公开(公告)号：US20130235664A1

公开(公告)日：2013-09-12

申请号：US13866966

申请日：2013-04-19

Applicant: SILICON STORAGE TECHNOLOGY INC.

Inventor： Hieu Van Tran ,  Sakhawat M. KHAN

IPC: G11C16/10

CPC classification number: G11C16/10 ,  G11C11/5621 ,  G11C11/5628 ,  G11C11/5635 ,  G11C11/5642 ,  G11C11/5678 ,  G11C13/0004 ,  G11C16/08 ,  G11C16/24 ,  G11C16/28 ,  G11C27/005 ,  G11C2211/5634

Abstract: A high speed voltage mode sensing is provided for a digital multibit non-volatile memory integrated system. An embodiment has a local source follower stage followed by a high speed common source stage. Another embodiment has a local source follower stage followed by a high speed source follower stage. Another embodiment has a common source stage followed by a source follower. An auto zeroing scheme is used. A capacitor sensing scheme is used. Multilevel parallel operation is described.

Abstract translation: 为数字多位非易失性存储器集成系统提供高速电压模式感测。 一个实施例具有本地源跟随器阶段，之后是高速公共源级。 另一个实施例具有本地源极跟随器级，之后是高速源极跟随器级。 另一个实施例具有公共源级，之后是源跟随器。 使用自动归零方案。 使用电容感测方案。 描述多级并行操作。

公开(公告)号：US20040183118A1

公开(公告)日：2004-09-23

申请号：US10393896

申请日：2003-03-21

Applicant: Silicon Storage Technology, Inc.

Inventor： Bomy Chen ,  Ying Kit Tsui ,  Wen-Juei Lu

IPC: H01L029/76

CPC classification number: H01L27/11556 ,  H01L27/115 ,  H01L29/42336 ,  H01L29/7885

Abstract: A method of forming an array of floating gate memory cells, and an array formed thereby, wherein a trench is formed into a surface of a semiconductor substrate. The source region is formed underneath the trench, the drain region is formed along the substrate surface, and the channel region therebetween includes a first portion extending vertically along the trench sidewall and a second portion extending horizontally along the substrate surface. The floating gate is disposed in the trench adjacent to and insulated from the channel region first portion. The control gate is disposed over and insulated from the channel region second portion. The trench sidewall meets the substrate surface at an acute angle to form a sharp edge. The channel region second portion extends from the second region in a direction toward the sharp edge and the floating gate to define a path for programming the floating gate with electrons via hot electron injection.

Abstract translation: 一种形成浮置栅极存储单元阵列的方法，以及由此形成的阵列，其中沟槽形成在半导体衬底的表面中。 源极区形成在沟槽下方，漏极区沿着衬底表面形成，并且其间的沟道区包括沿着沟槽侧壁垂直延伸的第一部分和沿衬底表面水平延伸的第二部分。 浮动栅极设置在与沟道区域第一部分相邻并与沟槽区域第一部分绝缘的沟槽中。 控制栅极设置在通道区域第二部分之上并与沟道区域第二部分绝缘。 沟槽侧壁以锐角与衬底表面相接触以形成锋利的边缘。 沟道区域第二部分从朝向尖锐边缘的方向从第二区域延伸，并且浮置栅极限定用于通过热电子注入用电子编程浮动栅极的路径。

公开(公告)号：US20250165342A1

公开(公告)日：2025-05-22

申请号：US19033427

申请日：2025-01-21

Applicant: Silicon Storage Technology, inc.

Inventor： Hieu Van Tran

IPC: G06F11/10

Abstract: Numerous examples are disclosed of an improved grouping and error correction system for non-volatile memory cells. In one example, a system comprises a memory array comprising non-volatile memory cells arranged into rows and columns, wherein the array stores a plurality of words, wherein respective words are divided into multiple sub-words and respective non-volatile memory cells in the memory array store digital bits belonging to different sub-words of the plurality of sub-words.

公开(公告)号：US20250125722A1

公开(公告)日：2025-04-17

申请号：US18988877

申请日：2024-12-19

Applicant: Silicon Storage Technology, Inc.

Inventor： Thoan Nguyen ,  Nghia Nguyen ,  Viet Nguyen ,  Son Nguyen ,  Hien Lai ,  Phuong Nguyen

IPC: H02M3/07 ,  H02M1/00

Abstract: In one example, a system comprises a plurality of charge pump units connected in parallel to receive an input voltage and to generate an output voltage greater than the input voltage; and a pumping controller to provide a pumping signal to a first charge pump unit of the plurality of charge pump units and to provide sequentially delayed versions of the pumping signal to the other charge pump units of the plurality of charge pump units, the pumping controller comprising a plurality of circuit blocks, each of the plurality of circuit blocks comprising a delay circuit and a latch.

