摘要:
An apparatus for compensating for the thermal expansion of two machine parts which are relatively movable in longitudinal guideways. The apparatus comprises a rule, a support rod longitudinally disposed on the movable machine part for supporting the rule, and an electric scanning head mounted on the stationary machine part. The support rod is made of a material which exhibits negligible thermal expansion in the concerned temperature range. The forward end of the support rod is rigidly secured to the forward end of the movable machine part while the rear end thereof is movably guided on that machine part. The rear end of the rule is fixed to the rear end of the support rod. The scanning head is disposed on the stationary machine part in such a way that any thermal expansion of the stationary machine part cannot affect the location of the scanning head.
摘要:
A device for the temperature-responsive adjustment of the measuring points of two relatively movable machine tool parts, the device comprising a rule mounted for limited movement on a first machine part, a scanning head mounted on the second machine part, and at least one transverse rod which is disposed for axial movement in a portion of the movable machine part that is particularly subject to being heated. The transverse rod, which extends right into the heated zones at least with its inner end portion, has its outer end connected to the rule by means of a reversing drive such that elongations of the transverse rod caused by heating are converted to a horizontal shifting movement of the rule. In an alternative embodiment, a bimetallic element performs the function of the transverse rod.
摘要:
A temperature-compensated borehole extensometer comprises a coaxial remotely anchored assembly of a rod and tube formed of materials having disparate linear coefficients of expansion, said assembly being associated with comparator transducers sensitive to relative linear movement of the rod and tube components under the influence of temperatures.
摘要:
A reticle thermal expansion calibration method includes exposing a first group of wafers and generating a first sub-recipe, performing data mining and data parsing to generate a plurality of overlay parameters, performing a linear regression on each of the overlay parameters, and generating a first coefficient of determination for each of the overlay parameters.
摘要:
An optical measurement system includes a light source, a spectroscopic detector, a reference sample, a switching mechanism that switches between a first optical path through which a sample to be measured is irradiated with light from the light source and light produced at the sample is guided to the spectroscopic detector and a second optical path through which the reference sample is irradiated with light from the light source and light produced at the reference sample is guided to the spectroscopic detector, and a processing unit that calculates, by performing correction processing based on change between a first detection result at first time and a second detection result at second time, a measurement value of the sample from a third detection result provided from the spectroscopic detector as a result of irradiation of the sample with light from the light source at third time temporally proximate to the second time.
摘要:
There is provided a probe unit correction method for correcting linear expansion of a probe unit to obtain an accurate measurement value. First, a probe offset value is calculated as a model. Then, a probe unit correction method includes a temperature data acquisition step of acquiring a temperature difference between a temperature at a time of calibration and a temperature of a current measurement environment, a reference tip coordinate correction step of calculating, as a reference tip correction coordinate value, a correction value of a reference tip coordinate value to which linear expansion is added, and a probe offset correction step of calculating, as a probe offset correction value, a correction value of a probe offset value to which the linear expansion is added.
摘要:
A step gauge and a reference gauge block are placed in a temperature-controlled chamber in parallel with each other. A temperature of the step gauge is changed to a first temperature and a second temperature using a measurement-target temperature adjuster and the temperature-controlled chamber. A distance between a first surface and a second surface of the step gauge is relatively measured at each of the first and second temperatures with reference to a distance between a first reference surface and a second reference surface of the reference gauge block. A coefficient of thermal expansion of the measurement target is calculated from the length of the measurement target at the first temperature and the length of the measurement target at the second temperature.