摘要:
A data output drive transistor is rendered conductive when the potential of an internal node attains an H level, whereby an output node is discharged to the level of ground potential. When the drive transistor is turned on, the output node is discharged to the level of ground potential at high speed. This drive transistor is turned on for a predetermined time period when output of a high level data is completed, whereby the output node is discharged to the level of the ground potential for a predetermined time period. As a result, the potential of the output node is lowered from a high level to an intermediate level, so that the amplitude of a subsequent output signal is reduced. An output circuit that can effectively prevent generation of ringing with no increase in the access time is provided. A countermeasure is provided to suppress a ringing at output node which drives the output node at high speed when the output node potential attains a potential at which no ringing is caused. A stable output signal is provided at high speed.
摘要:
A tunneling magneto-resistance element of each MTJ (magnetic tunnel junction) memory cell is connected between a bit line and a strap. Each strap is shared by a plurality of tunneling magneto-resistance elements that are located adjacent to each other in the row direction in the same sub array. Each access transistor is connected between a corresponding strap and a ground voltage, and turned ON/OFF in response to a corresponding word line. Since data read operation can be conducted with the structure that does not have an access transistor for every tunneling magneto-resistance element, the array area can be reduced.
摘要:
A random logic circuit comprises an input portion for inputting data; a first latch portion for receiving the data outputted from the input portion, and holding and outputting the data; a second latch portion for receiving the data outputted from the first latch portion, and holding and outputting the data; an output portion for receiving the data outputted from the second latch portion and outputting the data to a logic circuit; and a prevention circuit for preventing generation of a sub-threshold leak current in sleep mode between the first latch portion and the second latch portion.
摘要:
A semiconductor memory device includes a plurality of N and P channel MOS transistors. The plurality of MOS transistors are formed on an SOI (Silicon On Insulator) substrate. Each MOS transistor includes a source region, a drain region, and a body region located between the source region and the drain region. The body region of at least one N channel MOS transistor is electrically fixed. The body region of at least one P channel MOS transistor is rendered floating.
摘要:
A refresh address is set to a definite state prior to the rise of a clock signal, a refresh instruction is taken-in in synchronization with a clock signal and a refresh operation is performed according to the refresh instruction. Further, in a refresh operation, refresh is performed with a sub-word line being a unit; thereby enabling high speed refresh of memory sell data with a reduced current consumption.
摘要:
Pads are alignedly arranged in a central region of a semiconductor chip and are also arranged at an outer peripheral portion of the central portion of the chip. A pad at the outer peripheral portion is electrically connected to a die pad mounting the chip thereon with an insulative material interposed therebetween. A potential supplied to the pad positioned at the outer peripheral portion can be stabilized by parasitic capacitance of the die pad, and a potential of the die pad can be externally monitored easily by removing away a portion of mold resin after resin sealing. Further, due to a cress shaped arrangement of the pads, a voltage down converter can be arranged in line with the pads and at outer periphery of the chip without area penalty. In testing operation, a switching circuit switches a function of a pad to another pad so that cross-shapedly arranged pads are equivalently arranged in a line.
摘要:
In the data read operation, a memory cell and a dummy memory cell are respectively coupled to two bit lines of a selected bit line pair, and a data read current is supplied thereto. In the selected memory cell column, a read gate drives the respective voltages on a read data bus pair, according to the respective voltages on the bit lines. A data read circuit amplifies the voltage difference between the read data buses so as to output read data. The use of the read gate enables the read data buses to be disconnected from a data read current path. As a result, respective voltage changes on the bit lines are rapidly produced, whereby the data read speed can be increased.
摘要:
A random logic circuit comprises an input portion for inputting data; a first latch portion for receiving the data outputted from the input portion, and holding and outputting the data; a second latch portion for receiving the data outputted from the first latch portion, and holding and outputting the data; an output portion for receiving the data outputted from the second latch portion and outputting the data to a logic circuit; and a prevention circuit for preventing generation of a sub-threshold leak current in sleep mode between the first latch portion and the second latch portion.
摘要:
In a semiconductor memory device, rows of normal cell array blocks are selected by 13-bit row addresses corresponding to a refresh period of 8 kc respectively, so that the selected rows are successively refreshed. A spare memory array block is selected by a 12-bit row address for 4 kc excluding the most significant row address in the 13-bit row addresses corresponding to the row addresses of 8 kc. Thus, the semiconductor memory device can effectively carry out defect repair without reducing the yield also when a spare memory cell is inferior in data retention ability.
摘要:
First and second pairs of input/output lines transfer mutually complementary data signals respectively. First and second selection circuits select a signal transfer line having the same potential as that of a signal transfer line not precedently selected from two precedently selected signal transfer lines among first to third signal transfer lines and the signal transfer line not precedently selected and connect first ends thereof to the first pair of input/output lines respectively while connecting second ends thereof to the second pair of input/output lines respectively. Thus, no precharging may be performed for equalizing the potentials of the two signal transfer lines selected for present data transfer with each other, and hence reduction of a data transfer rate can be prevented.