Efficient stress testing of a service oriented architecture based application
    51.
    发明授权
    Efficient stress testing of a service oriented architecture based application 失效
    基于服务的基于架构的应用程序的高效压力测试

    公开(公告)号:US07877732B2

    公开(公告)日:2011-01-25

    申请号:US11564417

    申请日:2006-11-29

    CPC classification number: G06F11/3688 G06F11/3414

    Abstract: A method for efficiently stress testing a service oriented architecture based application. A business process flow is recorded between a client and a server. When an XML document is extracted from the recorded business process flow, an XML document file is created for the extracted XML document, an XML document descriptor file is created comprising XPath queries for data elements in the XML document file, a configuration file is created comprising user input parameters obtained from the recorded business process flow, and test input data file is created. The user input parameters in the configuration file are used to generate a test script to test the service oriented architecture based application, wherein data values from the test input data file are inserted into a template of the XML document file at locations specified by the XPath queries in the XML document descriptor file. The test script is then executed.

    Abstract translation: 一种有效压力测试基于服务导向架构的应用程序的方法。 业务流程记录在客户端和服务器之间。 当从所记录的业务流程流中提取XML文档时,为所提取的XML文档创建XML文档文件,创建XML文档描述符文件,其包括XML文档文件中的数据元素的XPath查询,创建包括 从记录的业务处理流程获取的用户输入参数,以及测试输入数据文件被创建。 配置文件中的用户输入参数用于生成测试脚本以测试面向服务的基于架构的应用程序,其中来自测试输入数据文件的数据值被插入XML文档文件的模板中,这些位置由XPath查询指定的位置 在XML文档描述符文件中。 然后执行测试脚本。

    THIN FILM TRANSISTOR ARRAY PANEL AND METHOD FOR MANUFACTURING THE SAME
    53.
    发明申请
    THIN FILM TRANSISTOR ARRAY PANEL AND METHOD FOR MANUFACTURING THE SAME 有权
    薄膜晶体管阵列及其制造方法

    公开(公告)号:US20100140610A1

    公开(公告)日:2010-06-10

    申请号:US12556277

    申请日:2009-09-09

    CPC classification number: H01L29/66742 H01L27/1225 H01L27/124 H01L27/1248

    Abstract: A thin film transistor substrate according to an embodiment of the present invention includes: an insulation substrate; a gate line formed on the insulation substrate; a first interlayer insulating layer formed on the gate line; a data line and a gate electrode formed on the first interlayer insulating layer; a gate insulating layer formed on the data line and gate electrode; a semiconductor formed on the gate insulating layer and overlapping the gate electrode; a second interlayer insulating layer formed on the semiconductor; a first connection formed on the second interlayer insulating layer and electrically connecting the gate line and the gate electrode to each other; a drain electrode connected to the semiconductor; a pixel electrode connected to the drain electrode; and a second connection connecting the data line and the semiconductor to each other.

    Abstract translation: 根据本发明实施例的薄膜晶体管基板包括:绝缘基板; 形成在所述绝缘基板上的栅极线; 形成在栅极线上的第一层间绝缘层; 形成在所述第一层间绝缘层上的数据线和栅电极; 形成在数据线和栅电极上的栅极绝缘层; 形成在栅极绝缘层上并与栅电极重叠的半导体; 形成在所述半导体上的第二层间绝缘层; 形成在所述第二层间绝缘层上并将所述栅极线和所述栅电极彼此电连接的第一连接; 连接到半导体的漏电极; 连接到所述漏电极的像素电极; 以及将数据线和半导体彼此连接的第二连接。

    METHOD OF PLANARIZING SUBSTRATE, ARRAY SUBSTRATE AND METHOD OF MANUFACTURING ARRAY SUBSTRATE USING THE SAME
    54.
    发明申请
    METHOD OF PLANARIZING SUBSTRATE, ARRAY SUBSTRATE AND METHOD OF MANUFACTURING ARRAY SUBSTRATE USING THE SAME 审中-公开
    基板平面化方法,阵列基板及使用其制造阵列基板的方法

