Memory device
    73.
    发明授权

    公开(公告)号:US11600317B2

    公开(公告)日:2023-03-07

    申请号:US17332414

    申请日:2021-05-27

    摘要: A memory device is provided. The memory device includes a bit cell having a first invertor connected between a first node and a second node and a second invertor connected between the first node and the second node. The first invertor and the second invertor are cross coupled at a first data node and a second data node. The memory device further includes a pull down circuit connected to the second node. The pull down circuit is operative to pull down a voltage of the second node below a ground voltage in response to an enable signal.

    Memory having flying bitlines for improved burst mode read operations

    公开(公告)号:US11587610B2

    公开(公告)日:2023-02-21

    申请号:US17333638

    申请日:2021-05-28

    摘要: Memory systems having flying bitlines for improved burst mode read operations and related methods are provided. A memory system comprises a memory array including a first set of memory cells coupled to a first inner wordline and a second set of memory cells coupled to a first outer wordline. The memory system includes a control unit configured to generate control signals for simultaneously: asserting a first wordline signal on the first inner wordline coupled to each of a plurality of inner bitlines, and asserting a second wordline signal on the first outer wordline coupled to each of a plurality of outer bitlines, where each of the plurality of outer bitlines includes a first portion configured to fly over or fly under a corresponding inner bitline, and outputting data from each of the first set of memory cells and the second set of memory cells as part of a burst.

    MEMORY ARRAY CIRCUIT, MEMORY ARRAY LAYOUT AND VERIFICATION METHOD

    公开(公告)号:US20230050097A1

    公开(公告)日:2023-02-16

    申请号:US17659337

    申请日:2022-04-15

    发明人: Peihuan WANG

    摘要: Embodiments of the present application provide a memory array circuit, a memory array layout and a verification method. The memory array circuit includes: M word lines (WLs); M WL break nodes, each being configured to separate a corresponding one of the WLs into a first WL pin and a second WL pin; N bit lines (BLs); and N BL break nodes, each being configured to separate a corresponding one of the BLs into a first BL pin and a second BL pin, wherein the M and the N each are a positive even number.

    NON-VOLATILE MEMORY DEVICE AND CONTROL METHOD

    公开(公告)号:US20230030801A1

    公开(公告)日:2023-02-02

    申请号:US17965527

    申请日:2022-10-13

    摘要: A non-volatile memory device includes a plurality of word lines and a control circuit. The control circuit is configured to apply a first word line pre-pulse signal of a plurality of word line pre-pulse signals to a first group of the plurality of word lines, apply a second word line pre-pulse signal of the plurality of word line pre-pulse signals to a second group of the plurality of word lines during a pre-charge period, and apply a third word line pre-pulse signal of the plurality of word lines pre-pulse signals to a third group of the plurality of word lines during the pre-charge period. A voltage level of the second word line pre-pulse signal is greater than that of the first word line pre-pulse signal, and a voltage level of the third word line pre-pulse signal is greater than that of the second word line pre-pulse signal.

    SENSE AMPLIFIER WITH DIGIT LINE MULTIPLEXING

    公开(公告)号:US20230011345A1

    公开(公告)日:2023-01-12

    申请号:US17369873

    申请日:2021-07-07

    摘要: Methods, systems, and devices for sense amplifier with digit line multiplexing are described. A method includes precharging an input and an output of an amplifier stage of a sense component to a first voltage based on a read operation associated with a memory cell. The method includes precharging a first side and a second side of a latch stage of the sense component to the first voltage based on precharging the output of the amplifier stage to the first voltage, the latch stage coupled with the amplifier stage. The method may also include coupling a second voltage from a digit line associated with the memory cell to the input of the amplifier stage, the amplifier stage generating a third voltage on the output based on coupling the second voltage to the input, and the latch stage latching a logic value associated with the memory cell based on the third voltage.