Machining configuration drawing apparatus and machining configuration drawing method
    41.
    发明申请
    Machining configuration drawing apparatus and machining configuration drawing method 有权
    加工配置图纸设备和加工配置图纸方法

    公开(公告)号:US20050209728A1

    公开(公告)日:2005-09-22

    申请号:US11073575

    申请日:2005-03-08

    摘要: A machining configuration drawing apparatus includes a drawing unit for drawing a machining configuration and a present machining position, a setting unit for setting a display area in an overall drawing area, a division unit for dividing the overall drawing area into a plurality of display areas based on the set display area, and a selection unit for selecting a drawing region drawn by the drawing unit from a plurality of drawing regions. The selection unit selects a drawing region in which the present machining position exists. Further, the drawing unit draws a machining configuration and a present machining position of the selected drawing region.

    摘要翻译: 加工配置描绘装置包括用于绘制加工构造和当前加工位置的绘制单元,用于设置整个绘图区域中的显示区域的设置单元,用于将整个绘图区域划分为多个显示区域的分割单元 以及选择单元,用于从多个绘图区域中选择由绘制单元绘制的绘图区域。 选择单元选择存在当前加工位置的绘图区域。 此外,绘图单元绘制所选择的绘图区域的加工配置和当前的加工位置。

    Positive-type photosensitive composition
    43.
    发明授权
    Positive-type photosensitive composition 有权
    正型光敏组合物

    公开(公告)号:US08426107B2

    公开(公告)日:2013-04-23

    申请号:US12991690

    申请日:2009-05-13

    IPC分类号: G03F7/00 G03F7/004 B32B3/10

    摘要: Disclosed is a positive-type photosensitive composition which can form a metal compound film pattern at high resolution and with less affection by organic residues. The positive-type photosensitive composition comprises: a metal complex component (A) which can form a metal compound film when applied and subsequently fired; and a photosensitizing agent (B). In the composition, a ligand in the component (A) is preferably a multidentate ligand having an aromatic compound as its skeleton. According to this construction, even a composition containing substantially no photosensitive resin can impart photosensitivity and a metal compound film pattern can be formed readily.

    摘要翻译: 公开了能够以高分辨率形成金属化合物膜图案并且较少受有机残基影响的正型感光性组合物。 正型感光性组合物包括:金属络合物成分(A),其可以在涂布后随后烧制时形成金属化合物膜; 和光敏剂(B)。 在组合物中,组分(A)中的配体优选为具有芳族化合物作为其骨架的多齿配体。 根据该结构,即使是基本上不含感光性树脂的组合物也能赋予光敏性,容易形成金属化合物膜图案。

    Photoresist composition and resist pattern formation method by the use thereof
    44.
    发明授权
    Photoresist composition and resist pattern formation method by the use thereof 失效
    光刻胶组合物和抗蚀剂图案形成方法

    公开(公告)号:US07700257B2

    公开(公告)日:2010-04-20

    申请号:US10547427

    申请日:2004-03-24

    IPC分类号: G03F7/004 G03F7/30

    摘要: A photoresist composition containing a polymer (A) containing an alkali-soluble constituent unit (a1) containing an alicyclic group having both a fluorine atom or a fluorinated alkyl group (i) and an alcoholic hydroxyl group (ii), whose alkali-solubility is changeable by an action of an acid; an acid generator (B) which generates an acid by light irradiation; and a dissolution inhibitor (C) having a fluorine atom(s) and/or a nitrogen-containing compound (D) selected from a tertiary amine (d1) having a polar group, a tertiary alkylamine (d2) having 7 or more and 15 or less of carbon atoms or an ammonium salt (d3). The composition has a resist property capable of accomplishing line and space (1:1) of 90 nm or less in good shape as a pattern processing accuracy of a semiconductor integrated circuit by lithography.

