公开(公告)号：US11714053B2

公开(公告)日：2023-08-01

申请号：US17696256

申请日：2022-03-16

Applicant: Troxler Electronic Laboratories, Inc.

Inventor： Wewage Hiran Linus Dep ,  Robert Ernest Troxler

IPC: G01N23/06 ,  G01B15/02 ,  B65G43/08 ,  G01N33/38 ,  G01N23/12 ,  G01N23/09 ,  G01N23/083 ,  B65G15/08

CPC classification number: G01N23/06 ,  B65G15/08 ,  B65G43/08 ,  G01B15/02 ,  G01B15/025 ,  G01N23/083 ,  G01N23/09 ,  G01N23/12 ,  G01N33/383 ,  B65G2201/045 ,  B65G2203/0208 ,  B65G2203/04 ,  G01N2223/04 ,  G01N2223/205 ,  G01N2223/505 ,  G01N2223/613 ,  G01N2223/633 ,  G01N2223/643

Abstract: A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

公开(公告)号：US11698350B2

公开(公告)日：2023-07-11

申请号：US17829453

申请日：2022-06-01

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Mototsugu Sugiyama ,  Tatsuya Onishi

IPC: G01N23/083 ,  G01N23/04 ,  G01N23/18

CPC classification number: G01N23/083 ,  G01N23/04 ,  G01N23/18 ,  G01N2223/505

Abstract: An image acquisition system includes a radiation source configured to output radiation toward an object, a rotating stage configured to rotate the object around a rotation axis, a radiation camera having an input surface to which the radiation transmitted through the object is input and an image sensor capable of TDI control, and an image processing apparatus configured to generate a radiographic image of the object at an imaging plane P based on the image data. The angle formed between the rotation axis of the rotating stage and the input surface of the radiation camera is set in accordance with the FOD which is the distance between the radiation source and an imaging plane in the object. The radiation camera is configured to perform TDI control in the image sensor in synchronization with the rotational speed of the object rotated by the rotating stage.

公开(公告)号：US11688067B2

公开(公告)日：2023-06-27

申请号：US16924581

申请日：2020-07-09

Applicant: Bruker Nano, Inc.

Inventor： David Lewis Adler ,  Scott Joseph Jewler ,  Freddie Erich Babian

IPC: G06K9/00 ,  G06T7/00 ,  G06N20/00 ,  G06F30/398 ,  G01N23/04 ,  G01N23/083 ,  G01N23/18 ,  G01T1/20 ,  G06T5/00 ,  H01L21/67 ,  H05K1/11 ,  H05K3/40 ,  G06F18/24 ,  G06F18/214 ,  G06F119/18 ,  G06F115/12

CPC classification number: G06T7/0014 ,  G01N23/04 ,  G01N23/043 ,  G01N23/083 ,  G01N23/18 ,  G01T1/20 ,  G06F18/214 ,  G06F18/24 ,  G06F30/398 ,  G06N20/00 ,  G06T5/007 ,  G06T7/0012 ,  H01L21/67288 ,  H05K1/115 ,  H05K3/4038 ,  G01N2223/04 ,  G01N2223/401 ,  G01N2223/426 ,  G01N2223/505 ,  G01N2223/6466 ,  G06F2115/12 ,  G06F2119/18 ,  G06T2207/10081 ,  G06T2207/10116 ,  G06T2207/20024 ,  G06T2207/20081 ,  G06T2207/20208 ,  G06T2207/30004

Abstract: In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.

公开(公告)号：US11651492B2

公开(公告)日：2023-05-16

申请号：US16924747

申请日：2020-07-09

Applicant: Bruker Nano, Inc.

