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51.
公开(公告)号:US20170038402A1
公开(公告)日:2017-02-09
申请号:US15229767
申请日:2016-08-05
Applicant: Elemental Scientific, Inc.
Inventor: Daniel R. Wiederin , Kevin Hahn , Connor Doolan , Karl Hauke , Guangwei Ji , Tyler Yost
Abstract: A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
Abstract translation: 描述了用于自动采样装置的样本识别系统。 系统实施例包括但不限于具有多个孔的样本保持器,其被配置为在其中容纳多个样本容器,样本保持器具有位于样本保持器附近的一个或多个对应的样本保持器标识符; 以及标识符捕获装置,被配置为检测位于样本保持器附近的一个或多个样本保持器标识符,并响应于此产生数据信号,所述数据信号对应于样品保持器相对于其上的样品的至少取向 样品架定位。
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公开(公告)号:US09523700B1
公开(公告)日:2016-12-20
申请号:US14525531
申请日:2014-10-28
Applicant: Elemental Scientific, Inc.
Inventor: Tyler Yost , David Diaz , Daniel R. Wiederin , Kevin Hahn
CPC classification number: G01N35/00732 , G01N35/1011 , G01N2035/00752 , G01N2035/00831 , G01N2035/00841 , G01N2035/00851 , G01N2035/00881 , G06K7/10564 , G06K7/1417 , G06K19/06037
Abstract: A sample identification system for an automated sampling and dispensing device is described. In an example implementation, the sample identification system includes a sample probe configured to contact a sample positioned within a sample vessel. Further, the sample identification system includes an identifier capture device configured to measure a sample identifier associated with the sample vessel and generate a data signal in response thereto, where the data signal corresponds to an identity of the at least one sample. During operation, the identifier capture device scans a sample holder, a sample vessel, or a table top of the automated sampling and dispensing device to measure the sample identifier and to generate the data signal in response thereto.
Abstract translation: 描述了用于自动取样和分配装置的样品识别系统。 在示例性实施方案中,样品识别系统包括构造成接触位于样品容器内的样品的样品探针。 此外,样本识别系统包括标识符捕获装置,其被配置为测量与样本容器相关联的样本标识符并响应于此产生数据信号,其中数据信号对应于至少一个样本的身份。 在操作期间,标识符捕获装置扫描自动取样和分配装置的样品架,样品容器或台面,以测量样品标识符并响应于此产生数据信号。
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公开(公告)号:US20250129862A1
公开(公告)日:2025-04-24
申请号:US18903396
申请日:2024-10-01
Applicant: Elemental Scientific, Inc.
Inventor: Caleb Gilmore , Tyler Yost
Abstract: Valve assemblies are described that provide magnetic coupling between a valve actuator and a valve body housing the valve rotor and stator. A valve assembly embodiment, includes, but is not limited to, a valve body, the valve body including at least one magnet, and a rotor and a stator configured to define a plurality of fluid flow passageways; a valve actuator configured to drive the rotor via a drive shaft; and an actuator mount coupled to the valve actuator and configured to magnetically couple with the at least one magnet of the valve body to magnetically couple the valve body and the valve actuator.
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公开(公告)号:US20240255390A1
公开(公告)日:2024-08-01
申请号:US18436198
申请日:2024-02-08
Applicant: Elemental Scientific, Inc.
Inventor: David Diaz , Jonathan Hein , Kyle W. Uhlmeyer , Daniel R. Wiederin , Tyler Yost , Kevin Wiederin
CPC classification number: G01N1/10 , G01N1/14 , G01N35/00732 , G01N35/00871 , G01N35/1097 , H01J49/045 , G01N2001/002
Abstract: A system includes an analysis system at a first location and one or more remote sampling systems at a second location remote from the first location. A sampling system can be configured to receive a remote liquid sample. The system also includes a sample transfer line configured to transport gas from the second location to the first location. The sample transfer line is configured to selectively couple with a remote sampling system for supplying a continuous liquid sample segment to the sample transfer line. The system can further include a sample receiving line at the first location. The sample receiving line is configured to selectively couple with the sample transfer line and the analysis system to receive the continuous liquid sample segment and supply the sample to an analysis device.
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55.
公开(公告)号:US20240142480A1
公开(公告)日:2024-05-02
申请号:US17973947
申请日:2022-10-26
Applicant: Elemental Scientific, Inc.
