公开(公告)号：US12018987B2

公开(公告)日：2024-06-25

申请号：US17433803

申请日：2020-03-25

Applicant: ams Sensors Singapore Pte. Ltd.

Inventor： Javier Miguel Sánchez

IPC: G01J3/45 ,  G01J3/26 ,  G01J3/28

CPC classification number: G01J3/45 ,  G01J3/26 ,  G01J2003/2879

Abstract: An example system includes a housing defining a cavity and an aperture, a photodetector disposed within the cavity, a voltage-tunable interferometer disposed within the cavity between the aperture and the photodetector, a first light source disposed within the cavity, and an electronic control device. The electronic control device is operable to vary an input voltage applied to the interferometer, and concurrently, cause the first light source to emit light towards the interferometer and measure light reflected from the interferometer using the photodetector. The electronic control device is also operable to determine a calibrated input voltage based on light reflected from the interferometer and measured by the photodetector. The electronic control device is also operable to apply the calibrated input voltage to the interferometer, and concurrently, obtain one or more spectral measurements using the photodetector.

公开(公告)号：US11973535B2

公开(公告)日：2024-04-30

申请号：US17424733

申请日：2020-01-17

Applicant: Nippon Telegraph and Telephone Corporation

Inventor： Osamu Moriwaki ,  Manabu Oguma ,  Kenya Suzuki ,  Takashi Go ,  Yuichiro Ikuma

IPC: H04B10/079 ,  G01J3/45 ,  G02B6/12 ,  G02B6/125 ,  H04B10/572 ,  H04J14/02

CPC classification number: H04B10/07957 ,  G01J3/45 ,  H04B10/079 ,  H04B10/572 ,  G02B6/12009 ,  G02B2006/12159 ,  G02B2006/12164 ,  G02B6/125 ,  H04J14/02

Abstract: A wavelength monitoring circuit obtains a light output proportional to only an input optical signal, independent of wavelength, by adding a light split circuit to the configuration in the related art, or changing the light split circuit to a light trifurcation circuit. In addition, wavelength monitoring with high accuracy is possible while improving the resistance to noise. The extraction of the light output proportional to only the input optical signal is performed by a light split circuit for input light at the top stage of the wavelength monitoring circuit or a light split circuit for interference in a stage in the middle of the circuit. The changed light split circuit causes the MZI included in the wavelength monitoring circuit to operate in a state of losing the balance of the configuration or the optical signal level, and increases the signal level near the bottom portion of the transmission characteristics.

公开(公告)号：US20240133743A1

公开(公告)日：2024-04-25

申请号：US18047120

申请日：2022-10-17

Applicant: Lawrence Livermore National Security, LLC

Inventor： Ryan Douglas Muir ,  John E. Heebner ,  Daniel Ernest Mittelberger

IPC: G01J3/45 ,  G01J3/02 ,  G01J3/28

CPC classification number: G01J3/45 ,  G01J3/0205 ,  G01J3/2823

Abstract: Methods, systems and devices are described that enable measurement and characterization of complex laser pulses by relying on three interferograms that are measured simultaneously. The described three-phase spectral interferometry (3 PSI) can meet the growing demand for optical recorders with long record and 1 ps or finer resolution. An example three-phase interferometric system includes a three-output optical splitter with a first input port to receive the input optical signal, a second input port to receive a reference optical signal with one or more unknown spectral characteristics. The three output ports of the optical splitter produce interferograms that correspond to relative phase shifts of substantially 120 degrees. Detectors are positioned to receive and measure the interferograms, which allows determination of the amplitude and phase of the input optical signal with very high accuracy. The described techniques include may improvements in the alignment, calibration and signal retrieval procedures associated with the 3PSI system.

公开(公告)号：US11965777B2

公开(公告)日：2024-04-23

申请号：US17276265

申请日：2019-07-04

Applicant: ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.

Inventor： Yoel Cohen ,  Ra'anan Gefen ,  Shlomi Epstein ,  Yoel Arieli

IPC: G01J3/02 ,  A61B3/00 ,  A61B3/107 ,  G01J3/45

CPC classification number: G01J3/0297 ,  A61B3/0008 ,  A61B3/107 ,  G01J3/45

Abstract: Apparatus and methods are described for calibrating an optical system that is used for measuring optical properties of a portion of a subjects body. During a calibration stage, a front surface of a calibration object (300) is illuminated, light reflected from a plurality of points on the calibration object (300) is detected, and intensities of the light reflected from the plurality of points on the calibration object (300) are measured. During a measurement stage, the portion of the subjects body is illuminated, and light reflected from the portion of the subjects body is detected. Measurements performed upon the light that was reflected from the portion of the subjects body are calibrated, using the measured intensities of the light reflected from the plurality of points on the calibration object (300). Other applications are also described.

公开(公告)号：US11937912B2

公开(公告)日：2024-03-26

申请号：US17236994

申请日：2021-04-21

Applicant: Hyperspectral Corp.

