公开(公告)号：US20070228180A1

公开(公告)日：2007-10-04

申请号：US11715393

申请日：2007-03-08

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： G06K19/06 ,  G06K7/08

CPC分类号： G07C9/00007 ,  G06K19/07345 ,  G07C9/00309

摘要： There are provided an access controlling method of a non-contact communication electronic device and a non-contact communication electronic device thereof, which can prevent illegitimate access without the convenience of use and the handiness and the like for the user deteriorating. The method includes detecting inclination of a main body, and controlling an on/off state of a non-contact communication function of the main body. In a case in which it is detected that the main body is in a horizontal state or in a case in which it is detected that the main body is within a predetermined allowable range from a horizontal state in the inclination detecting, the non-contact communication function is turned on in the controlling.

摘要翻译： 提供了一种非接触通信电子设备和非接触式通信电子设备的访问控制方法，其可以防止非法访问而不需要使用方便，并且用户的便利性等劣化。 该方法包括检测主体的倾斜度，以及控制主体的非接触通信功能的接通/断开状态。 在检测到主体处于水平状态的情况下，或者在检测到主体处于倾斜检测中的水平状态的预定允许范围内的情况下，非接触通信 功能在控制中打开。

公开(公告)号：US07222235B1

公开(公告)日：2007-05-22

申请号：US09539421

申请日：2000-03-30

申请人： Yasuhiro Mitsui

发明人： Yasuhiro Mitsui

IPC分类号： G09C5/00

CPC分类号： H04N1/32203 ,  G06F17/211 ,  G06T1/005 ,  G06T2201/0051 ,  H04N1/32208 ,  H04N1/32229 ,  H04N2201/3233 ,  H04N2201/3235

摘要： An image processing system comprises an image providing apparatus which provides an image file, from which a digital watermark information can be extracted by using a watermark key that includes an authentication information which authenticates the image file provided by an valid provider, and the watermark key of the image file; and an image utilizing apparatus which extracts the digital watermark information from the image file provided by the image providing apparatus using the watermark key provided by the image providing apparatus, verifies whether the watermark key has been tampered or not using the authentication information in the watermark key, verifies whether the image file has been tampered or not using the verified watermark key, and displays the verified image file.

摘要翻译： 一种图像处理系统包括图像提供装置，该图像提供装置提供图像文件，通过使用包含验证由有效提供者提供的图像文件的认证信息的水印密钥可以提取数字水印信息，并且水印密钥 图像文件; 以及使用由图像提供装置提供的水印键从图像提供装置提供的图像文件中提取数字水印信息的图像利用装置，使用水印密钥中的认证信息来验证水印密钥是否已被篡改 验证图像文件是否被使用验证的水印键篡改，并显示验证的图像文件。

公开(公告)号：US07205554B2

公开(公告)日：2007-04-17

申请号：US11127213

申请日：2005-05-12

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： H01J37/256 ,  G21N23/225

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

公开(公告)号：US20060168756A1

公开(公告)日：2006-08-03

申请号：US10549538

申请日：2004-10-21

申请人： Hitoshi Sato ,  Yasuhiro Mitsui ,  Sakae Higano ,  Satoshi Kosugi ,  Katsumasa Yamaguchi ,  Kenichi Sakamoto

发明人： Hitoshi Sato ,  Yasuhiro Mitsui ,  Sakae Higano ,  Satoshi Kosugi ,  Katsumasa Yamaguchi ,  Kenichi Sakamoto

IPC分类号： B60B33/00

CPC分类号： H04M1/0212 ,  E05D3/10 ,  E05D11/1064 ,  E05D11/1078 ,  E05Y2900/606 ,  G06F1/1622 ,  G06F1/1681 ,  Y10T16/1873 ,  Y10T16/53864

摘要： A biaxial hinge having a rotating mechanism that realizes durability, a good tactile feedback, smaller size and more lightweight is provided for use in a notebook computer or a portable telephone that needs to be smaller and more lightweight. The biaxial hinge is constituted such that a rotating shaft member 9 is fixed to a rotation support member 10, a rotation-side member 7 is inserted and attached to the outer periphery of the rotating shaft member 9, and an opening/closing torque unit mechanism 12 for opening and closing operations is disposed at the rotation-side member 7, wherein sliding friction torque and click torque are generated by the load produced by a coil spring 6 between pressing members 4 and the rotating shaft support member 10 or a sliding member 3 attached to the rotating shaft member 9. The rotating mechanism of the biaxial hinge of the present invention affords good durability, a good tactile feedback, and a reduction in size and weight. And, this rotating mechanism is applied to a portable telephone.