Inventor: Caleb Gilmore , Tyler Yost , Basanta Bhusal , Ripudaman Shekhawat , Kevin Conrad
CPC classification number: G01N35/026 , G01N1/10 , G01N35/1004 , G01N2035/0405
Abstract: Systems and methods for safe collection and transportation of fluid samples for analysis are described. A system embodiment includes, but is not limited to, a housing defining an interior region to introduce a fluid sample to a sample vessel; a support platform to hold the sample vessel and laterally position the sample vessel to a plurality of locations within the interior region; an uncapper configured to automatically remove a cap of the sample vessel from a base of the sample vessel prior to introduction of the fluid sample to the base and to automatically replace the cap to the vessel base subsequent to introduction of the fluid sample to the base; and a fluid sample probe configured to fluidically couple with a fluid sample source and to dispense fluid from the fluid sample source into the vessel base.
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公开(公告)号:US20240006201A1
公开(公告)日:2024-01-04
申请号:US18327226
申请日:2023-06-01
Applicant: Elemental Scientific, Inc.
Inventor: Tyler Yost , Daniel R. Wiederin , Beau A. Marth , Jared Kaser , Jonathan Hein , Jae Seok Lee , Jae Min Kim , Stephen H. Sudyka
IPC: H01L21/67 , H01L21/66 , H01L21/677 , H01J49/10 , G01N21/73
CPC classification number: H01L21/6719 , H01L21/67126 , H01L22/34 , H01L21/67772 , H01J49/105 , H01L21/67748 , H01L21/67051 , H01L21/67259 , H01L21/6708 , G01N21/73 , H01L22/14 , H01L21/6715 , H01L22/12 , H01J49/00
Abstract: Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
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公开(公告)号:US20230375582A1
公开(公告)日:2023-11-23
申请号:US18307135
申请日:2023-04-26
Applicant: Elemental Scientific, Inc.
Inventor: Daniel R. Wiederin , Kevin Hahn , Connor Doolan , Karl Hauke , Guangwei Ji , Tyler Yost
CPC classification number: G01N35/00732 , B01L9/06 , G01N35/109 , B01L3/545 , G01N2035/0091 , B01L2200/025 , G01N2035/00801 , G01N2035/00673 , G01N2035/0418
Abstract: A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
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公开(公告)号:US20230375579A1
公开(公告)日:2023-11-23
申请号:US18200711
申请日:2023-05-23
Applicant: Elemental Scientific, Inc.
Inventor: Tyler Yost , Jonathan Hein , Jae Seok Lee , Dong Cherl Park
IPC: G01N35/00
CPC classification number: G01N35/00613 , G01N35/00871 , G01N2035/009
Abstract: A sample analysis system is available that can include a remote sampling system, at least one analyzer, and a controller. The remote sampling system can include a plurality of sample sources for providing a corresponding sample therefrom; and a plurality of sample collection devices selectively coupled to any of the plurality of sample sources for receiving at least one of the samples therefrom. The at least one analyzer can be coupled to the plurality of the sample collection devices for receiving at least one of the samples therefrom. The controller can be coupled with the remote sampling system and the at least one analyzer, the controller configured to control which of the sample sources is actively coupled to a given sample collection device at a given time.
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公开(公告)号:US11804390B2
公开(公告)日:2023-10-31
申请号:US17562411
申请日:2021-12-27
Applicant: Elemental Scientific, Inc.
Inventor: Tyler Yost , Daniel R. Wiederin , Beau Marth , Jared Kaser , Jonathan Hein , Jae Seok Lee , Jae Min Kim , Stephen H. Sudyka
CPC classification number: H01L21/6719 , G01N21/73 , H01J49/105 , H01L21/6708 , H01L21/6715 , H01L21/67051 , H01L21/67126 , H01L21/67259 , H01L21/67748 , H01L21/67772 , H01L22/14 , H01L22/34 , G01N2033/0095 , H01J49/00 , H01L22/12
Abstract: Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
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公开(公告)号:US20230111929A1
公开(公告)日:2023-04-13
申请号:US17968124
申请日:2022-10-18
Applicant: Elemental Scientific, Inc.
Inventor: Tyler Yost , Daniel R. Wiederin , Beau A. Marth , Jared Kaser , Jonathan Hein , Jae Seok Lee , Jae Min Kim , Stephen H. Sudyka
IPC: H01L21/67 , H01L21/66 , H01L21/677 , H01J49/10 , G01N21/73
Abstract: Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
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