Inventor： David M. Palacios ,  Harry Hopper

IPC: A61B5/08 ,  A61B5/00 ,  A61B5/097 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/25 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497

CPC classification number: A61B5/082 ,  A61B5/7282 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497 ,  A61B5/097 ,  A61B2010/0087 ,  G01N2033/4975 ,  G01N2201/063

Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

公开(公告)号：US20240068872A1

公开(公告)日：2024-02-29

申请号：US18455276

申请日：2023-08-24

Applicant: THE UNIVERSITY OF TOKYO

Inventor： Hidetoshi KATORI

IPC: G01J3/45 ,  G04F5/14

CPC classification number: G01J3/45 ,  G04F5/14

Abstract: An electronic state splitter for atoms comprises an atom supplier, an atom movement path, a probe laser source, and a magnetic field generator. The atom supplier supplies atoms moving at a constant velocity along the atom movement path. The probe laser source supplies a probe laser propagating in the atom movement path in the same direction as or opposite to the motion of the atoms on the same axis as the atom movement path. The magnetic field generator generates a magnetic field orthogonal to the atom movement path in the atom movement path to mix the wave function of the clock upper state with the electronic state allowing electric dipole transitions, allowing pulsed excitation of clock transitions by the probe laser uniform in time and space. Accordingly, continuous spectroscopy of atomic transitions and frequency control of the probe laser are possible, which improves the stability of the atomic clock.

公开(公告)号：US20240060820A1

公开(公告)日：2024-02-22

申请号：US18180736

申请日：2023-03-08

Applicant: VERIFOOD, LTD.

Inventor： Damian GOLDRING ,  Dror SHARON ,  Guy BRODETZKI ,  Amit RUF ,  Menahem KAPLAN ,  Sagee ROSEN ,  Omer KEILAF ,  Uri KINROT ,  Kai ENGELHARDT ,  Ittai NIR

IPC: G01J3/10 ,  G01J3/02 ,  G01N21/25 ,  G01J3/12 ,  G01J3/28 ,  G01J3/36 ,  G01J5/02 ,  G01J5/10 ,  G01N33/02 ,  G01J3/26 ,  G01J3/45

CPC classification number: G01J3/108 ,  G01J3/10 ,  G01J3/0259 ,  G01N21/255 ,  G01J3/0205 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/12 ,  G01J3/0208 ,  G01J3/0262 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/36 ,  G01J5/0265 ,  G01J5/10 ,  G01N33/02 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/45 ,  G01J3/0229 ,  G01J2003/1226 ,  G01J3/0291 ,  G01J2003/123 ,  G01J2003/1239

Abstract: A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.

公开(公告)号：US20240044711A1

公开(公告)日：2024-02-08

申请号：US18487774

申请日：2023-10-16

Applicant: Gigaphoton Inc.

Inventor： Takuma YAMANAKA

IPC: G01J3/45 ,  H01S3/08

CPC classification number: G01J3/45 ,  H01S3/08086 ,  G01J2003/003

Abstract: A wavelength measurement apparatus includes a first spectrometer that has a first free spectral range and generates a first measured waveform from an interference pattern produced by a pulse laser beam, a second spectrometer that has a second free spectral range narrower than the first free spectral range and generates a second measured waveform from the interference pattern produced by the pulse laser beam, and a processor that reads data on a first measurement range of the first spectrometer, sets a second measurement range of the second spectrometer based on the data on the first measurement range, reads data on the second measurement range, and calculates a center wavelength of the pulse laser beam based on the data on the first measurement range and the data on the second measurement range.

公开(公告)号：US11879781B2

公开(公告)日：2024-01-23

申请号：US17425643

申请日：2019-11-19

Applicant: SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.

Inventor： Bin Guo

IPC: G01J3/45 ,  G01J3/28

CPC classification number: G01J3/45 ,  G01J3/2823 ,  G01J2003/2879

Abstract: A filter is irradiated with incident light, and calibrated light with a fixed wavelength is obtained after the incident light is transmitted through a calibration filter film on the filter; the calibrated light is selected and transmitted via the Fabry-Perot cavity, and selected light is obtained after the calibrated light is transmitted through the Fabry-Perot cavity; an image chip is irradiated with the selected light for imaging, and an output signal is obtained. When the selected wavelength of the tuneable Fabry-Perot cavity matches the wavelength of the calibrated light transmitted by the calibration filter film at a certain position, light at the position is selected and reaches the imaging chip, and the output signal of the imaging chip at the corresponding position can be used as a detection signal for self-calibration, which does not affect normal imaging at other positions on the filter besides the calibration filter film.

公开(公告)号：US11828593B2

公开(公告)日：2023-11-28

申请号：US17867425

申请日：2022-07-18

Applicant: Duke University

Inventor： Adam Wax ,  Michael Crose ,  William Brown

IPC: G01B9/02091 ,  A61B3/12 ,  A61B5/00 ,  G01J3/02 ,  G01J3/45

CPC classification number: G01B9/02091 ,  A61B3/12 ,  A61B5/0035 ,  A61B5/0066 ,  G01J3/0208 ,  G01J3/45

Abstract: An optical coherence tomography (OCT) scan device includes an OCT scan device housing, an interferometer disposed within the OCT scan device housing and including a light source, a fiber optic coupler including an interferometer output, a reference-arm, and a sample-arm. The OCT scan device further includes a power source configured to provide power to the light source and the remaining components of the OCT scan device, and a controller disposed within the OCT scan device housing and configured to adjust lens focusing parameters in the reference-arm and the sample-arm, and control a scanning function of an optical beam emitting from the sample-arm. The OCT scan device is further configured to transmit and receive control instructions and transmit fundus image data.