Method of manufacturing a nanowire transistor, a nanowire transistor structure, a nanowire transistor field
    61.
    发明申请
    Method of manufacturing a nanowire transistor, a nanowire transistor structure, a nanowire transistor field 审中-公开
    制造纳米线晶体管的方法,纳米线晶体管结构,纳米线晶体管领域

    公开(公告)号:US20080237684A1

    公开(公告)日:2008-10-02

    申请号:US11728587

    申请日:2007-03-26

    IPC分类号: H01L29/788 H01L21/336

    摘要: A method of manufacturing a nanowire transistor includes oxidizing at least a portion of a semiconductor carrier. The semiconductor carrier includes a first carrier portion and a second carrier portion above the first carrier portion. A portion of the oxidized portion is removed, thereby forming an oxide spacer between a portion of the second carrier portion and the first carrier portion. A gate region is formed above at least a portion of the second carrier portion, and a first source/drain region and a second source/drain region are formed.

    摘要翻译: 纳米线晶体管的制造方法包括氧化至少一部分半导体载体。 半导体载体包括在第一载体部分上方的第一载体部分和第二载体部分。 去除氧化部分的一部分,从而在第二载体部分的一部分和第一载体部分之间形成氧化物间隔物。 在第二载体部分的至少一部分上方形成栅极区域,形成第一源极/漏极区域和第二源极/漏极区域。

    High-density NROM-FINFET
    65.
    发明授权
    High-density NROM-FINFET 失效
    高密度NROM-FINFET

    公开(公告)号:US07208794B2

    公开(公告)日:2007-04-24

    申请号:US11073017

    申请日:2005-03-04

    摘要: Semiconductor memory having memory cells, each including first and second conductively-doped contact regions and a channel region arranged between the latter, formed in a web-like rib made of semiconductor material and arranged one behind the other in this sequence in the longitudinal direction of the rib. The rib has an essentially rectangular shape with an upper side of the rib and rib side faces lying opposite. A memory layer is configured for programming the memory cell, arranged on the upper side of the rib spaced apart by a first insulator layer, and projects in the normal direction of the one rib side face over one of the rib side faces so that the one rib side face and the upper side of the rib form an edge for injecting charge carriers from the channel region into the memory layer. A gate electrode is spaced apart from the one rib side face by a second insulator layer and from the memory layer by a third insulator layer, electrically insulated from the channel region, and configured to control its electrical conductivity.

    摘要翻译: 具有存储单元的半导体存储器,每个存储单元包括第一和第二导电掺杂的接触区域和布置在其间的沟道区域,所述沟道区域形成在由半导体材料制成的网状肋状物中, 肋骨 肋具有基本上矩形的形状,肋的上侧和肋侧面相对。 存储层被配置为对存储单元进行编程,布置在由第一绝缘体层间隔开的肋的上侧,并且沿着一个肋侧面的一个肋侧面的法线方向突出,使得一个 肋侧面和肋的上侧形成用于将电荷载流子从沟道区域注入到存储层中的边缘。 栅电极通过第二绝缘体层与一个肋侧面间隔开,并且通过与沟道区电绝缘并且被配置为控制其导电性的第三绝缘体层与存储层隔开。

    Integrated Circuits and Methods of Manufacturing Thereof
    66.
    发明申请
    Integrated Circuits and Methods of Manufacturing Thereof 有权
    集成电路及其制造方法

    公开(公告)号:US20080259687A1

    公开(公告)日:2008-10-23

    申请号:US11737617

    申请日:2007-04-19

    IPC分类号: G11C5/00 H01R43/00

    摘要: Embodiments of the invention relate to integrated circuits having a memory cell arrangement and methods of manufacturing thereof. In one embodiment of the invention, an integrated circuit has a memory cell arrangement which includes a fin structure extending in its longitudinal direction as a first direction, including a first insulating layer, a first active region disposed above the first insulating layer, a second insulating layer disposed above the first active region, a second active region disposed above the second insulating layer, a charge storage layer structure disposed at least next to at least one sidewall of the fin structure covering at least a portion of the first active region and at least a portion of the second active region, and a control gate disposed next to the charge storage layer structure.