公开(公告)号：US12217165B2

公开(公告)日：2025-02-04

申请号：US17190376

申请日：2021-03-02

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran

IPC: G11C16/24 ,  G06N3/065 ,  G11C11/40 ,  G11C16/10 ,  G11C16/12 ,  G11C16/26

Abstract: Numerous embodiments of analog neural memory systems that enable concurrent write and verify operations are disclosed. In some embodiments, concurrent operations occur among different banks of memory. In other embodiments, concurrent operations occur among different blocks of memory, where each block comprises two or more banks of memory. The embodiments substantially reduce the timing overhead for weight writing and verifying operations in analog neural memory systems.

公开(公告)号：US12205655B2

公开(公告)日：2025-01-21

申请号：US17841411

申请日：2022-06-15

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Anh Ly ,  Steven Lemke ,  Nha Nguyen ,  Vipin Tiwari ,  Nhan Do

IPC: G11C16/34 ,  G06F3/06 ,  G06N3/063 ,  G06N3/08 ,  G11C16/10 ,  G11C16/26 ,  G11C29/10

Abstract: In one example, a method of testing a plurality of non-volatile memory cells in an array of non-volatile memory cells, wherein the array is arranged in rows and columns, wherein each row is coupled to a word line and each column is coupled to a bit line, and wherein each word line is selectively coupled to a row decoder and each bit line is selectively coupled to a column decoder, comprises asserting, by the row decoder, all word lines in the array; asserting, by the column decoder, all bit lines in the array; performing a deep programming operation on the array of non-volatile memory cells; and measuring a total current received from the bit lines.

公开(公告)号：US12144172B2

公开(公告)日：2024-11-12

申请号：US17745639

申请日：2022-05-16

Applicant: Silicon Storage Technology, Inc.

Inventor： Zhuoqiang Jia ,  Leo Xing ,  Xian Liu ,  Serguei Jourba ,  Nhan Do

IPC: H10B41/49 ,  H01L21/28 ,  H01L29/66 ,  H10B41/35 ,  H10B41/41 ,  H01L29/423

Abstract: A method of forming a device on a semiconductor substrate having first, second, third and dummy areas, includes recessing the substrate upper surface in the first, second and dummy areas, forming a first conductive layer over the substrate, removing the first conductive layer from the third area and a second portion of the dummy area, forming a first insulation layer over the substrate, forming first trenches through the first insulation layer and into the substrate in the third area and the second portion of the dummy area, forming second trenches through the first insulation layer, the first conductive layer and into the substrate in the first and second areas and a first portion of the dummy area, and filling the first and second trenches with insulation material. Then, memory cells are formed in the first area, HV devices in the second area and logic devices in the third area.

公开(公告)号：US12124944B2

公开(公告)日：2024-10-22

申请号：US17185725

申请日：2021-02-25

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Steven Lemke ,  Nhan Do ,  Mark Reiten

IPC: G06N3/065 ,  G06F17/16

CPC classification number: G06N3/065 ,  G06F17/16

Abstract: Numerous embodiments of a precision programming algorithm and apparatus are disclosed for precisely and quickly depositing the correct amount of charge on the floating gate of a non-volatile memory cell within a vector-by-matrix multiplication (VMM) array in an artificial neural network. Selected cells thereby can be programmed with extreme precision to hold one of N different values.

公开(公告)号：US12099921B2

公开(公告)日：2024-09-24

申请号：US17367633

申请日：2021-07-06

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Stanley Hong ,  Anh Ly ,  Thuan Vu ,  Hien Pham ,  Kha Nguyen ,  Han Tran

IPC: G06N3/065 ,  G06F17/16 ,  G06N3/04

CPC classification number: G06N3/065 ,  G06F17/16 ,  G06N3/04

Abstract: Numerous embodiments of decoders for use with a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. The decoders include bit line decoders, word line decoders, control gate decoders, source line decoders, and erase gate decoders. In certain embodiments, a high voltage version and a low voltage version of a decoder is used.

公开(公告)号：US12075618B2

公开(公告)日：2024-08-27

申请号：US17133395

申请日：2020-12-23

Applicant: Silicon Storage Technology, Inc.

Inventor： Hieu Van Tran ,  Thuan Vu ,  Stephen Trinh ,  Stanley Hong ,  Toan Le ,  Nghia Le ,  Hien Pham

IPC: H10B41/42 ,  G06N3/08 ,  G11C16/04 ,  H01L29/788

CPC classification number: H10B41/42 ,  G06N3/08 ,  G11C16/0425 ,  H01L29/7883

Abstract: Numerous embodiments for reading or verifying a value stored in a selected memory cell in a vector-by-matrix multiplication (VMM) array in an artificial neural network are disclosed. In one embodiment, an input comprises a set of input bits that result in a series of input signals applied to a terminal of the selected memory cell, further resulting in a series of output signals that are digitized, shifted based on the bit location of the corresponding input bit in the set of input bits, and added to yield an output indicating a value stored in the selected memory cell.