Inventor： David Lewis Adler ,  Scott Joseph Jewler ,  Freddie Erich Babian ,  Andrew George Reid ,  Benjamin Thomas Adler

IPC: G01N23/04 ,  G01T1/20 ,  G06T7/00 ,  G06N20/00 ,  G06F30/398 ,  G01N23/083 ,  G01N23/18 ,  G06K9/62 ,  G06T5/00 ,  H01L21/67 ,  H05K1/11 ,  H05K3/40 ,  G06F119/18 ,  G06F115/12

CPC classification number: G06T7/0014 ,  G01N23/04 ,  G01N23/043 ,  G01N23/083 ,  G01N23/18 ,  G01T1/20 ,  G06F30/398 ,  G06K9/6256 ,  G06K9/6267 ,  G06N20/00 ,  G06T5/007 ,  G06T7/0012 ,  H01L21/67288 ,  H05K1/115 ,  H05K3/4038 ,  G01N2223/04 ,  G01N2223/401 ,  G01N2223/426 ,  G01N2223/505 ,  G01N2223/6466 ,  G06F2115/12 ,  G06F2119/18 ,  G06T2207/10081 ,  G06T2207/10116 ,  G06T2207/20024 ,  G06T2207/20081 ,  G06T2207/20208 ,  G06T2207/30004

Abstract: In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.

公开(公告)号：US09874653B2

公开(公告)日：2018-01-23

申请号：US15679784

申请日：2017-08-17

Applicant: Halliburton Energy Services, Inc.

Inventor： Imran Sharif Vehra

IPC: G01V5/08 ,  E21B47/12 ,  E21B49/00 ,  G01T1/202 ,  G01N23/203

CPC classification number: G01V5/08 ,  E21B47/12 ,  E21B47/124 ,  E21B49/00 ,  G01N23/203 ,  G01N2223/304 ,  G01N2223/505 ,  G01T1/20 ,  G01T1/2026 ,  G01T1/208

Abstract: A radiation logging tool is provided that includes a scintillator detector for use on a wellbore tool string to characterize earth formations. The scintillator detector has a shutter to allow for the collection of data differentiating between incident radiation, such as backscatter signal, and system noise, such as dark current, vibration noise, electronics thermal noise, and electrostatic noise. The radiation logging tool provides for a method of calibrating and measuring incident radiation by the removal of system noise. The shutter is positioned between the photosensor and scintillation member of the scintillator detector, and is able to switch between open and closed states while the scintillation detector is deployed. Measurements of signal noise can be used to calibrate the sampling signal of incident radiation on the scintillator detector.

公开(公告)号：US20170350831A1

公开(公告)日：2017-12-07

申请号：US15525578

申请日：2015-10-05

Applicant: ISHIDA CO., LTD.

Inventor： Kazuhiro SUHARA

IPC: G01N23/04 ,  G01N23/223 ,  G01N23/083 ,  G01N23/16

CPC classification number: G01N23/043 ,  G01N23/04 ,  G01N23/083 ,  G01N23/087 ,  G01N23/16 ,  G01N23/18 ,  G01N23/223 ,  G01N2223/04 ,  G01N2223/076 ,  G01N2223/406 ,  G01N2223/505 ,  G01N2223/643 ,  G01T1/20

Abstract: An X-ray inspecting apparatus, with which X-rays of a broad energy band can be detected while manufacturing costs are suppressed, comprises an X-ray radiation device, a line sensor assembly, and other components. The line sensor assembly has a plurality of detection units and other components. Each detection unit has a scintillator, a detection main body including a plurality of elements disposed thereon, and a ceramic substrate supporting the scintillator and detection main body. In the line sensor assembly, the plurality of detection units etc. are aligned in a forward-backward direction so that the scintillators and the detection main bodies of the detection units etc. are aligned without gaps with the scintillators and detection main bodies of adjacent detection units.

公开(公告)号：US09835733B2

公开(公告)日：2017-12-05

申请号：US14700178

申请日：2015-04-30

Applicant: Zhengrong Ying

Inventor： Zhengrong Ying

IPC: G01T1/20

CPC classification number: G01T1/2018 ,  G01N2223/419 ,  G01N2223/505 ,  G01T1/2002

Abstract: An apparatus for detecting X-rays and converting the detected X-ray intensities into digital signals is disclosed. The apparatus places Analog to Digital Conversion (ADC) chips directly under a scintillator array along the X-ray beam direction and uses a shield that is placed between a photodiode substrate and an Analog to Digital Conversion (ADC) chip to block X-rays from directly reaching the dies of the ADC chips, which are sensitive to X-rays. Also an X-ray CT system utilizing the disclosed apparatus for detecting X-rays is provided.

