Memory having self-timed bit line boost circuit and method therefor
    1.
    发明授权
    Memory having self-timed bit line boost circuit and method therefor 有权
    具有自定时位线升压电路的存储器及其方法

    公开(公告)号:US07800959B2

    公开(公告)日:2010-09-21

    申请号:US12233922

    申请日:2008-09-19

    IPC分类号: G11C16/00

    摘要: A memory has an array of memory cells, column logic, a write driver, a voltage detector, and a bootstrap circuit. The array of memory cells is coupled to pairs of bit lines and word lines. The column logic is coupled to the array and is for coupling a selected pair of bit lines to a pair of data lines. The write driver is coupled to the pair of data lines. The voltage detector provides an initiate boost signal when a voltage of a first data line of the pair of data lines drops below a first level during the writing of the pair of data lines by the write driver. The bootstrap circuit reduces the voltage of the first data line in response to the boost enable signal. This is particularly beneficial when the number of memory cells on a bit line can vary significantly as in a compiler.

    摘要翻译: 存储器具有存储器单元阵列,列逻辑,写驱动器,电压检测器和自举电路。 存储器单元的阵列耦合到位线对和字线对。 列逻辑耦合到阵列,并用于将选定的一对位线耦合到一对数据线。 写驱动器耦合到该对数据线。 当写入驱动器在一对数据线的写入期间,当一对数据线的第一数据线的电压下降到低于第一电平时,电压检测器提供启动升压信号。 自举电路响应于升压使能信号而降低第一数据线的电压。 当编译器中的位线上的存储单元数量可能显着变化时,这是特别有益的。

    Memory having a dummy bitline for timing control
    2.
    发明授权
    Memory having a dummy bitline for timing control 有权
    具有用于定时控制的虚拟位线的存储器

    公开(公告)号:US07746716B2

    公开(公告)日:2010-06-29

    申请号:US11677808

    申请日:2007-02-22

    IPC分类号: G11C7/00 G11C7/02 G11C8/00

    CPC分类号: G11C7/22 G11C7/227

    摘要: A memory having at least one memory array block, the at least one memory array block comprising N wordlines, wherein N is greater than one, is provided. The memory comprises a plurality of sense amplifiers coupled to the at least one memory array block. The memory further comprises at least one dummy bitline, wherein the at least one dummy bitline comprises M dummy bitcells, wherein M is equal to N. The memory further comprises a timing circuit coupled to the at least one dummy bitline, wherein the timing circuit comprises at least one stack of pull-down transistors coupled to a sense circuit for generating a latch control output signal used for timing control of memory accesses. Timing control may include generating a sense trigger signal to enable the plurality of sense amplifiers for read operations and/or generating a local reset signal for terminating memory accesses, such as disabling the plurality of write drivers for write operations.

    摘要翻译: 一种具有至少一个存储器阵列块的存储器,提供了包括N个字线的至少一个存储器阵列块,其中N大于1。 存储器包括耦合到至少一个存储器阵列块的多个读出放大器。 所述存储器还包括至少一个伪位线,其中所述至少一个伪位线包括M个伪位单元,其中M等于N。所述存储器还包括耦合到所述至少一个虚拟位线的定时电路,其中所述定时电路包括 耦合到感测电路的至少一叠下拉晶体管,用于产生用于存储器存取定时控制的锁存控制输出信号。 定时控制可以包括产生感测触发信号以使多个读出放大器能够进行读取操作和/或产生用于终止存储器访问的本地复位信号,例如禁用多个写入驱动器进行写入操作。

    Memory having looped global data lines for propagation delay matching
    3.
    发明授权
    Memory having looped global data lines for propagation delay matching 失效
    具有循环全局数据线以用于传播延迟匹配的存储器

    公开(公告)号:US5400274A

    公开(公告)日:1995-03-21

    申请号:US236845

    申请日:1994-05-02

    IPC分类号: G11C7/10 G11C5/06

    CPC分类号: G11C7/10

    摘要: A synchronous memory (50) having a looped global data line (80) reduces a difference between minimum and maximum propagation delays between different locations in a memory array (51) during a read cycle of the memory (50). The looped global data line (80) has a first portion (80') and a second portion (80"). The first portion (80') extends along an edge of the memory array (51) in a direction substantially parallel to a direction of the word lines of the array (51). Sense amplifiers (73-78) are coupled to the first portion (80') of the looped global data line (80). At one end of the array (51), the second portion (80") of the looped global data line extends back in an opposite direction to the first portion (80') and is coupled to output data circuits (84). Reducing the difference in propagation delays improves noise margins and allows increased operating speed.