    摘要翻译: 本发明的实施例涉及具有存储单元布置的集成电路及其制造方法。 在本发明的一个实施例中,集成电路具有存储单元布置,其包括沿其纵向方向延伸的翅片结构作为第一方向,包括第一绝缘层,设置在第一绝缘层上方的第一有源区,第二绝缘层 设置在所述第一有源区上方的第二有源区,设置在所述第二绝缘层上方的第二有源区,电荷存储层结构,其至少布置在所述鳍结构的至少一个侧壁上,覆盖所述第一有源区的至少一部分,并且至少 第二有源区的一部分,以及设置在电荷存储层结构旁边的控制栅。

    Integrated circuits and methods of manufacture
    67.
    发明申请
    Integrated circuits and methods of manufacture 审中-公开
    集成电路和制造方法

    公开(公告)号:US20080251833A1

    公开(公告)日:2008-10-16

    申请号:US11786751

    申请日:2007-04-12

    IPC分类号: H01L29/788 H01L21/336

    摘要: In various embodiments of the invention, integrated circuits and methods of manufacturing integrated circuits are provided. In an embodiment of the invention, an integrated circuit having at least one memory cell is provided. The memory cell includes a dielectric layer disposed above a charge storage region, a word line disposed above the dielectric layer, and a control line disposed at least partially above at least one sidewall of the dielectric layer.

    摘要翻译: 在本发明的各种实施例中,提供集成电路和制造集成电路的方法。 在本发明的实施例中,提供了具有至少一个存储单元的集成电路。 存储单元包括设置在电荷存储区域上方的电介质层,设置在电介质层上方的字线​​以及至少部分地设置在电介质层的至少一个侧壁上方的控制线。

    NROM semiconductor memory device and fabrication method
    68.
    发明授权
    NROM semiconductor memory device and fabrication method 失效
    NROM半导体存储器件及其制造方法

    公开(公告)号:US07344923B2

    公开(公告)日:2008-03-18

    申请号:US11282904

    申请日:2005-11-18

    IPC分类号: H01L21/82

    摘要: An NROM semiconductor memory device and fabrication method are disclosed. According to one aspect, a method for fabricating an NROM semiconductor memory device can include providing a plurality of u-shaped MOSFETs, which are spaced apart from one another and have a multilayer dielectric. The dielectric suitable for charge trapping along rows in a first direction and alone columns in a second direction in trenches of a semiconductor substrate. Source/drain regions are provided between the u-shaped MOSFETs in interspaces between the rows which run parallel to the columns. Isolation trenches are provided in the source/drain regions between the u-shaped MOSFETs of adjacent columns as far as a particular depth in the semiconductor substrate. The isolation trenches are filled with an insulation material. Word lines are provided for connecting respective rows of u-shaped MOSFETs.

    摘要翻译: 公开了一种NROM半导体存储器件及其制造方法。 根据一个方面,一种用于制造NROM半导体存储器件的方法可以包括提供多个彼此间隔开并具有多层电介质的u形MOSFET。 适合于在半导体衬底的沟槽中沿着第一方向沿着行电荷捕获并在第二方向上单独的列的电介质。 源极/漏极区域设置在平行于列的行之间的间隔中的u形MOSFET之间。 在相邻列的u形MOSFET之间的源极/漏极区域中提供了直到半导体衬底中的特定深度的隔离沟槽。 隔离槽填充绝缘材料。 字线用于连接各行的u形MOSFET。

    Semiconductor memory, the fabrication thereof and a method for operating the semiconductor memory
    69.
    发明申请
    Semiconductor memory, the fabrication thereof and a method for operating the semiconductor memory 失效
    半导体存储器,其制造和半导体存储器的操作方法