公开(公告)号：US20170307765A1

公开(公告)日：2017-10-26

申请号：US15137763

申请日：2016-04-25

Applicant: Morpho Detection, LLC

Inventor： Brian Lee Bures ,  Samit Kumar Basu

IPC: G01T1/20 ,  G01N23/04

CPC classification number: G01T1/2018 ,  G01N23/046 ,  G01N2223/505 ,  G01T1/2002

Abstract: A detector assembly for a CT imaging system is provided. The detector assembly including a scintillator block including a plurality of pixels, each pixel configured to receive x-ray beams travelling in a transmission direction, a plurality of photodiodes, and a light guide coupled between the scintillator block and the plurality of photodiodes, the light guide including a plurality of light pipes, each light pipe configured to guide light emitted from a pixel of the plurality of pixels into an associated photodiode of the plurality of photodiodes, wherein each pixel has a first cross-sectional area that is substantially perpendicular to the transmission direction, wherein each photodiode has a second cross-sectional area that is substantially perpendicular to the transmission direction, and wherein the first cross-sectional area is different from the second cross-sectional area.

公开(公告)号：US20170285188A1

公开(公告)日：2017-10-05

申请号：US15087560

申请日：2016-03-31

Applicant: General Electric Company

Inventor： Xue Rui ,  Geng Fu ,  Jianjun Guo ,  Bruno Kristiaan Bernard De Man ,  Brian David Yanoff

IPC: G01T1/24 ,  G01N23/04 ,  G01T1/20

CPC classification number: G01N23/046 ,  G01N23/083 ,  G01N2223/505 ,  G01T1/17 ,  G01T1/2985

Abstract: The present approach relates to a detector design that allows detector-based wobble using an electronic control scheme. In one implementation, each detector pixel is divided into sub-pixels. The readout of the sub-pixels can be binned with minimal noise penalty to enable the detector wobble without physically shifting the detector or alternating the physical focal spot location, though, as discussed herein alternation of the focal spot location may be used in conjunction with the present approach to further improve radial and longitudinal imaging resolution as well as suppressing artifacts resulted by limited spatial sampling.

公开(公告)号：US09389191B2

公开(公告)日：2016-07-12

申请号：US13656918

申请日：2012-10-22

Applicant: Troxler Electronic Laboratories, Inc.

Inventor： Wewage Hiran Linus Dep ,  Robert Ernest Troxler

IPC: G21K1/02 ,  G01N23/09 ,  G01N33/38 ,  G01N23/083

CPC classification number: G01N23/08 ,  B65G15/08 ,  B65G43/08 ,  B65G2201/045 ,  B65G2203/0208 ,  B65G2203/04 ,  G01B15/025 ,  G01N23/06 ,  G01N23/083 ,  G01N23/09 ,  G01N33/383 ,  G01N2223/04 ,  G01N2223/205 ,  G01N2223/505 ,  G01N2223/613 ,  G01N2223/633 ,  G01N2223/643

Abstract: A system is provided. The system includes a conveyor apparatus configured for conveying a material and a water content measurement system positioned about the conveyor apparatus for determining water content in the material. A dimension characteristic measurement system for detecting one or more dimension characteristics of the material is provided and a computer device is configured to manipulate data received from the water content measurement system and the dimension characteristic measurement system to determine a water content of the material.

Abstract translation: 提供了一个系统。 该系统包括构造成输送物料的输送装置和围绕输送装置定位的含水量测量系统，用于确定材料中的含水量。 提供了一种用于检测材料的一个或多个维度特征的维度特征测量系统，并且计算机设备被配置为操纵从含水量测量系统和尺寸特征测量系统接收的数据，以确定材料的含水量。