公开(公告)号：US20240196094A1

公开(公告)日：2024-06-13

申请号：US18581051

申请日：2024-02-19

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, JR. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs

IPC: H04N23/695 ,  G06T7/215 ,  G06T7/33

CPC classification number: H04N23/695 ,  G06T7/215 ,  G06T7/337 ,  G06T2207/10061

Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.

公开(公告)号：US11902665B2

公开(公告)日：2024-02-13

申请号：US17585222

申请日：2022-01-26

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, Jr. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs ,  Joshua Brian Friend ,  Katherine Elizabeth Marusak ,  Nelson L Marthe, Jr. ,  Benjamin Bradshaw Larson

IPC: G01B11/16 ,  H04N23/695 ,  G06T7/33 ,  G06T7/215 ,  H01J37/20

CPC classification number: H04N23/695 ,  G06T7/215 ,  G06T7/337 ,  H01J37/20 ,  G06T2207/10061 ,  H01J2237/2594

Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

公开(公告)号：US20220247934A1

公开(公告)日：2022-08-04

申请号：US17585222

申请日：2022-01-26

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, JR. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs ,  Joshua Brian Friend ,  Katherine Elizabeth Marusak ,  Nelson L. Marthe, JR. ,  Benjamin Bradshaw Larson

IPC: H04N5/232 ,  G06T7/215 ,  G06T7/33

Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

公开(公告)号：US20220130637A1

公开(公告)日：2022-04-28

申请号：US17570481

申请日：2022-01-07

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, JR. ,  Daniel Stephen Gardiner ,  William Bradford Carpenter

IPC: H01J37/20 ,  G01F1/34 ,  G05D7/06

Abstract: A fluid metering system for gas independent pressure and flow control through an electron microscope sample holder includes: a pressure control system that supplies gas; an inlet line providing gas from the pressure control system to the sample holder; an outlet line receiving gas from the sample holder; and a variable leak valve that controls gas flow in the outlet line. The gas flows from an upstream tank of the pressure control system through the sample holder and variable leak valve to a downstream tank of the pressure control system due to the pressure difference of the two tanks as the variable leak valve meters flow in the outlet line. Flow rates are established by monitoring pressure changes at source and collection tanks of known volumes with gas independent pressure gauges. A method of directing the gas flow to a residual gas analyzer (RGA) is also presented.

公开(公告)号：US11170968B2

公开(公告)日：2021-11-09

申请号：US17020239

申请日：2020-09-14

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, Jr. ,  Daniel Stephen Gardiner ,  David P. Nackashi ,  William Bradford Carpenter

IPC: H01J37/20 ,  H01J37/26 ,  H01J37/32 ,  H01J49/04 ,  G01N1/28 ,  H01J37/34 ,  G02B21/32 ,  G02B21/34 ,  G01N25/48 ,  G01N23/20033 ,  G01N35/00

Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

公开(公告)号：US10586679B2

公开(公告)日：2020-03-10

申请号：US16025361

申请日：2018-07-02

Applicant: PROTOCHIPS, INC.

Inventor： Daniel Stephen Gardiner ,  Franklin Stampley Walden, II ,  John Damiano, Jr.

IPC: H01J37/20 ,  H01J37/26

Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.

公开(公告)号：US20190080882A1

公开(公告)日：2019-03-14

申请号：US16185519

申请日：2018-11-09

Applicant: Protochips, Inc.

Inventor： Franklin Stampley Walden, II ,  John Damiano, JR. ,  Daniel Stephen Gardiner ,  David P. Nackashi ,  William Bradford Carpenter

IPC: H01J37/20

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2003

Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

公开(公告)号：US20180330915A1

公开(公告)日：2018-11-15

申请号：US16025361

申请日：2018-07-02

Applicant: PROTOCHIPS, INC.

Inventor： Daniel Stephen Gardiner ,  Franklin Stampley Walden, II ,  John Damiano, JR.

IPC: H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J2237/2003 ,  H01J2237/204

Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.

公开(公告)号：US10128079B2

公开(公告)日：2018-11-13

申请号：US15253126

申请日：2016-08-31

Applicant: PROTOCHIPS, INC.

Inventor： Franklin Stampley Walden, II ,  John Damiano, Jr. ,  Daniel Stephen Gardiner ,  David P. Nackashi ,  William Bradford Carpenter

IPC: H01J37/20

Abstract: A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

公开(公告)号：US09997330B2

公开(公告)日：2018-06-12

申请号：US15359781

申请日：2016-11-23

Applicant: Protochips, Inc.

Inventor： Daniel Stephen Gardiner ,  Franklin Stampley Walden, II ,  John Damiano, Jr.

IPC: H01J37/26

CPC classification number: H01J37/261 ,  B01L9/52 ,  B01L2200/0636 ,  F16J15/022 ,  F16J15/062 ,  F16J15/064 ,  F16J15/104 ,  H01J37/20 ,  H01J2237/2003 ,  H01J2237/2006 ,  H01J2237/2007

Abstract: A support for an electron microscope sample includes a body defining a void for receiving a first micro-electronic device, and a first gasket positioned about the first surface. The first gasket further defines an arm extending at an angle away from a horizontal extending through the first micro-electronic device. In operation, the first micro-electronic device is installed onto the first gasket and the arm engages an outer facing side of the first micro-electronic device to grip the first micro-electronic device.