摘要:
A microcontroller operable in a high power mode and a low power unit (LPU) run mode includes primary and LPU domains, primary and LPU mode controllers, and primary and LPU clock generator modules. The primary domain includes a first set of circuits and a first set of cores. The LPU domain includes second and third sets of circuits, a second set of cores, and a switching module. In the high power mode, the switching module connects the first and second sets of cores to at least one of the first, second and third sets of circuits, while in the LPU run mode, the switching module isolates the LPU domain from the primary domain and activates a small microcontroller system (SMS) that includes the LPU domain, the LPU mode controller and the LPU clock generator module. The SMS has further low power modes within the LPU run mode.
摘要:
A system performance control component, and method therefor, for configuring at least one system performance parameter within a signal processing system. The system performance control component is arranged to receive an indication of an address of a memory access performed by at least one signal processing component, compare the received indication of an address of a memory access to at least one address value, and configure at least one system performance parameter based at least partly on the comparison of the received indication of an address of a memory access to at least one address value.
摘要:
A microprocessor device comprises at least one reset management module. The at least one reset management module is arranged to detect a reset event comprising a first reset level, determine if at least one reset condition has been met upon detection of the reset event comprising the first reset level, and cause a reset of a second reset level upon determining that the at least one reset condition has been met.
摘要:
An apparatus and method for monitoring general purpose input output, GPIO, signals at GPIO pins of a GPIO port of a system on chip, SoC. The apparatus comprises a first checksum generation unit adapted to generate a first checksum on the basis of GPIO bits stored in GPIO registers of the SoC, being connected via corresponding input output, IO, pad circuits to provide analog GPIO signals at the GPIO pins. A second checksum generation unit is adapted to generate a second checksum on the basis of the analog GPIO signals at the GPIO pins representing the GPIO bits. Checker logic is adapted to compare the first checksum generated by the first checksum generation unit with a second checksum generated by the second checksum generation unit.
摘要:
A reset state control circuit adapted to reset independent device domains of an electronic device, said reset state control circuit comprising a capturing unit adapted to capture reset events; and a reset shaping logic adapted to change dynamically a reset control flow to reset device domains of said electronic device depending on a sequence of the reset events captured by said capturing unit.
摘要:
The present application relates to a mode-controlled voltage excursion detector apparatus for monitoring a supply voltage of a power supply applied to a load and a method of operating thereof. A voltage monitor is configured to detect an excursion event if the supply voltage exceeds or falls below at least one defined threshold, to generate an excursion event signal upon detection of the excursion event and to provide the generated excursion event signal to the excursion event output for being outputted via an excursion event output. A sensitivity control module is configured to receive a signal indicative of potential voltage excursions. A sensitivity control module is further operatively coupled to the sensitivity control input and configured to disable the outputting of an excursion event signal generated during a defined period of time in response to the reception of the signal, which triggers the disabling of the outputting.
摘要:
An apparatus and method for monitoring general purpose input output, GPIO, signals at GPIO pins of a GPIO port of a system on chip, SoC. The apparatus comprises a first checksum generation unit adapted to generate a first checksum on the basis of GPIO bits stored in GPIO registers of the SoC, being connected via corresponding input output, IO, pad circuits to provide analog GPIO signals at the GPIO pins. A second checksum generation unit is adapted to generate a second checksum on the basis of the analog GPIO signals at the GPIO pins representing the GPIO bits. Checker logic is adapted to compare the first checksum generated by the first checksum generation unit with a second checksum generated by the second checksum generation unit.
摘要:
An integrated circuit device comprising at least one analogue to digital converter. The at least one ADC comprises at least one input operably coupled to at least one external contact of the integrated circuit device. The integrated circuit device further comprises detection circuitry comprising at least one detection module. The at least one detection module being arranged to receive at a first input thereof an indication of a voltage level at the at least one input of the at least one ADC, compare the received indication to a threshold value, and if the received indication exceeds the threshold value, output an indication that an excessive voltage state at the at least one input of the at least one ADC has been detected.
摘要:
A method of controlling direct memory access of a peripheral memory of a peripheral by a master is described. The method includes checking whether there is a pending request from the peripheral for a direct memory access service, establishing whether an access condition is satisfied in dependence on at least whether there is a pending request, and, if the access condition is satisfied, granting access to the master. Also, an associated device and an associated computer program product are described.
摘要:
A built-in self test system comprises an integrated circuit device comprising a plurality of functional units coupled to built-in self test circuitry; a low power control unit operable to switch the integrated circuit device into a low power mode and to generate a BIST wake-up signal during or before entering the low power mode; and a built-in self test control unit coupled to the built-in self test circuitry and the low power control unit and arranged to initiate a built-in self test when receiving the BIST wake-up signal.