Anti-Human Soluble Fibrin Monoclonal Antibody and Immunilogical Assay Method Using the Antibody
    51.
    发明申请
    Anti-Human Soluble Fibrin Monoclonal Antibody and Immunilogical Assay Method Using the Antibody 有权
    抗人溶纤维蛋白单克隆抗体和使用抗体的免疫测定方法

    公开(公告)号:US20080009077A1

    公开(公告)日:2008-01-10

    申请号:US11722998

    申请日:2005-12-27

    IPC分类号: G01N33/566 C07K16/36 C12N5/12

    摘要: The present invention is directed to a monoclonal antibody against a soluble fibrin, which specifically recognizes a conformation-changed site newly occurred in a C-terminal region of an Aα-chain of the soluble fibrin formed through thrombin digestion of fibrinogen. The present invention is also directed to a hybridoma which produces the antibody, an immunological assay method employing the antibody, and a method for evaluating hypercoagulability in a test sample by measuring the soluble fibrin level in the sample with the assay method. Through employment of the monoclonal antibody of the present invention, soluble fibrin on which plasmin has not acted, which reflects exclusively initial hypercoagulability, can be specifically detected.

    摘要翻译: 本发明涉及针对可溶性纤维蛋白的单克隆抗体,其特异性识别通过纤维蛋白原的凝血酶消化形成的可溶性纤维蛋白的Aalpha链的C末端区域中新发生的构象改变部位。 本发明还涉及产生抗体的杂交瘤,使用抗体的免疫测定方法,以及通过使用测定方法测量样品中的可溶性纤维蛋白水平来评估测试样品中的高凝状态的方法。 通过使用本发明的单克隆抗体,可以特异性检测仅反映初始高凝状态的纤维蛋白溶酶未起作用的可溶性纤维蛋白。

    Optical element assembly and method of making the same
    52.
    发明授权
    Optical element assembly and method of making the same 失效
    光学元件组装及其制造方法

    公开(公告)号:US07110630B2

    公开(公告)日:2006-09-19

    申请号:US10806579

    申请日:2004-03-22

    申请人: Akiko Suzuki

    发明人: Akiko Suzuki

    IPC分类号: G02B6/12 G02B6/26

    摘要: A V-groove is formed in a platform of single crystal silicon by anisotropic wet etching based on its crystal orientation, and a convexity of an optical element chip is fitted in an intermediate portion of the V-groove. Quadrangular frustoidal convexities are formed in rows and columns on a single crystal silicon wafer by anisotropic wet etching, then a photonic crystal filter element is formed as an optical element on the protruding end face of each convexity, and the wafer is cut for each optical element into individual optical element chips. When optical fibers are disposed in the V-groove at both sides of the chip, cores of the optical fibers and light inlet and outlet ports of the optical element are aligned with each other.

    摘要翻译: 通过基于其晶体取向的各向异性湿蚀刻在单晶硅的平台中形成V形槽,并且将光学元件芯片的凸起装配在V形槽的中间部分中。 通过各向异性湿蚀刻在单晶硅晶片上以行和列形成四边形的截头状凸起,然后在每个凸起的突出端面上形成光子晶体滤光元件作为光学元件,并且对于每个光学元件切割晶片 成为单独的光学元件芯片。 当光纤布置在芯片两侧的V形槽中时,光纤的芯和光学元件的光入口和出口彼此对准。

    Optical sensor and method of manufacturing the same
    53.
    发明申请
    Optical sensor and method of manufacturing the same 有权
    光学传感器及其制造方法

    公开(公告)号:US20050145964A1

    公开(公告)日:2005-07-07

    申请号:US10959641

    申请日:2004-10-05

    IPC分类号: G02B1/02 G02B3/00 H01L31/0232

    CPC分类号: H01L31/02327

    摘要: A cubic element of photonic crystal is integrally formed on the surface of a photo-detection element, and a portion of the photonic crystal cubic element is irradiated with ultraviolet rays thereby to change the refractive index of the portion of the cubic element that has been irradiated with ultraviolet rays. Alternatively, by causing globular particles having different refractive indices to eject on the surface of the photo-detection element from an ink-jet apparatus having a nozzle provided with a temperature control part by controlling temperature of the nozzle to form a laminate of globular particle layers having different refractive indices, a photonic crystal lens is integrally formed on the surface of the photo-detection element.