    摘要翻译: 具有循环全局数据线(80)的同步存储器(50)在存储器(50)的读取周期期间减少存储器阵列(51)中的不同位置之间的最小和最大传播延迟之间的差异。 环路全局数据线(80)具有第一部分(80')和第二部分(80“)。 第一部分(80')沿着与阵列(51)的字线的方向基本平行的方向沿着存储器阵列(51)的边缘延伸。 感测放大器(73-78)耦合到环路全局数据线(80)的第一部分(80')。 在阵列(51)的一端,环形全局数据线的第二部分(80“)在与第一部分(80')相反的方向上延伸并耦合到输出数据电路(84)。 降低传播延迟的差异可以提高噪音容限,并提高运行速度。

    Power-on reset circuit for preventing multiple word line selections
during power-up of an integrated circuit memory
    4.
    发明授权
    Power-on reset circuit for preventing multiple word line selections during power-up of an integrated circuit memory 失效
    上电复位电路,用于在集成电路存储器上电期间防止多个字线选择

    公开(公告)号:US5477176A

    公开(公告)日:1995-12-19

    申请号:US253076

    申请日:1994-06-02

    摘要: A power-on reset circuit (30) for a memory (20) includes a DC model circuit (39), an N.sub.BIAS check circuit (64), and a NAND logic gate (71). A logic low power-on reset signal is provided at power-up of the memory (20) to establish initial conditions in a clock circuit (29) and in row and column predecoders/latches (24, 27). When the power supply voltage, a bandgap reference voltage, and a bias voltage all reach their predetermined voltages, the power-on reset circuit (30) provides a logic high power-on reset signal. In this manner, the power-on reset circuit (30) is assured of providing a logic low power-on reset signal until all of the proper voltage levels are reached. In addition, the power-on reset circuit models a DC circuit equivalent of an address buffer circuit (79) for compensating for process and temperature variations.

    摘要翻译: 用于存储器(20)的上电复位电路(30)包括DC模型电路(39),NBIAS校验电路(64)和NAND逻辑门(71)。 在存储器(20)的上电时提供逻辑低电源复位信号,以在时钟电路(29)和行和列预解码器/锁存器(24,27)中建立初始条件。 当电源电压,带隙参考电压和偏置电压都达到其预定电压时,上电复位电路(30)提供逻辑高的上电复位信号。 以这种方式,确保上电复位电路(30)提供逻辑低功率复位信号,直到达到所有适当的电压电平。 此外,上电复位电路为等效于地址缓冲电路(79)的DC电路建模,用于补偿过程和温度变化。

    Memory having bit line load with automatic bit line precharge and
equalization
    5.
    发明授权
    Memory having bit line load with automatic bit line precharge and equalization 失效
    具有自动位线预充电和均衡的位线负载的存储器

    公开(公告)号:US5416744A

    公开(公告)日:1995-05-16

    申请号:US207515

    申请日:1994-03-08

    IPC分类号: G11C11/41 G11C7/12 G11C7/00

    CPC分类号: G11C7/12

    摘要: A bit line load (380) is coupled to a bit line pair and includes bipolar pull up transistors (389, 403), P-channel load transistors (390, 404), a NAND logic gate (395), and a P-channel equalization transistor. The NAND logic gate (395) senses a differential voltage on the bit line pair, and provides an equalization signal. When a write control signal indicates the end of a write cycle, the equalization signal initiates precharge and equalization of the bit line pair.

