Mass spectrometry
    51.
    发明申请

    公开(公告)号:US20050077897A1

    公开(公告)日:2005-04-14

    申请号:US10503516

    申请日:2003-01-27

    Applicant: Richard Syms

    Inventor: Richard Syms

    CPC classification number: H01J49/147 H01J49/0018 H01J49/08 H01J49/4215

    Abstract: A method of fabricating miniature quadrupole electrostatic mass filter has been previously described. The electrodes are metallised cylinders, mounted in grooves etched in oxidised silicon substrates, which are held apart at the correct spacing by cylindrical spacer rods. This invention concerns an ion source mounted on extensions of the spacer rods, which project beyond the mass filter. The ion source consists of a cold-cathode electron emitter, which emits electrons with energies sufficient to cause impact ionisation, and electrostatic optics suitable for coupling the ion flux into the mass filter. Methods of constructing a single self-aligned electron source and a similar dual source are described. Arrangements for mounting the electron source and the ion coupling lens so that the electron and ion beams travel at right angles to one another for efficient separation are described. A method of fabricating a self-aligned one-dimensional einzel electrostatic lens from metallised cylinders mounted in the silicon substrates using etched grooves is described. A method of fabricating a-self-aligned two-dimensional einzel lens from metal plates is also described.

    Mass spectrometer with electron source for reducing space charge effects in sample beam
    52.
    发明授权
    Mass spectrometer with electron source for reducing space charge effects in sample beam 失效
    具有电子源的质谱仪,用于减少样品束中的空间电荷效应

    公开(公告)号:US06633114B1

    公开(公告)日:2003-10-14

    申请号:US09758391

    申请日:2001-01-12

    CPC classification number: H01J49/08 H01J49/4265

    Abstract: A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.

    Abstract translation: 质谱仪包括产生包括正离子的光束的离子源,采样界面,其从离子源提取光束的一部分,以形成沿着路径行进且在至少部分上具有过量正离子的样品束 的路径,从而由于样品束中的正离子过量而导致在样品束中产生空间电荷效应,该电子源将电子添加到样品束以减少样品束中的正离子之间的空间电荷排斥 ,从而减少样品光束中的空间电荷效应并产生具有降低的空间电荷效应的样品束;以及质量分析器,其分析具有减小的空间电荷效应的样品光束。

    ION SOURCE FOR TIME-OF-FLIGHT MASS SPECTROMETERS FOR ANALYZING GAS SAMPLES
    53.
    发明申请
    ION SOURCE FOR TIME-OF-FLIGHT MASS SPECTROMETERS FOR ANALYZING GAS SAMPLES 失效
    用于分析气体样品的飞行时间质谱仪的离子源

    公开(公告)号:US20030057378A1

    公开(公告)日:2003-03-27

    申请号:US09550171

    申请日:2000-04-14

    CPC classification number: H01J27/04 H01J43/246 H01J49/08 H01J49/147

    Abstract: In accordance with the invention, the ion source of a time-of-flight mass spectrometer includes an electron gun having an electron source and at least one electrode for conditioning the flow of electrons, followed by at least one microchannel wafer for generating a pulsed secondary electron beam containing a greater number of electrons from a pulsed primary electron beam. The secondary electron beam enters a gas ionization area of an ion gun which produces a flow of ions which is then passed through the flight tube in order to be analyzed by an ion detector. This provides a high-performance ion source which is compact, sensitive and easy to integrate.

    Abstract translation: 根据本发明,飞行时间质谱仪的离子源包括具有电子源的电子枪和用于调节电子流的至少一个电极,随后是用于产生脉冲次级的至少一个微通道晶片 电子束包含来自脉冲一次电子束的更多数量的电子。 二次电子束进入离子枪的气体离子化区域,其产生离子流,然后将其流过飞行管,以便通过离子检测器进行分析。 这提供了一种高性能的离子源,它是紧凑,灵敏和容易集成的。

    Method and apparatus for analyzing a gas sample
    54.
    发明授权
    Method and apparatus for analyzing a gas sample 失效
    用于分析气体样品的方法和装置

    公开(公告)号:US5412207A

    公开(公告)日:1995-05-02

    申请号:US133592

    申请日:1993-10-07

    CPC classification number: H01J49/0422 H01J49/08 H01J49/147 H01J49/4215

    Abstract: A method and gas analysis system for a mass spectrometer including an ion pump for creating an internal vacuum within said mass spectrometer, an ionization chamber, an inlet passage through which a gas sample is introduced into the ionization chamber, valve means associated with the inlet passage for controlling the volume of gas sample introduced into the ionization chamber, a filament for introducing electrons into the ionization chamber whereby the electrons bombard the gas sample thus forming ions, an extractor plate positioned adjacent the ionization chamber and biased such that a proportion of ions and electrons are allowed to pass through the extractor plate, a quadrupole filter into which the ions and electrons are directed by the extractor plate, the quadrupole filter operative to permit a stream of ions with a pre-selected mass-to-charge ratio to pass through the filter and ions other than those having the pre-selected mass-to-charge ratio being separated from the stream of ions, means for directing electrons toward ions other than those having the pre-selected mass-to-charge ratio in the area of said quadrupole filter so that the electrons combine with the ions, a sensor for detecting the stream of ions passing through the quadrupole filter, and analyzing means connected with the sensor for analyzing the components of the gas sample.