摘要翻译： 具有实现耐用性，良好的触觉反馈，更小尺寸和更轻量化的旋转机构的双轴铰链被提供用于需要更小和更轻的笔记本电脑或便携式电话。 双轴铰链构成为使旋转轴构件9固定在旋转支撑构件10上，旋转侧构件7插入并安装在旋转轴构件9的外周，开闭力矩单元机构 用于打开和关闭操作的图12设置在旋转侧构件7处，其中由按压构件4和旋转轴支撑构件10或滑动构件3之间的螺旋弹簧6产生的载荷产生滑动摩擦力矩和咔嗒扭矩 本发明的双轴铰链的旋转机构提供良好的耐久性，良好的触觉反馈以及尺寸和重量的减小。 并且，该旋转机构被应用于便携式电话机。

公开(公告)号：US20050182595A1

公开(公告)日：2005-08-18

申请号：US11102703

申请日：2005-04-11

申请人： Yasuhiro Mitsui ,  Yasutsugu Usami ,  Isao Kawata ,  Yuya Toyoshima ,  Tadashi Otaka ,  Nobuyuki Iriki

发明人： Yasuhiro Mitsui ,  Yasutsugu Usami ,  Isao Kawata ,  Yuya Toyoshima ,  Tadashi Otaka ,  Nobuyuki Iriki

IPC分类号： G01Q30/04 ,  H01L23/544 ,  G06F15/00

CPC分类号： H01L22/34

摘要： A test pattern formed in a scribe line area of a wafer is irradiated with a light beam to measure the width thereof; the test pattern is irradiated with an electron beam so as to measure the width thereof; an amount of change in the width of the test pattern is calculated; a dummy pattern having the same width as that of a semiconductor device of the wafer is irradiated with an electron beam to measure the width thereof; and the width of a pattern is estimated by the use of the calculated amount of width change so as to determine the shape of the pattern. Thus, a shape measuring system and method capable of determining the shape of a micropattern in a semiconductor device without changing the dimensions of the micropattern can be provided.

公开(公告)号：US06927391B2

公开(公告)日：2005-08-09

申请号：US10878528

申请日：2004-06-29

申请人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

发明人： Mitsuo Tokuda ,  Muneyuki Fukuda ,  Yasuhiro Mitsui ,  Hidemi Koike ,  Satoshi Tomimatsu ,  Hiroyasu Shichi ,  Hideo Kashima ,  Kaoru Umemura

IPC分类号： G01N1/32 ,  G01N1/28 ,  G01N23/225 ,  G01Q10/00 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q30/16 ,  G01Q30/20 ,  H01J37/20 ,  H01J37/256 ,  H01J37/28 ,  H01J37/30 ,  H01J37/305 ,  H01J37/317 ,  H01L21/66 ,  H04L29/06 ,  H04L29/08

CPC分类号： H04L29/06 ,  G01N23/225 ,  H01J37/256 ,  H01J37/3056 ,  H01J2237/20 ,  H01J2237/202 ,  H01J2237/31745 ,  H04L67/16 ,  H04L69/329

摘要： An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.

摘要翻译： 本发明的目的是实现一种用于处理和观察微分样品的方法和装置，其能够以高分辨率，高精度和高产量在水平和垂直方向观察晶片的截面而不分裂任何作为样品的晶片 。 在本发明的装置中，在一个真空容器中包括聚焦离子束光学系统和电子光学系统，并且通过用带电粒子束的成形处理分离包含样品的所需区域的微小样品，并且在那里 被包括用于提取分离的微小样本的操纵器和用于独立于晶片样品台驱动操纵器的操纵器控制器。

公开(公告)号：USRE35681E

公开(公告)日：1997-12-02

申请号：US600715

申请日：1996-02-13

申请人： Yasuhiro Mitsui ,  Osami Okada

发明人： Yasuhiro Mitsui ,  Osami Okada

IPC分类号： G01N27/62 ,  H01J49/04 ,  H01J49/10 ,  H01J49/12 ,  H01J49/14

CPC分类号： H01J49/24 ,  H01J49/145

摘要： An atmospheric pressure ionization mass spectrometer which comprises an ion source for ionizing a sample gas, a low pressure region provided with a mass filter and a collector therein, a differential pumping region provided between the ion source and the low pressure region and with electrodes provided on the side of the ion source and on the side of the low pressure region, respectively, and a pressure-gradient electrode means for dissociation and removal of cluster ions, as connected to the electrode on the side of the ion source among the electrodes provided in the differential pumping region is disclosed.

摘要翻译： 一种大气压电离质谱仪，其包括用于离子化样品气体的离子源，设置有质量过滤器的低压区域和集尘器，设置在离子源和低压区域之间的差分泵浦区域以及设置在 离子源的侧面和低压区域的一侧，以及用于离解和去除簇离子的压力梯度电极装置，其连接到设置在电极中的电极之间的离子源侧的电极 公开了差分泵浦区域。

公开(公告)号：US5481109A

公开(公告)日：1996-01-02

申请号：US211575

申请日：1994-04-11

申请人： Ken Ninomiya ,  Hideo Todokoro ,  Tokuo Kure ,  Yasuhiro Mitsui ,  Katsuhiro Kuroda ,  Hiroyasu Shichi

