摘要:
A dispersion compensating optical fiber for NZ-DSFs, includes: an uncovered dispersion compensating optical fiber; a double-layered resin coating disposed around the uncovered dispersion compensating optical fiber; and an outer coating layer having a thickness of 3 to 7 μm, containing silicone in an amount of 1 to 5% by weight, and disposed around the double-layered resin coating. The outer diameter of the uncovered dispersion compensating optical fiber is in a range from 90 to 125 μm, an outer diameter of the dispersion compensating optical fiber is in a range from 180 to 250 μm, and the amount of silicone contained in the outer coating layer is determined such that an adhesive property of the outer coating layer is 1 gf/mm or less.
摘要:
Disclosed is a liquid crystal display device having a signal line of low electrical resistivity and high adhesion with an underlayer, wherein a copper alloy film is formed on an underlayer, and an oxide film, silicide film or nitride film, which are additive metal elements of the copper alloy, is formed at the boundary between the underlayer and the copper alloy film whereby the signal line is formed with a multi-layer film of the copper alloy film and the oxide film, the silicide film, or the nitride film.
摘要:
An image forming apparatus may include an image acquiring section for acquiring the image to be printed, an attribute information acquiring section for acquiring attribute information of the recording sheet to be used for printing the image acquired by the image acquiring section from the IC tag attached to the recording sheet and storing the attribute information, a printing control section for controlling the operation of printing the image so as to make the image match the attributes of the recording sheet on the basis of the attribute information acquired by the attribute information acquiring section and an image printing section for printing the image under the control of the printing control section.
摘要:
A semiconductor memory device includes a plurality of N external ports, each of which receives commands, and an internal circuit which performs at least N access operations during a minimum interval of the commands that are input into one of the external ports.
摘要:
A semiconductor chip is secured in a state deformed into a substantially cylinder shape by a coating material formed on its surface. The deformed semiconductor chip is flip-chip connected to an interposer and sealed with sealing resin onto the interposer. Solder balls are provided, as external terminals, on the other side of the interposer.
摘要:
A semiconductor device containing a dielectric capacitor having an excellent step coverage for a device structure of high aspect ratio corresponding to high integration degree, as well as a manufacturing method therefor are provided. A dielectric capacitor of high integration degree is manufactured by forming a bottom electrode 46 and a top-electrode 48 comprising a homogeneous thin Ru film with 100% step coverage while putting a dielectric 47 therebetween on substrates 44, 45 having a three-dimensional structure with an aspect ratio of 3 or more by a MOCVD process using a cyclopentadienyl complex within a temperature range from 180° C. or higher to 250° C. or lower.
摘要:
A semiconductor device containing a dielectric capacitor having an excellent step coverage for a device structure of high aspect ratio corresponding to high integration degree, as well as a manufacturing method therefor are provided. A dielectric capacitor of high integration degree is manufactured by forming a bottom electrode 46 and a top-electrode 48 comprising a homogeneous thin Ru film with 100% step coverage while putting a dielectric 47 therebetween on substrates 44, 45 having a three-dimensional structure with an aspect ratio of 3 or more by a MOCVD process using a cyclopentadienyl complex within a temperature range from 180° C. or higher to 250° C. or lower.
摘要:
A combination mode a data transfer for a transfer source and a transfer destination is previously defined by a value of resource select information of a control register (CHCRn). An address comparator circuit (SACn, DACn) has judging logic specified by the defined contents and detects, depending on its logical structure, a data transfer address error in the a data transfer controller (8) on the basis of such logical structure, in accordance with resource select information and the transfer source address and transfer destination address of the address registers (SARn, DARn). Since the data transfer is started only when the resource select information matches with the setting information of both address registers, high reliability can be assured for memory protection in the data transfer operation by the data transfer controller.
摘要:
An input/output device used as a transfer request source outputs a data transfer set command for specifying each transfer channel, each transfer address, the number of transfers, etc. onto a bus together with a data transfer request without being involving use of the CPU. According to the data transfer set command, data transfer control information is set to direct memory access control means, and DMA transfer is started between the input/output device and a memory designated by the transfer address, for example. When the input/output device used as a data transfer request source desires to perform data transfer without regard to a state of processing by the microcomputer, it can perform data transfer processing with its own timing and the data transfer with the input/output device as a principal base is allowed.
摘要:
In a semiconductor device and production method thereof, a technique is used to prevent film separation of the bottom electrode occurring during a heat treatment process which is carried out to make the bottom electrode closely packed and in the heat treatment process for producing dielectric crystallization. In the production method, a glue layer including an insulator is formed between SiO2 insulation layer and the inner wall of a concave hole. The SiO2 layer 14 is located on the Si board 11, and Si plug 12 and a barrier layer 13 are formed therein. A glue layer 16 is formed on the inner wall of the hole of the SiO2 insulation layer 15, and a bottom electrode 17 comprising Ru is formed on the barrier layer 13 and glue layer 16. Dielectric film 18 comprising BST and a top electrode 19 comprising Ru are laminated sequentially on the bottom electrode 17, to form a dielectric device with the bottom electrode 17.