System and method to improve image sensor sensitivity
    1.
    发明申请
    System and method to improve image sensor sensitivity 有权
    提高图像传感器灵敏度的系统和方法

    公开(公告)号:US20060057759A1

    公开(公告)日:2006-03-16

    申请号:US10944243

    申请日:2004-09-16

    IPC分类号: H01L21/00

    摘要: A method is disclosed for forming at least one image sensor with improved sensitivity along with at least one transistor device. The method comprises forming at least a portion of the transistor device on a substrate, forming the image sensor by doping a predetermined area separated from the transistor device by a minimum predetermined distance, forming an etch stop layer for covering a contact area of the transistor device, removing at least a portion of the etch stop layer in the predetermined area for exposing the image sensor, and covering the image sensor and the transistor device by at least one transparent protection layer.

    摘要翻译: 公开了一种用于与至少一个晶体管器件一起形成具有改进的灵敏度的至少一个图像传感器的方法。 该方法包括在衬底上形成晶体管器件的至少一部分,通过将与晶体管器件分离的预定区域掺杂最小预定距离来形成图像传感器,形成用于覆盖晶体管器件的接触区域的蚀刻停止层 在所述预定区域中去除所述蚀刻停止层的至少一部分以暴露所述图像传感器,以及通过至少一个透明保护层覆盖所述图像传感器和所述晶体管器件。

    System and method to improve image sensor sensitivity
    3.
    发明授权
    System and method to improve image sensor sensitivity 有权
    提高图像传感器灵敏度的系统和方法

    公开(公告)号:US07233050B2

    公开(公告)日:2007-06-19

    申请号:US11419866

    申请日:2006-05-23

    IPC分类号: H01L31/0203

    摘要: A method is disclosed for forming at least one image sensor with improved sensitivity along with at least one transistor device. The method comprises forming at least a portion of the transistor device on a substrate, forming the image sensor by doping a predetermined area separated from the transistor device by a minimum predetermined distance, forming an etch stop layer for covering a contact area of the transistor device, removing at least a portion of the etch stop layer in the predetermined area for exposing the image sensor, and covering the image sensor and the transistor device by at least one transparent protection layer.

    摘要翻译: 公开了一种用于与至少一个晶体管器件一起形成具有改进的灵敏度的至少一个图像传感器的方法。 该方法包括在衬底上形成晶体管器件的至少一部分,通过将与晶体管器件分离的预定区域掺杂最小预定距离来形成图像传感器,形成用于覆盖晶体管器件的接触区域的蚀刻停止层 在所述预定区域中去除所述蚀刻停止层的至少一部分以暴露所述图像传感器,以及通过至少一个透明保护层覆盖所述图像传感器和所述晶体管器件。

    SYSTEM AND METHOD TO IMPROVE IMAGE SENSOR SENSITIVITY
    5.
    发明申请
    SYSTEM AND METHOD TO IMPROVE IMAGE SENSOR SENSITIVITY 有权
    提高图像传感器灵敏度的系统和方法

    公开(公告)号:US20060197171A1

    公开(公告)日:2006-09-07

    申请号:US11419866

    申请日:2006-05-23

    IPC分类号: H01L21/00 H01L31/0203

    摘要: A method is disclosed for forming at least one image sensor with improved sensitivity along with at least one transistor device. The method comprises forming at least a portion of the transistor device on a substrate, forming the image sensor by doping a predetermined area separated from the transistor device by a minimum predetermined distance, forming an etch stop layer for covering a contact area of the transistor device, removing at least a portion of the etch stop layer in the predetermined area for exposing the image sensor, and covering the image sensor and the transistor device by at least one transparent protection layer.

    摘要翻译: 公开了一种用于与至少一个晶体管器件一起形成具有改进的灵敏度的至少一个图像传感器的方法。 该方法包括在衬底上形成晶体管器件的至少一部分,通过将与晶体管器件分离的预定区域掺杂最小预定距离来形成图像传感器,形成用于覆盖晶体管器件的接触区域的蚀刻停止层 在所述预定区域中去除所述蚀刻停止层的至少一部分以暴露所述图像传感器,以及通过至少一个透明保护层覆盖所述图像传感器和所述晶体管器件。