    摘要翻译: 1.一种光致抗蚀剂组合物,其含有含有具有氟原子或氟代烷基(i)和醇羟基(ii)的脂环族基团的碱溶性结构单元(a1)的聚合物(A),其碱溶性为 可以通过酸的作用而变化; 通过光照射产生酸的酸产生剂(B); 和具有氟原子的溶解抑制剂(C)和/或选自具有极性基团的叔胺(d1),具有7以上的叔烷基胺(d2)和15以上的含氮化合物(D) 或更少的碳原子或铵盐(d3)。 该组合物具有能够通过光刻作为半导体集成电路的图案处理精度而实现90nm或更小的线和空间(1:1)的良好形状的抗蚀剂性质。

    Machine having movable unit to be controllably driven by servo motor
    45.
    发明授权
    Machine having movable unit to be controllably driven by servo motor 有权
    具有由伺服电机可控地驱动的可动单元的机器

    公开(公告)号:US07638964B2

    公开(公告)日:2009-12-29

    申请号:US11498041

    申请日:2006-08-03

    摘要: A speed region of a motor is divided into a region lower than a first switch speed VS1, a region higher than a second switch speed VS2 and a region between the first and second switch speeds. An abnormal load determination level to be compared with an estimated load obtained by an observer is set for each of the regions. An abnormal load determination level AL4 applied when an acceleration exceeds a threshold value is set. The abnormal load determination level AL4 is used for comparison with the estimated load until a predetermined period of time elapses after the acceleration to be commanded to the motor, which once exceeded the threshold level, drops. In other cases, the estimated load is compared with the abnormal load determination level having a value according to the speed. If the estimated load exceeds the compared abnormal load determination level, it is judged that a collision is detected.

    摘要翻译: 电动机的速度区域被分成低于第一开关速度VS1,高于第二开关速度VS2的区域和第一和第二开关速度之间的区域。 针对每个区域设定要与观察者获得的估计负载进行比较的异常负载确定水平。 设定加速度超过阈值时施加的异常负荷判定水平AL4。 异常负载确定电平AL4用于与估计的负载进行比较,直到在超过阈值电平的电动机被命令的加速之后经过预定时间段时。 在其他情况下,将估计负载与根据速度具有值的异常负载确定水平进行比较。 如果估计负载超过比较的异常负载判定水平,则判断为检测到碰撞。

    Controller for machine tool
    48.
    发明申请
    Controller for machine tool 审中-公开
    机床控制器

    公开(公告)号:US20080086724A1

    公开(公告)日:2008-04-10

    申请号:US11902202

    申请日:2007-09-19

    IPC分类号: G06F9/44

    摘要: A processing program is constituted by a main program and sub-programs, and a plurality of processing programs are stored in a storage means. Only main programs are extracted from the storage means and displayed on a display device by a list. Extraction of only the main program is performed by determining whether a program to be detected has a specific code included in only the main program or whether the program to be detected has a specific code included in only a sub-program.

    摘要翻译: 处理程序由主程序和子程序构成,并且多个处理程序存储在存储装置中。 仅从存储装置提取主程序并通过列表显示在显示装置上。 仅通过确定要检测的程序是否具有仅包括在主程序中的特定代码,或者所检测的程序是否仅包括在子程序中的特定代码来执行仅主程序的提取。

    Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method
    50.
    发明申请
    Polymer compound, photoresist composition including the polymer compound, and resist pattern formation method 有权
    高分子化合物,包含高分子化合物的光致抗蚀剂组合物和抗蚀图案形成方法

    公开(公告)号:US20070172757A1

    公开(公告)日:2007-07-26

    申请号:US10588866

    申请日:2005-01-20

    IPC分类号: G03C1/00

    摘要: The present invention provide a polymer compound whereby the alkali solubility greatly changes before and after exposure in a chemically amplified positive resist, and a photoresist composition including the polymer compound and a resist pattern formation method which can form a fine pattern with high resolution. The photoresist composition and the resist pattern formation method use the polymer compound including at least one substituent group selected from an alcoholic hydroxyl group, a phenolic hydroxyl group, or a carboxyl group as an alkali soluble group (i), wherein the substituent group is protected by an acid dissociable, dissolution inhibiting group (ii) represented by a general formula (1): —CH2—O—R  (1)(wherein R represents an organic group containing no more than 20 carbon atoms and at least one hydrophilic group).

    摘要翻译: 本发明提供了一种聚合物化合物,其中碱溶解度在化学放大的正性抗蚀剂中暴露之前和之后剧烈变化,以及包含高分子化合物的光致抗蚀剂组合物和能够以高分辨率形成精细图案的抗蚀剂图案形成方法。 光致抗蚀剂组合物和抗蚀剂图案形成方法使用包含至少一个选自醇羟基,酚羟基或羧基的取代基的聚合物化合物作为碱溶性基团(i),其中取代基被保护 通过由通式(1)表示的酸解离的溶解抑制基团(ⅱ):<?in-line-formula description =“In-line Formulas”end =“lead”→> CH 2 (式中,R表示含有不超过20个碳原子的有机基团和至少一个亲水基团) 。