    摘要翻译: 位线负载(380)耦合到位线对,并且包括双极上拉晶体管(389,403),P沟道负载晶体管(390,404),NAND逻辑门(395)和P沟道 均衡晶体管。 NAND逻辑门(395)感测位线对上的差分电压,并提供均衡信号。 当写控制信号指示写周期结束时,均衡信号启动位线对的预充电和均衡。

    Pipelined memory having synchronous and asynchronous operating modes
    6.
    发明授权
    Pipelined memory having synchronous and asynchronous operating modes 失效
    流水线存储器具有同步和异步操作模式

    公开(公告)号:US5384737A

    公开(公告)日:1995-01-24

    申请号:US207509

    申请日:1994-03-08

    IPC分类号: G11C7/10 G11C29/14 G11C13/00

    摘要: A pipelined memory (20) has a synchronous operating mode and an asynchronous operating mode. The memory (20) includes output registers (34) and output enable registers (48) which are used to electrically switch between the asynchronous operating mode and the synchronous operating mode. In addition, in the synchronous operating mode, the depth of pipelining can be changed between a three stage pipeline and a two stage pipeline. By changing the depth of pipelining, the memory (20) can operate using a greater range of clock frequencies. In addition, the operating frequency can be changed to facilitate testing and debugging of the memory (20).

    摘要翻译: 流水线存储器(20)具有同步操作模式和异步操作模式。 存储器(20)包括用于在异步操作模式和同步操作模式之间电切换的输出寄存器(34)和输出使能寄存器(48)。 另外,在同步运行模式中,流水线的深度可以在三段管线和两级管线之间变化。 通过改变流水线的深度,存储器(20)可以使用更大的时钟频率范围来操作。 另外,可以改变操作频率以便于存储器(20)的测试和调试。

    DUAL PORT MEMORY DEVICE
    7.
    发明申请
    DUAL PORT MEMORY DEVICE 有权
    双端口存储器件

    公开(公告)号:US20100232202A1

    公开(公告)日:2010-09-16

    申请号:US12404892

    申请日:2009-03-16

    IPC分类号: G11C5/06 G11C8/16 G11C8/00

    摘要: A multi-port memory device having a storage node, a precharge node, a first, second, third, and fourth transistor, and a control module. The first transistor includes a current electrode connected to the storage node, another current electrode connected to a first bit line, and a gate connected to a first wordline. The second transistor includes a current electrode connected to the storage node, another current electrode connected to a second bit line, and a gate connected to a second wordline. The third transistor includes a current electrode connected to the reference node, another current electrode connected to the first bit line, and a gate. The fourth transistor includes a current electrode connected to the precharge node, another current electrode connected to the second bit line, and a gate. The control module deactivates the fourth transistor in response to a dummy access of the first storage module at the second transistor.

    摘要翻译: 一种具有存储节点,预充电节点,第一,第二,第三和第四晶体管以及控制模块的多端口存储器件。 第一晶体管包括连接到存储节点的电流电极,连接到第一位线的另一电流电极和连接到第一字线的栅极。 第二晶体管包括连接到存储节点的电流电极,连接到第二位线的另一个电流电极和连接到第二字线的栅极。 第三晶体管包括连接到参考节点的电流电极,连接到第一位线的另一电流电极和栅极。 第四晶体管包括连接到预充电节点的电流电极,连接到第二位线的另一电流电极和栅极。 响应于在第二晶体管处的第一存储模块的虚拟访问,控制模块停用第四晶体管。

    Write control for a memory using a delay locked loop
    8.
    发明授权
    Write control for a memory using a delay locked loop 失效
    使用延迟锁定环对内存进行写入控制

    公开(公告)号:US5440514A

    公开(公告)日:1995-08-08

    申请号:US207510

    申请日:1994-03-08

    IPC分类号: G11C7/22 G11C17/10

    CPC分类号: G11C7/222 G11C7/22

    摘要: A memory (20) includes a write control delay locked loop (52) for controlling a write cycle of the memory (20). The delay locked loop (52) includes an arbiter circuit (264), a voltage controlled delay (VCD) circuit (260), and a VCD control circuit (265). The arbiter circuit (264) compares a clock signal to a delayed clock signal from the VCD circuit (260). In response, the arbiter circuit (264) provides a retard signal to the VCD control circuit (265). The VCD control circuit (265) receives the retard signal and adjusts a propagation delay of the delayed clock signal to compensate for changes in the clock frequency, as well as to compensate for process, temperature, and power supply variations.

