Voltage detector
    41.
    发明授权
    Voltage detector 失效
    电压检测器

    公开(公告)号:US4922186A

    公开(公告)日:1990-05-01

    申请号:US240641

    申请日:1988-09-06

    CPC分类号: G01R1/071

    摘要: A voltage detector comprises a pulse light source, a delay means, a dispersing prism made of an electro-optic material and a linear image sensor. The electro-optic material senses a voltage developing in a selected area of an object as a change of its refractive index. An optical path of a pulse light is changed by the dispersing prism according to the change of its refractive index. An output pulse light emerging from the dispersing prism is detected by a linear image sensor. A waveform of the periodic voltage pulses can be detected by gradually delaying a phase of the pulse light emitted from the light source. The voltage developing in one-dimensional positions in the object can be also detected by employing a dispersing prism extending along the positions to be detected and a two-dimensional detector.

    摘要翻译: 电压检测器包括脉冲光源,延迟装置,由电光材料制成的分散棱镜和线性图像传感器。 电光材料感测在物体的选定区域中显影的电压作为其折射率的变化。 根据其折射率的变化,通过分散棱镜改变脉冲光的光路。 通过线性图像传感器检测从分散棱镜出射的输出脉冲光。 可以通过逐渐延迟从光源发射的脉冲光的相位来检测周期性电压脉冲的波形。 通过采用沿着待检测的位置延伸的分散棱镜和二维检测器也可以检测在物体中一维位置显影的电压。

    Voltage detector employing electro-optic material having a corner-cube
shape
    43.
    发明授权
    Voltage detector employing electro-optic material having a corner-cube shape 失效
    电压检测器采用具有角立方体形状的电光材料

    公开(公告)号:US4864222A

    公开(公告)日:1989-09-05

    申请号:US233090

    申请日:1988-08-15

    IPC分类号: G01R15/24 G01R1/07 G01R19/155

    CPC分类号: G01R19/155 G01R1/071

    摘要: In a voltage detector using an electro-optic material whose refractive index is changed by a voltage developing in a selected area of an object under test, an end portion of the electro-optic material has a corner-cube shape, whereby the detection of the voltage can be accurately achieved substantially being free from the influence of the input light tilt to the optical axis.

    摘要翻译: 在使用电光材料的电压检测器中,电光材料的端部具有角立方体形状,该电光材料的折射率由在被测物体的选定区域内产生的电压而变化, 可以基本上不受输入光倾斜对光轴的影响而精确地实现电压。

    Apparatus for optically analyzing an object using four-wave mixing
technique
    44.
    发明授权
    Apparatus for optically analyzing an object using four-wave mixing technique 失效
    使用四波混频技术对物体进行光学分析的装置

    公开(公告)号:US4796992A

    公开(公告)日:1989-01-10

    申请号:US131404

    申请日:1987-12-10

    IPC分类号: G02F1/35 G03H1/00 G01B9/027

    CPC分类号: G03H1/00 G02F1/3538

    摘要: An apparatus for optically observing a wavefront from an object on real-time basis to determine an optical characteristic of the object and observing two-dimensional images at positions taken in the direction of the depth of a three-dimensional object, that is, equidistant images on real-time basis, using four-wave mixing technique.

    摘要翻译: 一种用于实时地从物体观察波前的装置,用于确定物体的光学特性并在三维物体的深度方向上拍摄的位置观察二维图像,即等距图像 以实时为基础,采用四波混频技术。

    E-O probe
    46.
    发明授权
    E-O probe 失效
    E-O探头

    公开(公告)号:US5500587A

    公开(公告)日:1996-03-19

    申请号:US118257

    申请日:1993-09-09

    CPC分类号: G01R1/071

    摘要: An E-O probe with improved spatial resolution has a light transmissive base part, an electro-optic material which is fixed to the base part and has an index of refraction which varies in response to an electrical field from a measured object, and a mirror which is fixed to the electro-optic material and reflects an incident beam penetrating the base part and the electro-optic material. The mirror is formed to be smaller than the incident beam in diameter. The electro-optic material is formed very thin.

