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    Method of performing analysis using propagation rays and apparatus for performing the same
    4.
    发明授权
    Method of performing analysis using propagation rays and apparatus for performing the same 有权

    公开(公告)号：US07098459B2

    公开(公告)日：2006-08-29

    申请号：US10457464

    申请日：2003-06-10

    申请人： Kazuhiko Omote ,  Akito Sasaki ,  Yoshiyasu Ito

    发明人： Kazuhiko Omote ,  Akito Sasaki ,  Yoshiyasu Ito

    IPC分类号： G01F23/00 ,  G01N23/20 ,  G01N23/201

    CPC分类号： G01N23/083 ,  G21K1/02

    摘要： Disclosed herein is a sample-analyzing method, in which an incident beam slit is provided between an X-ray source and a sample, a receiving side beam slit is provided between the sample and an X-ray detector, the X-ray detector detects X-rays scattered again from the sample and coming through the receiving side beam slit when the sample is irradiated with the X-rays applied through the incident beam slit, and a value is measured from a value detected by the X-ray detector. In the method, a true value is measured from the value, by using a slit function representing an influence which the incident beam slit and receiving side beam slit impose on the detected value. The slit function is determined from an intensity distribution of the X-rays scattered again from the sample. The method obtains an accurate slit function in accordance with the structure of the optical system employed and can therefore analyze the sample with high precision.

    X-ray analysis apparatus
    6.
    发明申请
    X-ray analysis apparatus 有权
    X射线分析仪

    公开(公告)号：US20080056452A1

    公开(公告)日：2008-03-06

    申请号：US11880638

    申请日：2007-07-23

    申请人： Akito Sasaki ,  Aya Kuribayashi ,  Keiichi Morikawa ,  Kunio Nishi ,  Takao Ohara ,  Toshiyuki Kato ,  Yuji Tsuji

    发明人： Akito Sasaki ,  Aya Kuribayashi ,  Keiichi Morikawa ,  Kunio Nishi ,  Takao Ohara ,  Toshiyuki Kato ,  Yuji Tsuji

    IPC分类号： H05G1/00

    CPC分类号： G01N23/207

    摘要： An X-ray analysis apparatus has information about a relationship between selection of a measurement type and a replacement work of optical parts and shows, on a screen of a display, graphical information about optical parts which should be changed, to make it easy for an operator to perform a preliminary work before measurement. When the operator selects one desired measurement type among a plurality of measurement types in a selection window, there is displayed on the display, depending on the selected measurement type, graphical information about necessary optical parts which should be newly installed and/or installed optical parts which should be removed. The operator looks at the operating instructions and then performs the replacement work. The graphical information may be: graphical indication of the installation locations of the optical parts; different pictorial expressions about the installation and the removal works; and graphical indication of the identification marks of the optical parts.

    摘要翻译： X射线分析装置具有关于测量类型的选择和光学部件的替换工作之间的关系的信息，并且在显示器的屏幕上显示关于应当改变的光学部件的图形信息，以使得易于 操作员在测量前进行初步工作。 当操作者在选择窗口中选择多个测量类型中的一个期望的测量类型时，根据所选择的测量类型，在显示器上显示有关新安装的光学部件和/或安装的光学部件的图形信息 应该删除。 操作员查看操作说明，然后执行更换工作。 图形信息可以是：光学部件的安装位置的图形指示; 有关安装及拆卸工程的不同图示; 以及光学部件的识别标记的图形指示。

    ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA
    8.
    发明申请
    ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA 有权
    X射线衍射测量数据分析方法

    公开(公告)号：US20130077754A1

    公开(公告)日：2013-03-28

    申请号：US13600740

    申请日：2012-08-31

    申请人： Akito SASAKI ,  Keiichi MORIKAWA ,  Akihiro HIMEDA ,  Hiroki YOSHIDA

    发明人： Akito SASAKI ,  Keiichi MORIKAWA ,  Akihiro HIMEDA ,  Hiroki YOSHIDA

    IPC分类号： G01N23/20

    CPC分类号： G01N23/207 ,  G01J3/28 ,  G01N23/20

    摘要： Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.

    摘要翻译： 基于从X射线衍射仪输出的X射线衍射测定数据求出衍射X射线的峰值位置和积分强度，对衍射X射线的确定峰值的数量进行计数，开始分析处理 计数的峰值达到预设的峰值。 基于X射线衍射测量数据重复执行分析处理。 衍射X射线的峰值位置和积分强度由从开始测量直到相关分析处理得到的X射线衍射测量数据确定，并且将所确定的峰值位置和积分强度与标准对照 提前提供数据库的峰值卡数据和测量样本中包含的搜索材料，以及确定测量样本中包含的材料的量的定量分析。

    PHOTOCATALYST BODY, PHOTOCATALYST DISPERSION, AND METHOD FOR MANUFACTURING PHOTOCATALYST BODY
    10.
    发明申请
    PHOTOCATALYST BODY, PHOTOCATALYST DISPERSION, AND METHOD FOR MANUFACTURING PHOTOCATALYST BODY 有权
    光化学物质，光催化剂分散体和制备光催化剂体的方法

    公开(公告)号：US20120065057A1

    公开(公告)日：2012-03-15

    申请号：US13211597

    申请日：2011-08-17

    申请人： Yoko TOKUNO ,  Nobuaki Makino ,  Akito Sasaki ,  Kayo Nakano ,  Takao Kusaka

    发明人： Yoko TOKUNO ,  Nobuaki Makino ,  Akito Sasaki ,  Kayo Nakano ,  Takao Kusaka

    IPC分类号： B01J23/30

    CPC分类号： B01J23/30 ,  B01D2255/20776 ,  B01D2255/802 ,  B01D2255/9202 ,  B01D2259/4508 ,  B01J35/004 ,  B01J35/023 ,  B01J37/0215 ,  B01J37/06

    摘要： According to one embodiment, a photocatalyst body satisfies at least one condition described below, (1) a ratio of an absorption intensity at a wave number of 3450 cm−1 to a peak intensity of an absorption at about 1037 cm−1 being 2.5 or less in an analysis of a surface of the body, (2) a ratio of a maximum peak intensity of an absorption in a wave number range of not less than 1500 cm−1 and not more than 1700 cm−1 to a peak intensity of an absorption at about 1037 cm−1 being 0.7 or less in the analysis and (3) the photocatalyst body having no absorption peak in a wave number range of not less than 5000 cm−1 and not more than 5400 cm−1 or a ratio of a maximum peak intensity of an absorption to an absorption intensity at 5250 cm−1 being 1.7 or less in the analysis.

    摘要翻译： 根据一个实施方案，光催化剂体满足下述至少一个条件：（1）波数为3450cm -1处的吸收强度与约1037cm -1处的吸收峰强度之比为2.5或 较少对身体表面的分析，（2）在1500cm -1以上且1700cm -1以下的波数范围内的吸收的最大峰值强度与峰值强度的比 在分析中约1037cm -1处的吸收为0.7以下，（3）在5000cm -1以上且5400cm -1以下的波数范围内没有吸收峰的光催化剂体或比例 在分析中吸收的最大峰值强度为5250cm -1处的吸收强度为1.7以下。