    摘要翻译: 存储器(20)包括用于控制存储器(20)的写周期的写控制延迟锁定环(52)。 延迟锁定环(52)包括仲裁电路(264),电压控制延迟(VCD)电路(260)和VCD控制电路(265)。 仲裁器电路(264)将时钟信号与来自VCD电路(260)的延迟的时钟信号进行比较。 作为响应,仲裁器电路(264)向VCD控制电路(265)提供延迟信号。 VCD控制电路(265)接收延迟信号并调整延迟的时钟信号的传播延迟以补偿时钟频率的变化,以及补偿处理,温度和电源变化。

    MEMORY HAVING A DUMMY BITLINE FOR TIMING CONTROL
    9.
    发明申请
    MEMORY HAVING A DUMMY BITLINE FOR TIMING CONTROL 有权
    具有时序控制功能的内存

    公开(公告)号:US20080205176A1

    公开(公告)日:2008-08-28

    申请号:US11677808

    申请日:2007-02-22

    IPC分类号: G11C7/06 G11C7/14

    CPC分类号: G11C7/22 G11C7/227

    摘要: A memory having at least one memory array block, the at least one memory array block comprising N wordlines, wherein N is greater than one, is provided. The memory comprises a plurality of sense amplifiers coupled to the at least one memory array block. The memory further comprises at least one dummy bitline, wherein the at least one dummy bitline comprises M dummy bitcells, wherein M is equal to N. The memory further comprises a timing circuit coupled to the at least one dummy bitline, wherein the timing circuit comprises at least one stack of pull-down transistors coupled to a sense circuit for generating a latch control output signal used for timing control of memory accesses. Timing control may include generating a sense trigger signal to enable the plurality of sense amplifiers for read operations and/or generating a local reset signal for terminating memory accesses, such as disabling the plurality of write drivers for write operations.

    摘要翻译: 一种具有至少一个存储器阵列块的存储器,提供了包括N个字线的至少一个存储器阵列块,其中N大于1。 存储器包括耦合到至少一个存储器阵列块的多个读出放大器。 所述存储器还包括至少一个伪位线,其中所述至少一个伪位线包括M个伪位单元,其中M等于N。所述存储器还包括耦合到所述至少一个虚拟位线的定时电路,其中所述定时电路包括 耦合到感测电路的至少一叠下拉晶体管,用于产生用于存储器存取定时控制的锁存控制输出信号。 定时控制可以包括产生感测触发信号以使多个读出放大器能够进行读取操作和/或产生用于终止存储器访问的本地复位信号,例如禁用多个写入驱动器进行写入操作。

    Latching ECL to CMOS input buffer circuit
    10.
    发明授权
    Latching ECL to CMOS input buffer circuit 失效
    将ECL锁存到CMOS输入缓冲电路

    公开(公告)号:US5426381A

    公开(公告)日:1995-06-20

    申请号:US247819

    申请日:1994-05-23

    IPC分类号: H03K3/356 H03K19/01

    摘要: A latching ECL to CMOS input buffer (20) has an input buffer (21) for receiving an ECL input signal, a CMOS latch (35), and driver circuits (55, 65). Transmission gates (31, 32) are used to couple the input buffer (21) to the latch (35) in response to a CMOS clock signal being a logic low. The driver circuits (55, 65) are coupled to transmission gates (31, 32). While the clock signal is a logic low, input nodes of the first and second driver circuits (55, 65) are precharged to a relatively high voltage in order to isolate the input signal from the first and second driver circuits (55, 65). The latch (35) both latches the logic state of the ECL input signal and converts the ECL input signal to CMOS logic levels. This allows an input signal to be latched and level converted within a relatively short period of time.

    摘要翻译: CMOS输入缓冲器(20)的锁存ECL具有用于接收ECL输入信号的输入缓冲器(21),CMOS锁存器(35)和驱动器电路(55,65)。 响应于CMOS时钟信号为逻辑低,传输门(31,32)用于将输入缓冲器(21)耦合到锁存器(35)。 驱动电路(55,65)耦合到传输门(31,32)。 当时钟信号为逻辑低电平时,第一和第二驱动电路(55,65)的输入节点被预充电到较高的电压,以隔离来自第一和第二驱动电路(55,65)的输入信号。 锁存器(35)都锁存ECL输入信号的逻辑状态,并将ECL输入信号转换为CMOS逻辑电平。 这允许输入信号在相对短的时间段内被锁存和电平转换。