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公开(公告)号:US10978128B2
公开(公告)日:2021-04-13
申请号:US16586334
申请日:2019-09-27
Applicant: Micron Technology, Inc.
Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A cell may be written with a value that is intended to convey a different logic state than may typically be associated with the value. For example, a cell that has stored a charge associated with one logic state for a time period may be re-written to store a different charge, and the re-written cell may still be read to have the originally stored logic state. An indicator may be stored in a latch to indicate whether the logic state currently stored by the cell is the intended logic state of the cell. A cell may, for example, be re-written with an opposite value periodically, based on the occurrence of an event, or based on a determination that the cell has stored one value (or charge) for a certain time period.
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公开(公告)号:US10741755B2
公开(公告)日:2020-08-11
申请号:US16041374
申请日:2018-07-20
Applicant: Micron Technology, Inc.
Inventor: Scott E. Sills , Durai Vishak Nirmal Ramaswamy , Alessandro Calderoni
IPC: H01L27/24 , H01L27/11 , H01L45/00 , H01L27/11507
Abstract: An array of cross point memory cells comprises spaced first lines which cross spaced second lines. Two memory cells are individually between one of two immediately adjacent of the second lines and a same single one of the first lines.
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公开(公告)号:US10706906B2
公开(公告)日:2020-07-07
申请号:US16044310
申请日:2018-07-24
Applicant: Micron Technology, Inc.
Inventor: Alessandro Calderoni , Durai Vishak Nirmal Ramaswamy
IPC: G11C11/22
Abstract: Methods, systems, and devices for memory array operation are described. A series of pulses may be applied to a fatigued memory cell to improve performance of memory cell. For example, a ferroelectric memory cell may enter a fatigue state after a number of access operations are performed at an access rate. After the number of access operations have been performed at the access rate, a fatigue state of the ferroelectric memory cell may be identified and the series of pulses may be applied to the ferroelectric capacitor at a different (e.g., higher) rate. For instance, a delay between pulses of the series of pulses may be shorter than the delay between access operations of the ferroelectric memory cell.
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公开(公告)号:US20190139591A1
公开(公告)日:2019-05-09
申请号:US16184827
申请日:2018-11-08
Applicant: Micron Technology, Inc.
Inventor: Bei Wang , Alessandro Calderoni , Wayne Kinney , Adam Johnson , Durai Vishak Nirmal Ramaswamy
IPC: G11C11/22 , H01L27/11507 , G11C11/56 , G11C14/00
CPC classification number: G11C11/2275 , G11C11/22 , G11C11/221 , G11C11/2253 , G11C11/2273 , G11C11/5657 , G11C14/00 , H01L27/11502 , H01L27/11507
Abstract: Methods, systems, and devices for preventing disturb of untargeted memory cells during repeated access operations of target memory cells are described for a non-volatile memory array. Multiple memory cells may be in electronic communication with a common conductive line, and each memory cell may have an electrically non-linear selection component. Following an access operation (e.g., a read or write operation) of a target memory cell, untargeted memory cells may be discharged by applying a discharge voltage to the common conductive line. The discharge voltage may, for example, have a polarity opposite to the access voltage. In other examples, a delay may be instituted between access attempts in order to discharge the untargeted memory cells.
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公开(公告)号:US10153026B2
公开(公告)日:2018-12-11
申请号:US15858831
申请日:2017-12-29
Applicant: Micron Technology, Inc.
Inventor: Bei Wang , Alessandro Calderoni , Wayne Kinney , Adam Johnson , Durai Vishak Nirmal Ramaswamy
IPC: G11C11/22 , G11C11/56 , H01L27/11507 , G11C14/00 , H01L27/11502
Abstract: Methods, systems, and devices for preventing disturb of untargeted memory cells during repeated access operations of target memory cells are described for a non-volatile memory array. Multiple memory cells may be in electronic communication with a common conductive line, and each memory cell may have an electrically non-linear selection component. Following an access operation (e.g., a read or write operation) of a target memory cell, untargeted memory cells may be discharged by applying a discharge voltage to the common conductive line. The discharge voltage may, for example, have a polarity opposite to the access voltage. In other examples, a delay may be instituted between access attempts in order to discharge the untargeted memory cells.
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公开(公告)号:US10134982B2
公开(公告)日:2018-11-20
申请号:US14808959
申请日:2015-07-24
Applicant: Micron Technology, Inc.