    摘要翻译: 具有改善的空间分辨率的EO探针具有透光基部,电光材料,其固定到基部,并且具有响应于来自测量对象的电场而变化的折射率,以及反射镜 固定到电光材料并且反射穿过基部和电光材料的入射光束。 镜子形成为比入射光束的直径小。 电光材料形成得非常薄。

    SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE
    48.
    发明申请
    SINGLE TERAHERTZ WAVE TIME-WAVEFORM MEASURING DEVICE 有权
    单TERAHERTZ波形时间波形测量装置

    公开(公告)号:US20100090112A1

    公开(公告)日:2010-04-15

    申请号:US12444209

    申请日:2007-09-13

    IPC分类号: G01N21/35

    摘要: A single terahertz wave time-waveform measuring device 1 acquires information on an object to be measured 9 by using a terahertz wave, and includes a light source 11, a beam diameter adjuster 12, a separator 13, a terahertz wave generator 21, a light path length difference adjuster 31, a pulse front tilting unit 32, a polarizer 33, a wave synthesizer 41, an electro-optic crystal 42, an analyzer 43, and a photodetector 44. The terahertz wave generator 21 generates a pulse terahertz wave in response to an input of pump light and outputs the pulse terahertz wave. The pulse front tilting unit 32 makes pulse fronts of the terahertz wave and the probe light when being input into the electro-optic crystal 42 nonparallel to each other by tilting the pulse front of the probe light.

    摘要翻译: 单个太赫兹波时间波形测量装置1通过使用太赫兹波获取关于被测量物体9的信息,并且包括光源11,光束直径调节器12,隔膜13,太赫兹波发生器21,光 路径长度差调节器31,脉冲前倾斜单元32,偏振器33,波合成器41,电光晶体42,分析器43和光电检测器44.太赫兹波发生器21响应地产生脉冲太赫兹波 到泵浦光的输入并输出脉冲太赫兹波。 当脉冲前倾斜单元32通过倾斜探测光的脉冲前沿而彼此不平行地输入到电光晶体42中时,使太赫兹波和探测光的脉冲前沿。

    Voltage detection apparatus
    49.
    发明授权
    Voltage detection apparatus 失效
    电压检测装置

    公开(公告)号:US5583444A

    公开(公告)日:1996-12-10

    申请号:US618406

    申请日:1996-03-19

    摘要: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

    摘要翻译: 本发明的目的是提供一种电压测量装置,其具有紧凑的探针单元,并且可以以非接触方式进行测量。 电压测量装置包括检测装置,用于通过施加到被测量装置的表面的电压来检测在空间中产生的电场;发光装置,用于通过将从检测装置获得的检测信号叠加在一个 提供用于感应放射输出光的偏置电流,用于向发光装置提供偏置电流的恒流源,用于从发光装置提取输出光的信号分量的提取装置,以及光传输 用于将来自发光装置的输出光引导到提取装置的装置,并且通过以非接触的方式使检测装置靠近被测量装置来测量施加到要测量装置的表面的电压。

    Polarization interferometer optical voltage detector utilizing movement
of interference fringe
    50.
    发明授权
    Polarization interferometer optical voltage detector utilizing movement of interference fringe 失效
    利用干涉条纹移动的偏振干涉仪光电压检测器

    公开(公告)号:US5420686A

    公开(公告)日:1995-05-30

    申请号:US200568

    申请日:1994-02-22

    IPC分类号: G01R1/07 G01R15/24 G01B9/02

    CPC分类号: G01R15/242 G01R1/071

    摘要: Polarized light is input to an optical modulator typically consisting of an electrooptic crystal. The polarization state of the input light is changed in accordance with a voltage being applied to the optical modulator. Receiving the light output from the optical modulator, a polarization interferometer produces an interference fringe on the input surface of a photodetector such as a streak camera and a CCD line sensor. Based on an output signal of the photodetector, an analyzing device calculates a pitch and a movement distance of the interference fringe to determine the voltage being applied to the optical modulator.

    摘要翻译: 偏振光被输入到通常由电光晶体组成的光学调制器。 输入光的偏振状态根据施加于光调制器的电压而变化。 接收来自光调制器的光输出,偏振干涉仪在诸如条纹照相机和CCD线传感器的光电检测器的输入表面上产生干涉条纹。 基于光检测器的输出信号,分析装置计算干涉条纹的间距和移动距离,以确定施加到光调制器的电压。