    公开(公告)号:US20090184325A1

    公开(公告)日:2009-07-23

    申请号:US12331044

    申请日:2008-12-09

    CPC classification number: H01L21/2686 H01L21/31058 H01L27/1248 H01L29/78636

    Abstract: A method of planarizing a substrate. An organic layer is formed on a base substrate to cover a metal line formed on the base substrate. A portion of the organic layer is removed to form a pre-planarization layer exposing the metal layer, so that a surface of the base substrate having the metal line is planarized. The pre-planarization layer is cured to flow toward a side surface of the metal line to form a planarization layer making contact with the side surface of the metal line. Therefore, a stepped portion between the base substrate and the metal line can be minimized or substantially eliminated, thereby increasing the surface uniformity of a subsequent layer, thereby improving the reliability of the manufacturing process.

    Abstract translation: 平面化基板的方法。 在基底基板上形成有机层,以覆盖形成在基底基板上的金属线。 去除有机层的一部分以形成暴露金属层的预平坦化层,使得具有金属线的基底基板的表面被平坦化。 固化预平坦化层以朝金属线的侧面流动,形成与金属线的侧面接触的平坦化层。 因此,可以将基底基板与金属线之间的阶梯部分最小化或基本上消除,从而提高后续层的表面均匀性,从而提高制造工艺的可靠性。

    Display substrate, method of manufacturing the same, and display device having the same
    56.
    发明申请
    Display substrate, method of manufacturing the same, and display device having the same 有权
    显示基板,其制造方法以及具有该显示基板的显示装置

    公开(公告)号:US20090008646A1

    公开(公告)日:2009-01-08

    申请号:US12217493

    申请日:2008-07-02

    Abstract: A display substrate includes a switching member, a color filter layer, an inorganic insulation layer and a pixel electrode. The switching member includes a gate line, a data line crossing the gate line, and a thin-film transistor (TFT) electrically connected to the gate line and the data line. The color filter layer is formed on the switching member. The inorganic insulation layer is formed on the color filter layer. The inorganic insulation layer has a hole formed thereon, which exposes a portion of the color filter layer in correspondence with the TFT The pixel electrode is formed on the inorganic insulation layer.

    Abstract translation: 显示基板包括切换构件,滤色器层,无机绝缘层和像素电极。 开关构件包括栅极线,与栅极线交叉的数据线,以及电连接到栅极线和数据线的薄膜晶体管(TFT)。 滤色器层形成在开关元件上。 无机绝缘层形成在滤色器层上。 无机绝缘层具有形成在其上的孔,其对应于TFT曝光一部分滤色器层。在无机绝缘层上形成像素电极。

    THIN FILM TRANSISTOR ARRAY PANEL FOR A DISPLAY
    57.
    发明申请
    THIN FILM TRANSISTOR ARRAY PANEL FOR A DISPLAY 有权
    薄膜晶体管阵列显示器

    公开(公告)号:US20080252828A1

    公开(公告)日:2008-10-16

    申请号:US11930653

    申请日:2007-10-31

    Abstract: A thin film transistor array panel includes a substrate, a first gate line and a second gate line formed on the substrate, a storage electrode line between the first gate line and the second gate line, a data line intersecting the first gate line and the second gate line, a first thin film transistor connected to the first gate line and the data line, at least one color filter formed on the first thin film transistor, wherein the color filter comprises a first portion adjacent the first gate line with respect to the storage electrode line, a second portion adjacent the second gate line with respect to the storage electrode line, and a first connection connecting the first portion and the second portion and having a narrower width than that of the first and second portions, a first sub-pixel electrode formed on the color filter and connected to the first thin film transistor, and a second sub-pixel electrode facing the first sub-pixel electrode with respect to a gap, wherein at least one of an edge of the first sub-pixel electrode and an edge of the second sub-pixel electrode crosses over the first connection of the color filter, the edge of the first sub-pixel electrode, and the edge of the second sub-pixel electrode defining the gap between the first sub-pixel electrode and the second sub-pixel electrode.

