent Antoine Laurent , Andrea Martinelli , Marco Sforzin , Paolo Amato
IPC: G06F3/06
Abstract: Methods, systems, and devices related to balancing data are described. Data may be communicated using an original set of bits that may be partitioned into segments. Each of the original set of bits may have a first value or a second value, where a weight of the original set of bits may be based on a quantity of the set of bits that have the first value. If the weight of the original set of bits is outside of a target weight range, a different, encoded set of bits may be used to represent the data, the encoded set of bits having a weight within the target weight range. The encoded set of bits may be identified based an inversion of the original set of bits in a one-at-a-time and cumulative fashion. The encoded set of bits may be stored in place of the original set of bits.
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