Abstract:
An electrostatic discharge, ESD, protection circuit arrangement is connectable to a first pin and a second pin of an electronic circuit and arranged to at least partly absorb an ESD current entering the electronic circuit through at least one of the first pin or the second pin during an ESD stress event. The protection circuit arrangement comprises a first ESD protection circuit arranged to absorb a first portion of the ESD current during a first part of the ESD stress event during which first part a level of the ESD current exceeds a predetermined current threshold; and a second ESD protection circuit arranged to absorb a second portion of the ESD current, the second portion having a current level below the current threshold, at least during a second part of the ESD stress event. The second ESD protection circuit comprises a current limiting circuit arranged to limit a current through at least a portion of the second ESD protection circuit to the current threshold.
Abstract:
An electronic component package includes a substrate and dielectric structure. The dielectric structure includes a top surface having a protrusion portion and a lower portion. The protrusion portion is located at first height that is greater than a second height of the lower portion. A conductive bond pad is located over the dielectric structure. A ball bond electrically couples the bond pad and a bond wire. An intermetallic compound located between the ball bond and bond pad is formed of material of the ball bond and bond pad and electrically couples the bond pad to the ball bond. A portion of the bond pad is vertically located between a portion of the lower portion of the top surface of the dielectric structure and the intermetallic compound. No portion of the bond pad is vertically located between at least a portion of the protrusion portion and the intermetallic compound.
Abstract:
A semiconductor device having a plurality of on-chip processors, a plurality of key RAMs, a plurality of key RAM controllers, a fuse bank, a fuse bank controller and a boot controller is described. The boot controller is arranged to, in a first programming stage, allocate a first array of fuses in the fuse bank in dependence on the size of a first device key for storing the first device key in the fuse bank and, during boot-time, provide the first device key to a first key RAM controller. The fuse bank controller is arranged to program the first array of fuses with the first device key in the first programming stage, provide the first device key to the boot controller during boot-time, and prevent access to the first device key in the fuse bank during run-time. The first key RAM controller is arranged to, during boot-time, store the first device key in the first key RAM, and, during run-time, restrict access to the first device key in the first key RAM to exclusive access by the first on-chip processor. The first on-chip processor is arranged to, during run-time, retrieve the first device key from the first key RAM (110) and use the first device key in the first key-protected processing.
Abstract:
The invention relates to an apparatus for transfer of data elements between a bus controller, such as a CPU, and a memory controller. An address translator is arranged to receive a write address from the CPU, to modify the write address and to send the modified write address to the memory controller. An ECC calculator is arranged to receive write input data associated with the write address, from the CPU, and to generate an error correction code on the basis of the write input data. A concatenator is arranged to receive the write input data from the CPU, and to receive the error correction code from the ECC calculator, and to concatenate the write input data and the error correction code to obtain write output data, and to send the write output data to the memory controller.
Abstract:
An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.
Abstract:
An integrated circuit (IC) device is provided that includes at least one internal voltage regulator arranged to receive a voltage supply signal at a first input thereof, receive a control signal at a second input thereof, regulate the received voltage supply signal in accordance with the received control signal, and provide a regulated voltage supply signal at an output thereof. The IC device further includes at least one voltage regulation power control module operably coupled to the second input of the at least one internal voltage regulator and arranged to provide the control signal thereto. The voltage regulation power control module is further arranged to receive at least one IC device conditional indication, and generate the control signal for the at least one internal voltage regulator based at least partly on an available thermal power budget for the IC device corresponding to the at least one IC device conditional indication.
Abstract:
A layered network (10; 11; 12) to provide offload of data in a communication processor (100; 110; 120). The layered network (10; 11; 12) includes a first set (S1) of network elements at a first layer (L1) and a second set (S2) of one or more network elements at a second layer (L2). The network elements of the first set (S1) are configured for processing incoming data and the network elements of the second set (S2) of one or more network elements at the second layer (L2) are configured to process intermediate data received from the first set (S1) of network elements. The network elements of a particular subset (Si1) of the network elements of the first set (Si1) of network elements are connected to only a particular network element (Ei2) of the second set (S2) to transfer the incoming data processed by the network elements of the particular subset (Si1) to the particular network element (Ei2) of the second set (S2). The layered network (10; 11; 12) further includes a powering controller (25) configured to, during offload of the data, put a particular network element (Ei2) of the second set (S2) at the second layer (L2) in an on state only if at least a particular network element (Ei1) of the particular subset (S1) of the network elements of the first set (S1) at the first layer (L1) is in an on state and at least one of the network elements of the first set (S1) is in an off state. The powering controller (25) is configured to discriminate between chains of network elements formed by at least network elements of the first set (S1) and network elements of the second set (S2) and to have a chain in an on state if a first network element of the chain at a highest layer hierarchy is in an on state.
Abstract:
A bonded semiconductor device comprising a support substrate, a semiconductor device located with respect to one side of the support substrate, a cap substrate overlying the support substrate and the device, a glass frit bond ring between the support substrate and the cap substrate, an electrically conductive ring between the support substrate and the cap substrate. The electrically conductive ring forms an inner ring around the semiconductor device and the glass frit bond ring forms an outer bond ring around the semiconductor device.
Abstract:
A simulation system for testing a simulation of a device against one or more violation rules is described. The simulation system comprises a device simulator for executing the simulation of a device using a device design, a device model and a simulation scenario; and one or more violation monitors, one for each violation rule. Each violation monitor comprises a violation information detector for detecting one or more violations of the respective violation rule during the executing of the simulation and, for each violation, determining information representing the respective violation; a violation score unit for calculating, for each violation of the respective violation rule, a violation score in dependence on the information representing the violation and on a violation rule-specific scheme, and a rule score unit for determining, for the respective violation rule, a rule score from the violation scores of the one or more violations during the simulation. The simulation system further comprises a reporting unit for preparing a report of the rule scores associated with the one or more violation rules and for reporting the report to a user. A method of testing a simulation of a device against one or more violation rules is described.
Abstract:
A run-time integrity checking (RTIC) method compatible with memory having at least portions that store data that is changed over time or at least portions configured as virtual memory is provided. For example, the method may comprise storing a table of page entries and accessing the table of page entries by, as an example, an operating system or, as another example, a hypervisor to perform RTIC on memory in which, as an example, an operating system, as another example, a hypervisor, or, as yet another example, application software is stored. The table may, for example, be stored in secure memory or in external memory. The page entry comprises a hash value for the page and a hash valid indicator indicating the validity status of the hash value. The page entry may further comprise a residency indicator indicating a residency status of the memory page.