    Abstract translation: 薄膜晶体管阵列面板包括基板,形成在基板上的第一栅极线和第二栅极线,在第一栅极线和第二栅极线之间的存储电极线,与第一栅极线和第二栅极线相交的数据线 栅极线,连接到第一栅极线和数据线的第一薄膜晶体管,形成在第一薄膜晶体管上的至少一个滤色器,其中滤色器包括相对于存储器的第一栅极线的第一部分 电极线,相对于存储电极线相邻于第二栅极线的第二部分,以及连接第一部分和第二部分并且具有比第一和第二部分窄的宽度的第一连接,第一子像素 电极,形成在滤色器上并连接到第一薄膜晶体管,第二子像素电极相对于间隙面对第一子像素电极,其中至少在 第一子像素电极的边缘和第二子像素电极的边缘的第二子像素电极的边缘与滤色器的第一连接,第一子像素电极的边缘和第二子像素电极的边缘交叉 限定第一子像素电极和第二子像素电极之间的间隙的电极。

    Non-volatile memory device and method for fabricating the same
    58.
    发明授权
    Non-volatile memory device and method for fabricating the same 有权
    非易失性存储器件及其制造方法

    公开(公告)号:US09287283B2

    公开(公告)日:2016-03-15

    申请号:US13462082

    申请日:2012-05-02

    Abstract: A method for fabricating a non-volatile memory device includes alternately stacking a plurality of interlayer dielectric layers and a plurality of conductive layers over a substrate, etching the interlayer dielectric layers and the conductive layers to form a trench which exposes a surface of the substrate forming a first material layer over a resulting structure in which the trench is formed, forming a second material layer over the first material layer, removing portions of the second material layer and the first material layer formed on a bottom of the trench to expose the surface of the substrate, removing the second material layer, and burying a channel layer within the trench in which the second material layer is removed.

    Abstract translation: 一种用于制造非易失性存储器件的方法包括在衬底上交替堆叠多个层间电介质层和多个导电层,蚀刻层间电介质层和导电层以形成暴露衬底形成表面的沟槽 在其中形成沟槽的结果结构上的第一材料层,在第一材料层上形成第二材料层,去除第二材料层的部分和形成在沟槽的底部上的第一材料层,以暴露出 衬底,去除第二材料层,以及在去除第二材料层的沟槽内掩埋沟道层。

    Software testing automation framework
    59.
    发明授权
    Software testing automation framework 有权
    软件测试自动化框架

    公开(公告)号:US08914679B2

    公开(公告)日:2014-12-16

    申请号:US11363725

    申请日:2006-02-28

    CPC classification number: G06F11/3684 G06F11/3664

    Abstract: Embodiments of the present invention address deficiencies of the art in respect to software test automation and provide a method, system and apparatus for a reusable software testing framework. In one embodiment of the invention, an automated application test data processing system can include a reusable test automation framework. The system further can include a test task generator and a scenario generator coupled to one another and to the framework. In this regard, the test task generator can be configured to generate uniform logic for performing testing tasks, while the scenario generator can be configured to arrange testing tasks for a complete test scenario. Finally, a collaborative testing environment can be provided through which multiple users can interact with the scenario generator and test task generator to produce test cases of different test scenarios.

    Abstract translation: 本发明的实施例解决了本领域在软件测试自动化方面的缺陷,并且提供了一种用于可重复使用的软件测试框架的方法,系统和装置。 在本发明的一个实施例中,自动应用测试数据处理系统可以包括可重用的测试自动化框架。 该系统还可以包括测试任务生成器和彼此耦合到框架的脚本生成器。 在这方面,测试任务生成器可以配置为生成用于执行测试任务的统一逻辑,而脚本生成器可以配置为为完整测试场景安排测试任务。 最后,可以提供协作测试环境,多个用户可以通过该环境与脚本生成器和测试任务生成器进行交互,以生成不同测试场景的测试用例。

Patent Agency Ranking