Inventor: Scott E. Sills , Durai Vishak Nirmal Ramaswamy , Alessandro Calderoni
IPC: H01L27/24 , H01L45/00 , H01L27/11507
Abstract: An array of cross point memory cells comprises spaced first lines which cross spaced second lines. Two memory cells are individually between one of two immediately adjacent of the second lines and a same single one of the first lines.
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公开(公告)号:US09928894B2
公开(公告)日:2018-03-27
申请号:US15438462
申请日:2017-02-21
Applicant: Micron Technology, Inc.
Inventor: Bei Wang , Alessandro Calderoni , Wayne Kinney , Adam Johnson , Durai Vishak Nirmal Ramaswamy
IPC: G11C11/22 , G11C14/00 , G11C11/56 , H01L27/11507 , H01L27/11502
CPC classification number: G11C11/2275 , G11C11/22 , G11C11/221 , G11C11/2253 , G11C11/2273 , G11C11/5657 , G11C14/00 , H01L27/11502 , H01L27/11507
Abstract: Methods, systems, and devices for preventing disturb of untargeted memory cells during repeated access operations of target memory cells are described for a non-volatile memory array. Multiple memory cells may be in electronic communication with a common conductive line, and each memory cell may have an electrically non-linear selection component. Following an access operation (e.g., a read or write operation) of a target memory cell, untargeted memory cells may be discharged by applying a discharge voltage to the common conductive line. The discharge voltage may, for example, have a polarity opposite to the access voltage. In other examples, a delay may be instituted between access attempts in order to discharge the untargeted memory cells.
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公开(公告)号:US20180005682A1
公开(公告)日:2018-01-04
申请号:US15438462
申请日:2017-02-21
Applicant: Micron Technology, Inc.
Inventor: Bei Wang , Alessandro Calderoni , Wayne Kinney , Adam Johnson , Durai Vishak Nirmal Ramaswamy
IPC: G11C11/22 , G11C14/00 , H01L27/11507 , G11C11/56 , H01L27/11502
CPC classification number: G11C11/2275 , G11C11/22 , G11C11/221 , G11C11/2253 , G11C11/2273 , G11C11/5657 , G11C14/00 , H01L27/11502 , H01L27/11507
Abstract: Methods, systems, and devices for preventing disturb of untargeted memory cells during repeated access operations of target memory cells are described for a non-volatile memory array. Multiple memory cells may be in electronic communication with a common conductive line, and each memory cell may have an electrically non-linear selection component. Following an access operation (e.g., a read or write operation) of a target memory cell, untargeted memory cells may be discharged by applying a discharge voltage to the common conductive line. The discharge voltage may, for example, have a polarity opposite to the access voltage. In other examples, a delay may be instituted between access attempts in order to discharge the untargeted memory cells.
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公开(公告)号:US09858999B2
公开(公告)日:2018-01-02
申请号:US14970911
申请日:2015-12-16
Applicant: Micron Technology, Inc.
Inventor: Alessandro Calderoni , Massimo Ferro , Paolo Fantini
CPC classification number: G11C13/004 , G11C11/00 , G11C11/5678 , G11C13/0002 , G11C13/0004 , G11C13/0035 , G11C13/0069 , G11C13/0097 , G11C29/006 , G11C29/50008 , G11C2013/0052 , G11C2013/0057
Abstract: The present disclosure includes apparatuses and methods including drift acceleration in resistance variable memory. A number of embodiments include applying a programming signal to the resistance variable memory cell to program the cell to a target state, subsequently applying a pre-read signal to the resistance variable memory cell to accelerate a drift of a resistance of the programmed cell, and subsequently applying a read signal to the resistance variable memory cell.
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公开(公告)号:US20170365323A1
公开(公告)日:2017-12-21
申请号:US15645106
申请日:2017-07-10
Applicant: Micron Technology, Inc.
CPC classification number: G11C11/2275 , G06F11/1048 , G06F11/1068 , G11C11/221 , G11C11/2273 , G11C29/52
Abstract: Methods, systems, and devices for operating a ferroelectric memory cell or cells are described. A cell may be written with a value that is intended to convey a different logic state than may typically be associated with the value. For example, a cell that has stored a charge associated with one logic state for a time period may be re-written to store a different charge, and the re-written cell may still be read to have the originally stored logic state. An indicator may be stored in a latch to indicate whether the logic state currently stored by the cell is the intended logic state of the cell. A cell may, for example, be re-written with an opposite value periodically, based on the occurrence of an event, or based on a determination that the cell has stored one value (or charge) for a certain time period.
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