发明人： Ken Ninomiya ,  Hideo Todokoro ,  Tokuo Kure ,  Yasuhiro Mitsui ,  Katsuhiro Kuroda ,  Hiroyasu Shichi

IPC分类号： G01N23/225 ,  H01J37/252 ,  G01N23/223

CPC分类号： G01N23/2252 ,  H01J37/252 ,  G01N2223/076 ,  H01J2237/24415

摘要： A surface analysis method and an apparatus for carrying out the samein which the method involves the detection of fluorescence X-rays emitted from the surface of a sample in response to a finely focused electron beam irradiated thereto, whereby residues on the sample surface are analyzed qualitatively and quantitatively. An electron beam (1) is irradiated through a hole (9) at the center of an X-ray detector (8) into a fine hole (h) on the surface of a sample (2). In response, fluorescence X-rays are emitted from inside the fine hole (h) and are detected by an annular X-ray detector (8) having an energy analysis function near the axis of the electron beam (1) (preferably within 20 degrees with respect to the center axis of the electron beam). This arrangement allows the fluorescence X-rays from the fine hole (h) to reach the X-ray detector (8) without being absorbed by the substance of the material. That in turn ensures qualitative and quantitative analysis of high accuracy about residues in fine holes of large aspect ratios. Since the method is of non-destructive nature, the analyzed sample may be placed unscathed back into the fabrication process.

摘要翻译： PCT No.PCT / JP93 / 01373 Sec。 371日期1994年04月11日 102（e）日期1994年4月11日PCT提交1993年9月27日PCT公布。 出版物WO94 / 08232 日期1994年4月14日。表面分析方法及其实施方法涉及检测从样品表面发射的荧光X射线，其响应于照射到其上的精细聚焦的电子束，由此残留物 对样品表面进行定性和定量分析。 电子束（1）通过X射线检测器（8）的中心的孔（9）照射到样品（2）的表面上的细孔（h）中。 作为响应，从细孔（h）内部发射荧光X射线，并且通过在电子束（1）的轴附近具有能量分析功能的环形X射线检测器（8）来检测（优选在20度以内） 相对于电子束的中心轴）。 这种布置允许来自细孔（h）的荧光X射线到达X射线检测器（8）而不被材料的物质吸收。 这反过来又确保了对大长宽比的细孔中残留物的高精度的定性和定量分析。 由于该方法具有非破坏性，所以分析的样品可以无损地放置在制造过程中。

公开(公告)号：US5168224A

公开(公告)日：1992-12-01

申请号：US490581

申请日：1990-05-16

申请人： Takuya Maruizumi ,  Yusuke Yajima ,  Yasuhiro Mitsui

发明人： Takuya Maruizumi ,  Yusuke Yajima ,  Yasuhiro Mitsui

IPC分类号： G01N23/04 ,  G01R33/44 ,  G01V3/14

CPC分类号： G01V3/14 ,  G01N23/04 ,  G01R33/441

摘要： A method and an apparatus for detecting the existence of a specific substance in an article to be inspected in which an electromagnetic wave having energy in the vicinity of transition energy between spin states of an atomic nucleus applied with energy splitting due to electrostatic interaction between said atomic nucleus in the specific substance and an electric field in the substance which is peculiar to said specific substance is irradiated to the article to be inspected, thereby detecting transition between said spin states.

摘要翻译： PCT No.PCT / JP89 / 01032 Sec。 371日期：1990年5月16日 102（e）日期1990年5月16日PCT申请日1989年10月6日。一种用于检测被检物品中特定物质的存在的方法和装置，其中具有在过渡能量附近的能量的电磁波 由于特定物质中的所述原子核之间的静电相互作用而产生能量分裂的原子核的自旋态和所述特定物质特有的物质中的电场被照射到待检查的物品上，从而检测所述 自旋状态。

公开(公告)号：US5148022A

公开(公告)日：1992-09-15

申请号：US479171

申请日：1990-02-13

申请人： Fumio Kawaguchi ,  Hiroshi Takeuchi ,  Yasuhiro Mitsui ,  Yoshitoshi Ito ,  Munetaka Haida

发明人： Fumio Kawaguchi ,  Hiroshi Takeuchi ,  Yasuhiro Mitsui ,  Yoshitoshi Ito ,  Munetaka Haida

IPC分类号： A61B5/00

CPC分类号： A61B5/0073 ,  A61B5/7242

摘要： A method for optically inspecting a human body and an apparatus for the same serve to scan a light pulse having a visible wavelength to an infrared one on a specific sliced portion of a body to be inspected, for obtaining pieces of projection data about light absorption and to reconstruct an image about distribution of light absorption from the projection data with a computer tomogram. The projection data is measured by alternately radiating a first light pulse at a first wavelength in an absorption wavelength band specific to metabolic materials to be imaged and a second light pulse at a second wavelength being closer to said first wavelength. Then, the data about the transmitted beams are produced by deriving a ratio of integrated values of the first signal to the second one residing within a specific time gate.