ARCHITECTURE AND METHOD FOR NAND FLASH MEMORY
    52.
    发明申请
    ARCHITECTURE AND METHOD FOR NAND FLASH MEMORY 有权
    NAND FLASH存储器的结构和方法

    公开(公告)号:US20080192538A1

    公开(公告)日:2008-08-14

    申请号:US12107315

    申请日:2008-04-22

    Applicant: Jin-Man Han

    Inventor: Jin-Man Han

    Abstract: A NAND memory architecture arranges all even bitlines of a page together, and arranges all odd bitlines of a page together, so that programming operations are carried out on adjacent bitlines on the same word line to reduce floating gate coupling. Non-connected bitlines can be used at boundaries between even and odd sections of the array to further reduce floating gate coupling.

    Abstract translation: NAND存储器架构将页面的所有偶数位线布置在一起,并且将页面的所有奇数位线布置在一起,使得在相同字线上的相邻位线上执行编程操作以减少浮动栅极耦合。 可以在阵列的偶数和奇数部分之间的边界处使用非连接的位线,以进一步减少浮动栅极耦合。

    RANDOM CACHE READ
    53.
    发明申请
    RANDOM CACHE READ 有权
    随机缓存阅读

    公开(公告)号:US20080074933A1

    公开(公告)日:2008-03-27

    申请号:US11515629

    申请日:2006-09-05

    CPC classification number: G11C7/1042 G11C7/1051 G11C16/26 G11C2207/2245

    Abstract: A non-volatile memory is described that utilizes a cache read mode of operation, where a next page of memory is being read/sensed from the memory array by the sense amplifiers while a previously read page of memory is being read from the memory I/O buffer, wherein the next page is user selected. This random cache read mode allows for a memory with a random page read capability, in which the address of the next page of data to be read is user selectable, which benefits from the low latency of a cache read mode of operation due to concurrent data sensing and data I/O.

    Abstract translation: 描述了利用高速缓存读取操作模式的非易失性存储器,其中由读出放大器从存储器阵列读取/感测存储器的下一页,同时从存储器I / O缓冲器,其中下一页是用户选择的。 这种随机高速缓存读取模式允许具有随机页面读取功能的存储器,其中要读取的下一页数据的地址是用户可选择的,这受益于由于并发数据而导致的高速缓存读取操作模式的低等待时间 感测和数据I / O。

    Programming memory devices
    54.
    发明授权
    Programming memory devices 有权
    编程存储器件

    公开(公告)号:US07345924B2

    公开(公告)日:2008-03-18

    申请号:US11546171

    申请日:2006-10-11

    CPC classification number: G11C16/10

    Abstract: A target memory cell of a memory device is programmed by applying a programming voltage to a word line that includes the target memory cell, determining whether the target memory cell is programmed, and increasing the programming voltage by a step voltage if it is determined that the target memory cell is not programmed. An initial programming voltage and the step voltage are each selectable after fabrication of the memory device.

    Abstract translation: 通过将编程电压施加到包括目标存储器单元的字线,确定目标存储器单元是否被编程来编程存储器件的目标存储器单元,并且如果确定所述编程电压被确定为 目标存储单元未编程。 在制造存储器件之后,可以选择初始编程电压和阶跃电压。

    Architecture and method for NAND flash memory
    55.
    发明申请
    Architecture and method for NAND flash memory 有权
    NAND闪存的架构和方法

    公开(公告)号:US20070291565A1

    公开(公告)日:2007-12-20

    申请号:US11452697

    申请日:2006-06-14

    Applicant: Jin-Man Han

    Inventor: Jin-Man Han

    Abstract: A NAND memory architecture arranges all even bitlines of a page together, and arranges all odd bitlines of a page together, so that programming operations are carried out on adjacent bitlines on the same word line to reduce floating gate coupling. Non-connected bitlines can be used at boundaries between even and odd sections of the array to further reduce floating gate coupling.

    Abstract translation: NAND存储器架构将页面的所有偶数位线布置在一起,并且将页面的所有奇数位线布置在一起,使得在相同字线上的相邻位线上执行编程操作以减少浮动栅极耦合。 可以在阵列的偶数和奇数部分之间的边界处使用非连接的位线,以进一步减少浮动栅极耦合。

    FLASH MEMORY PROGRAMMING TO REDUCE PROGRAM DISTURB
    56.
    发明申请
    FLASH MEMORY PROGRAMMING TO REDUCE PROGRAM DISTURB 失效
    闪存编程减少程序干扰

    公开(公告)号:US20070133294A1

    公开(公告)日:2007-06-14

    申请号:US11675151

    申请日:2007-02-15

    CPC classification number: G11C16/12 G11C16/0483 G11C16/3427

    Abstract: The method for reducing program disturb in a flash memory array biases a selected wordline at a programming voltage. One of the unselected wordlines, closer to array ground than the selected wordline, is biased at a voltage that is less than Vpass. The memory cells on this unselected wordline that are biased at this voltage block the gate induced drain leakage from the cells further up in the array. The remaining unselected wordlines are biased at Vpass. In another embodiment, a second source select gate line is added to the array. The source select gate line that is closest to the wordlines is biased at the voltage that is less than Vpass in order to block the gate induced drain leakage from the array.

