Abstract:
An apparatus for optically inspecting an at least partially reflecting surface of an object includes first and second transverse carriers (12, 14) defining respective substantially circular segment-shaped cutouts (32). The transverse carriers (12, 14) are disposed at a longitudinal distance (D) from one another and the longitudinal distance (D) defines a longitudinal direction (17). A plurality of longitudinal members are configured to hold the first and second transverse carriers at the longitudinal distance (D). The longitudinal members are arranged at a defined radial distance to the circular segment-shaped cutouts. A translucent diffusing screen is held in the circular segment-shaped cutouts by the transverse carriers to form a tunnel-shaped inspection space. A multiplicity of light sources are arranged outside of the tunnel-shaped inspection space behind the diffusing screen. The light sources are configured to be controlled individually or in small groups to generate variable light-dark patterns on the diffusing screen. A workpiece receptacle is configured for accommodating the object in the tunnel-shaped inspection space. At least one camera is directed into the tunnel-shaped inspection space. An evaluation and control unit is configured to control the light sources and the camera to generate various light-dark patterns on the diffusing screen and to record and evaluate a plurality of images of the object in dependence on the light-dark patterns.
Abstract:
The present invention relates to a method for easily manufacturing an illumination device in which a surface mount chip-type LED is used, and a wiring board is formed into a truncated conical or another shape. The method includes, in a flexible strip-like wiring board having a partial ring or a linear shape, providing a through-hole T for filling with solder paste S at a wiring end portion L to be connected with a terminal of an LED, temporarily fixing the LED with bond B onto the wiring board held in a plate-like state, filling the through-hole T with the solder paste S from a back surface of the wiring board, rounding the wiring board mounted with the LED into a truncated conical or cylindrical shape, and reflowing the wiring board in the rounded state to solder the LED.
Abstract:
An apparatus and method are provided for creating an image of a microarray. The apparatus includes at least one light source configured to direct light toward the microarray. The apparatus includes an excitation filter configured to filter the light into a first frequency band towards dichromatic mirror. The dichromatic mirror reflects light onto the microarray causing the microarray to emit electromagnetic energy. The apparatus includes emission filter configured to filter the electromagnetic energy within a second frequency band. The apparatus further includes an imaging unit having a charged coupled device (CCD), the CCD having an imaging surface masked by a pinhole blind such that when the pinhole blind receives electromagnetic energy from the emission filter, an image is created of the entire microarray.
Abstract:
An illumination mean for the inspection of flat substrates is disclosed. The flat substrate includes an upper edge area, a lower edge area and a front area. The illumination means is formed as an annular segment and comprises an opening into which at least the edge area of the flat substrate extends. A plurality of light sources are arranged on an annular segment in a housing. Inside the housing, a reflective element is provided so that the light from the light sources does not impinge perpendicularly on the upper edge area, the lower edge area and the front area of the flat substrate.
Abstract:
A system and method for inspecting a workpiece are provided. According to one embodiment, the system includes a plurality of illumination sources positioned proximate to the workpiece and each operable to generate at least one respective illumination beam to illuminate at least a portion of the workpiece, wherein each beam has a different respective color. The system also includes at least one camera positioned proximate to the workpiece and operable to capture at least one image of at least a portion of the workpiece including the illumination beams incident thereon. In addition, the system includes a data system capable of providing simultaneous two-dimensional and three-dimensional information indicative of the workpiece based on the image acquired by the camera.
Abstract:
A machine for inspecting a container which is being conveyed along a linear path. The machine has cabinets situated in front of the conveyor path at either side of a central open area in front of the conveyor path which is to be used by an operator for servicing the conveyor. The interior sides of these cabinets are open for access to electronics and the central opening is closed by a pair of doors which are releasably attached to the sides of the cabinets and can be push in to provide access to the central area and can be pulled from the cabinets to provide access to electronics through the open sides of the cabinets.
Abstract:
Light-emitting diodes are mounted in a support block that holds the diodes in a fixed orientation. In certain embodiments, the orientation of the diodes by the support block causes the axes of the diodes to converge below the block to a common point where, in preferred embodiments, components of an excitation optical system are placed. The converging light then diverges for entry into an array of receptacles in which individual chemical reactions take place. The block contains engineered apertures that securely retain the diodes, each aperture including a shoulder for the flange at one end of each diode.
Abstract:
An apparatus for optical inspection of containers includes a light source having at least one light emitting diode with a light emitting die surface. Lenses and/or mirrors focus the light emitting die surface onto a selected portion of a container, and a light sensor receives an image of the selected portion of the container illuminated by the light source. An information processor is coupled to the light sensor for detecting commercial variations in the illuminated portion of the container as a function of the image received at the sensor. The image can be developed by transmission of the light energy through the selected portion of the container, and/or by reflection and/or refraction of the light energy at the selected portion of the container. The light source may include a single light emitting diode, or a plurality of light emitting diodes having light emitting die surfaces focused onto the container in such a way that the images of the light emitting die surfaces overlap and/or are adjacent to each other at the container.
Abstract:
Systems and techniques for detecting the presence of foreign material in food utilizing optical backlighting and/or ultrasonic inspection are presented. In optical backlighting, a substantially monochromatic light source optically backlights a food stream with source light having a wavelength between about 500 and 600 nm. An image of the food stream is captured and the presence of foreign material is determined when a portion of the detected image exceeds a predetermined threshold. The technique is especially suitable for the detection of bone in chicken meat, and the light source can be a planar array of green LEDs. In ultrasonic inspection, a process stream is interrogated with pulses of ultrasound and the presence of foreign material is determined based on the detected off-angle ultrasound scattering response.