    摘要翻译: 在光检测元件的表面上一体地形成光子晶体的立方体元件,并且用紫外线照射一部分光子晶体立方体元件,从而改变被照射的立方体元件的部分的折射率 用紫外线。 或者,通过使具有不同折射率的球状颗粒从具有设置有温度控制部件的喷嘴的喷墨装置喷射到光检测元件的表面上,通过控制喷嘴的温度来形成球状颗粒层 具有不同的折射率,光子晶体透镜一体地形成在光检测元件的表面上。

    Method of processing solid surface with gas cluster ion beam
    59.
    发明授权
    Method of processing solid surface with gas cluster ion beam 有权
    用气体簇离子束处理固体表面的方法

    公开(公告)号:US08268183B2

    公开(公告)日:2012-09-18

    申请号:US12312266

    申请日:2007-10-30

    IPC分类号: B44C1/22 C23F1/00 G21G5/00

    摘要: A solid surface is processed while corner portions of a relief structure are protected from deformation. A method of processing a solid surface with a gas cluster ion beam includes a cluster protection layer formation step of forming, on the solid surface, a relief structure having protrusions with a cluster protection layer formed to cover an upper part thereof and recesses without the cluster protection layer; an irradiation step of emitting a gas cluster ion beam onto the solid surface having the relief structure formed in the cluster protection layer formation step; and a removal step of removing the cluster protection layer. A thickness T of the cluster protection layer satisfies T > nY + ( b 2 ⁢ Y 2 ⁢ n - nY 2 ⁡ ( b 4 - 16 ⁢ a 2 ) 1 2 2 ) 1 2 , where n is a dose of the gas cluster ion beam, and Y is an etching efficiency of the cluster protection layer, expressed as an etching volume per cluster (a and b are constants).

    摘要翻译: 处理浮雕结构的角部以防止变形的实心表面。 用气体簇离子束处理固体表面的方法包括:簇保护层形成步骤,在固体表面上形成具有突起的浮雕结构,所述突起具有形成为覆盖其上部的簇保护层和没有簇的凹部 保护层; 在所述簇保护层形成工序中形成有具有所述浮雕结构的固体表面上的气体簇离子束的照射工序; 以及去除簇保护层的去除步骤。 簇保护层的厚度T满足T> nY +(b 2 Y 2 n-nY 2⁡(b 4 - 16 a 2)1 2 2)1 2,其中n是气体簇的剂量 离子束,Y是簇保护层的蚀刻效率,表示为每簇的蚀刻体积(a和b是常数)。

    Method and apparatus for flattening solid surface
    60.
    发明授权
    Method and apparatus for flattening solid surface 有权
    固体表面平整的方法和装置

    公开(公告)号:US08178857B2

    公开(公告)日:2012-05-15

    申请号:US11920362

    申请日:2006-05-18

    IPC分类号: G21G5/00

    摘要: A method for flattening a sample surface by irradiating the sample surface with a gas cluster ion beam, generates clusters of source gas in a cluster generating chamber, ionizes the generated clusters in an ionization chamber, accelerates the ionized cluster beam in an electric field of an accelerating electrode, selects a cluster size using a magnetic field of a sorting mechanism, and irradiates the surface of a sample. An irradiation angle between the sample surface and the gas cluster ion beam is less than 30° and an average cluster size of the gas cluster ion beam is 50 or above.

    摘要翻译: 通过用气体簇离子束照射样品表面来平坦化样品表面的方法,在簇生成室中产生源气体簇,将电离室中产生的簇电离,在离子化的电场中加速离子化的簇束 加速电极,使用分选机构的磁场选择簇尺寸,并照射样品的表面。 样品表面和气体团簇离子束之间的照射角度小于30°,气体团簇离子束的平均簇尺寸为50以上。