    Abstract translation: 一种用于质谱仪的方法和气体分析系统,包括用于在所述质谱仪内产生内部真空的离子泵,离子化室,将气体样本引入电离室的入口通道,与入口通道相关的阀装置 用于控制引入电离室的气体样品的体积,用于将电子引入离子化室的细丝,由此电子轰击气体样品从而形成离子;提取器板,其位于电离室附近并被偏置,使得一部分离子和 允许电子通过提取器板,由提取器板引导离子和电子的四极过滤器,用于允许具有预先选定的质荷比的离子流通过的四极过滤器 除了具有预选的质荷比的那些之外的过滤器和离子与i的流分离 用于将电子引向除了在所述四极滤波器的区域中具有预选质量 - 电荷比的那些之外的离子的电子,使得电子与离子结合,用于检测通过四极杆的离子流的传感器 过滤器和分析装置,与传感器连接,用于分析气体样品的组分。

    APPARATUS AND METHOD
    56.
    发明公开

    公开(公告)号:US20240014022A1

    公开(公告)日:2024-01-11

    申请号:US18255837

    申请日:2021-12-03

    Applicant: ISOTOPX LTD

    CPC classification number: H01J49/022 H01J49/0422 H01J49/28 H01J49/08

    Abstract: An ion source (30) for a static gas mass spectrometer is described. The ion source (30) comprises: a source block (310) defining a volume V to receive a sample gas G; an electron source (320) in fluid communication with the source block (310) and configured to provide a flux of electrons E therein for ionising the sample gas G; a set of electrodes (330), including a first electrode (330A), disposed between the electron source (320) and the source block (310); and a controller (not shown) configured to control a voltage applied to the first electrode (330A) to attenuate the flux of the electrons E into the source block (310) during a first time period following receiving of the sample gas G in the source block (310) and to permit the flux of the electrons E into the source block (310) during a second time period following the first time period.

    Ionization sources and methods and systems using them

    公开(公告)号:US11670496B2

    公开(公告)日:2023-06-06

    申请号:US17233610

    申请日:2021-04-19

    Inventor: Adam Patkin

    CPC classification number: H01J49/08 H01J49/0027

    Abstract: Certain configurations of an ionization source comprising a multipolar rod assembly are described. In some examples, the multipolar rod assembly can be configured to provide a magnetic field and a radio frequency field into an ion volume formed by a substantially parallel arrangement of rods of the multipolar rod assembly. The ionization source may also comprise an electron source configured to provide electrons into the ion volume of the multipolar rod assembly to ionize analyte introduced into the ion volume. Systems and methods using the ionization source are also described.

    Fourier Transform Mass Spectrometer
    58.
    发明申请

    公开(公告)号:US20180114685A1

    公开(公告)日:2018-04-26

    申请号:US15567474

    申请日:2016-04-19

    CPC classification number: H01J49/38 H01J49/08 H01J49/4205

    Abstract: A quadrupole is filled with ions and the ions are cooled by applying a pressure and gas flow within the quadrupole. Ions are trapped in the quadrupole by applying a DC voltage and an RF voltage to quadrupole rods of the quadrupole, one or more DC voltages to a plurality of auxiliary electrodes of the quadrupole, and a DC voltage and an RF voltage to an exit lens at the end of the quadrupole. The ions are coherently oscillated after the filling and cooling by applying a coherent excitation between at least two rods of the quadrupole rods. The coherently oscillating ions are axially ejected through the exit lens and to a destructive detector for detection by changing one or more voltages of the one or more DC voltages of the plurality of auxiliary electrodes and changing the DC voltage of the exit lens.

    TIME-OF-FLIGHT MASS SPECTROMETER
    59.
    发明申请

    公开(公告)号:US20170294298A1

    公开(公告)日:2017-10-12

    申请号:US15321563

    申请日:2015-12-04

    Abstract: Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

    MASS SPECTROMETER AND METHOD FOR CONTROLLING INJECTION OF ELECTRON BEAM THEREOF

    公开(公告)号:US20170200598A1

    公开(公告)日:2017-07-13

    申请号:US15320953

    申请日:2015-12-09

    CPC classification number: H01J49/08 H01J49/147 H01J49/422 H01J49/424

    Abstract: The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.

Patent Agency Ranking