    公开(公告)号:US20070023808A1

    公开(公告)日:2007-02-01

    申请号:US11193026

    申请日:2005-07-29

    IPC分类号: H01L21/336 H01L29/94

    摘要: A semiconductor memory having a multitude of memory cells (21-1), the semiconductor memory having a substrate (1), at least one wordline (5-1), a first (15-1) and a second line (15-2; 16-1), wherein each of the multitude of memory cells (21-1) comprises a first doping region (6) disposed in the substrate (1), a second doping region (7) disposed in the substrate (1), a channel region (22) disposed in the substrate (1) between the first doping region (6) and the second doping region (7), a charge-trapping layer stack (2) disposed on the substrate (1), on the channel region (22), on a portion of the first doping region (6) and on a portion of the second doping region (7). Each memory cell (21-1) further comprises a conductive layer (3) disposed on the charge-trapping layer stack (2), wherein the conductive layer (3) is electrically floating. A dielectric layer (4) is disposed on a top surface of the conductive layer (3) and on sidewalls (23) of the conductive layer (3). The first line (15-1) extends along a first direction and is coupled to the first doping region (6), and the second line (15-2; 16-1) extends along the first direction and is coupled to the second doping region (7). The at least one wordline (5-1) extends along a second direction and is disposed on the dielectric layer (4).

    摘要翻译: 一种具有多个存储单元(21-1)的半导体存储器,所述半导体存储器具有衬底(1),至少一个字线(5-1),第一(15-1)和第二线(15-2) ; 16-1),其中多个存储单元(21-1)中的每一个包括设置在所述衬底(1)中的第一掺杂区域(6),设置在所述衬底(1)中的第二掺杂区域(7) 设置在第一掺杂区域(6)和第二掺杂区域(7)之间的衬底(1)中的沟道区域(22),设置在衬底(1)上的电荷捕获层堆叠(2) 在第一掺杂区域(6)的一部分上和第二掺杂区域(7)的一部分上的区域(22)。 每个存储单元(21-1)还包括设置在电荷捕获层堆叠(2)上的导电层(3),其中导电层(3)是电浮置的。 介电层(4)设置在导电层(3)的顶表面和导电层(3)的侧壁(23)上。 第一线(15-1)沿着第一方向延伸并且耦合到第一掺杂区域(6),并且第二线路(15-2; 16-1)沿着第一方向延伸并且耦合到第二掺杂 地区(7)。 所述至少一个字线(5-1)沿着第二方向延伸并且设置在所述电介质层(4)上。

    Non-volatile memory cells and methods for fabricating non-volatile memory cells
    70.
    发明申请
    Non-volatile memory cells and methods for fabricating non-volatile memory cells 有权
    非易失性存储单元和用于制造非易失性存储单元的方法

    公开(公告)号:US20070018201A1

    公开(公告)日:2007-01-25

    申请号:US11187693

    申请日:2005-07-22

    IPC分类号: H01L27/10

    摘要: The invention relates to a method for fabricating stacked non-volatile memory cells. Further, the invention relates to stacked non-volatile memory cells. The invention particularly relates to the field of non-volatile NAND memories having non-volatile stacked memory cells. The stacked non-volatile memory cells are formed on a semiconductor wafer, having a bulk semi-conductive substrate and an SOI semi-conductive layer and are arranged as a bulk FinFET transistor and an SOI FinFet transistor being arranged on top of the bulk FinFET transistor. Both the FinFET transistor and the SOI FinFet transistor are attached to a common charge-trapping layer. A word line with sidewalls is arranged on top of said patterned charge-trapping layer and a spacer oxide layer is arranged on the sidewalls of said word line.

    摘要翻译: 本发明涉及一种用于制造堆叠的非易失性存储单元的方法。 此外,本发明涉及堆叠的非易失性存储单元。 本发明特别涉及具有非易失性堆叠存储单元的非易失性NAND存储器的领域。 层叠的非易失性存储单元形成在具有体半导体基板和SOI半导电层的半导体晶片上,并且被布置为体FinFET晶体管,并且SOI FinFet晶体管布置在体FinFET晶体管的顶部 。 FinFET晶体管和SOI FinFet晶体管都连接到公共的电荷俘获层。 具有侧壁的字线被布置在所述图案化的电荷捕获层的顶部上,并且间隔氧化物层被布置在所述字线的侧壁上。