    Abstract translation: 用于减少闪速存储器阵列中的编程干扰的方法在编程电压下偏置所选择的字线。 未选择的字线之一,比所选择的字线更接近阵列地,被偏置在小于V 的电压。 在这个未被选择的字线上被偏置在该电压下的存储器单元阻挡栅极引起的漏极从阵列中的细胞进一步上升。 剩余的未选择的字线偏向V 。 在另一个实施例中,第二源选择栅极线被添加到阵列。 最靠近字线的源选择栅极线被偏置在小于V 的电压,以便阻挡来自阵列的栅感应漏极泄漏。

    Standby current detecting circuit for use in a semiconductor memory
device and method thereof
    58.
    发明授权
    Standby current detecting circuit for use in a semiconductor memory device and method thereof 失效
    一种用于半导体存储器件的待机电流检测电路及其方法

    公开(公告)号:US5784322A

    公开(公告)日:1998-07-21

    申请号:US772356

    申请日:1996-12-23

    CPC classification number: G11C29/50 G11C11/401 G11C2029/5006

    Abstract: A standby current detecting circuit for use in a semiconductor memory device and method thereof are described. The memory device has a plurality of memory cells arranged at crossing points of a plurality of word lines and a plurality of bit lines. A plurality of switches are associated with each memory cell. A current path supplies current to each memory cell through the switch associated with each memory cell. A plurality of decoders are provided with each decoder for detecting a standby current supplied on one such current path for the memory cell. Each decoder includes control logic for selectively opening and isolating the switch associated with the memory cell in a standby current detection mode.

    Abstract translation: 描述了用于半导体存储器件的待机电流检测电路及其方法。 存储器件具有布置在多个字线和多个位线的交叉点处的多个存储器单元。 多个开关与每个存储单元相关联。 当前路径通过与每个存储器单元相关联的开关向每个存储器单元提供电流。 提供多个解码器,每个解码器用于检测在存储单元的一个这样的电流路径上提供的待机电流。 每个解码器包括用于在待机电流检测模式中选择性地打开和隔离与存储器单元相关联的开关的控制逻辑。

    Integrated circuit memory device including banks of memory cells and
related methods
    59.
    发明授权
    Integrated circuit memory device including banks of memory cells and related methods 失效
    集成电路存储器件包括存储单元组和相关方法

    公开(公告)号:US5650977A

    公开(公告)日:1997-07-22

    申请号:US637425

    申请日:1996-04-25

    CPC classification number: G11C5/025 G11C5/063 G11C8/12

    Abstract: An integrated circuit memory device includes a plurality of memory cells, a plurality of data lines, a memory cell selector, and a memory cell connector. The memory cells are arranged in a matrix of rows and columns wherein the plurality of memory cells are further grouped in banks with each bank including at least two rows of memory cells. Each of the data lines extends along one of the columns of memory cells so that each of the data lines extends along memory cells from each of the banks of memory cells. The memory cell selector includes a row decoder which selects one of the plurality of rows, a column decoder which selects one of the plurality of columns, and a bank decoder which selects one of the banks. The connector connects one of the memory cells to a respective data line in response to the memory cell selector. Accordingly, data from only one of the memory cells is provided on a respective one of the data lines at any point and time.

    Abstract translation: 集成电路存储器件包括多个存储单元,多条数据线,存储单元选择器和存储单元连接器。 存储器单元被布置成行和列的矩阵,其中多个存储器单元进一步分组为库,每个存储体包括至少两行存储单元。 每个数据线沿存储器单元的列之一延伸,使得每个数据线沿着存储器单元的每一组的存储器单元延伸。 存储单元选择器包括选择多个行之一的行解码器,选择多个列之一的列解码器和选择一个存储体的存储体解码器。 该连接器响应于存储单元选择器,将一个存储单元连接到相应的数据线。 因此,仅在一个存储单元中的数据在任何时间点都被提供在数据线的相应一个上。

    Memory with interleaved read and redundant columns
    60.
    发明授权
    Memory with interleaved read and redundant columns 有权
    具有交错读和冗余列的内存

    公开(公告)号:US08379448B2

    公开(公告)日:2013-02-19

    申请号:US13308405

    申请日:2011-11-30

    CPC classification number: G11C29/846 G11C29/82 G11C2216/30

    Abstract: Apparatus and methods are disclosed, such as those involving a flash memory device. One such apparatus includes a memory block including a plurality of columns. Each of the columns includes a bit line and a plurality of memory cells on the bit line. The plurality of columns include a plurality of groups of regular columns and a plurality of groups of redundant columns. The apparatus also includes a plurality of data latches. Each of the data latches is configured to store data read from a respective one group of regular columns. The apparatus further includes a plurality of redundant data latches. Each of the redundant data latches is configured to store data read from a respective one group of redundant columns. The apparatus also includes a multiplexer configured to selectively output data from the plurality of data latches and the plurality of redundant data latches.

    Abstract translation: 公开了装置和方法,例如涉及闪存装置的装置和方法。 一种这样的装置包括包括多个列的存储块。 每个列包括位线和位线上的多个存储单元。 多个列包括多组常规列和多组冗余列。 该装置还包括多个数据锁存器。 每个数据锁存器被配置为存储从相应的一组常规列读取的数据。 该装置还包括多个冗余数据锁存器。 每个冗余数据锁存器被配置为存储从相应的一组冗余列读取的数据。 该装置还包括多路复用器,其被配置为选择性地从多个数据锁存器和多个冗余数据锁存器输出数据。

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