摘要:
Provided are an apparatus for measuring impurities on a wafer and a method of measuring impurities on a wafer. The apparatus includes: a wafer aligning device for aligning a wafer; a loading robot for moving and loading the aligned wafer; a rotation stage for rotating the loaded wafer; a scan robot for holding a natural oxide layer etching solution for the wafer and a metallic impurity recovery solution; and a container for receiving a predetermined etching solution and a recovery solution, wherein the scan robot removes an oxide layer on an edge region of the wafer.
摘要:
The present invention relates to an apparatus and a method for measuring an in phase and quadrature (IQ) imbalance. One embodiment according to the present general inventive concept can provide a method for measuring a Tx IQ imbalance generated in an IQ up-conversion mixer and an Rx IQ imbalance generated in an IQ down-conversion mixer, that includes measuring a first IQ imbalance corresponding to a first combination of the Rx IQ imbalance with the Tx IQ imbalance, measuring a second IQ imbalance corresponding to a second combination of the Rx IQ imbalance with the Tx IQ imbalance and obtaining the Tx IQ imbalance and the Rx IQ imbalance from the first IQ imbalance and the second IQ imbalance.
摘要:
A method and apparatus for dynamic resource allocation in a system having at least one processing unit are disclosed. The method of dynamic resource allocation includes receiving information on a task to which resources are allocated and partitioning the task into one or more task parallel units; converting the task into a task block having a polygonal shape according to expected execution times of the task parallel units and dependency between the task parallel units; allocating resources to the task block by placing the task block on a resource allocation plane having a horizontal axis of time and a vertical axis of processing units; and executing the task according to the resource allocation information. Hence, CPU resources and GPU resources in the system can be used in parallel at the same time, increasing overall system efficiency.
摘要:
A virtualization system for supporting at least two operating systems and resource allocation method of the virtualization system are provided. The method includes allocating resources to the operating systems, calculating, when one of the operating systems is running, workloads for each operating system, and adjusting resources allocated to the operating systems according to the calculated workloads. The present invention determines the workloads of a plurality of operating systems running in the virtualization system and allocates time resources dynamically according to the variation of the workloads.
摘要:
A method and apparatus for controlling traffic of multiprocessor system or multi-core system is provided. The traffic control apparatus of a multiprocessor system according to the present invention includes a request handler for processing a traffic request of a first processor, and a Quality of Service (QoS) manager for receiving a QoS guaranty start instruction for a second processor from the multiprocessor system, and for transmitting, when traffic of the second processor is detected, a traffic adjustment signal to the request handler. The request handler adjusts the traffic of the first processor according to the received traffic adjustment signal. The traffic control method and apparatus of the present invention is capable of adjusting the required bandwidths of individual technologies and guaranteeing the real-timeness in the multiprocessor system or multi-core system.
摘要:
The present general inventive concept relates to apparatuses and/or methods for measuring an in-phase and quadrature (IQ) imbalance. In one embodiment, a detector can measure an error caused by an IQ imbalance using a first IQ signal including a desired signal and a corresponding image signal by the IQ imbalance. The detector can include a derotator to derotate the first IQ signal by a first angular frequency to obtain a second IQ signal and derotate the first IQ signal by a second angular frequency to obtain a third IQ signal, a DC estimator to obtain a fourth IQ signal corresponding to a DC component of the second IQ signal and a fifth IQ signal corresponding to a DC component of the third IQ signal and a controller can determine a gain error or a phase error from the fourth IQ signal and the fifth IQ signal.
摘要:
Provided are a portable multi-view image acquisition system and a multi-view image preprocessing method. The portable multi-view image acquisition system may include: a portable studio including a plurality of cameras movable up, down, left and right; and a preprocessor performing a preprocessing including a subject separation from a multi-view image that is photographed by the plurality of cameras.
摘要:
A noncontact method for measuring currents flowing through superconductive wires connected in parallel is provided. The method includes arranging hall sensors for measuring voltage levels based on magnetic fields generated around the superconductive wires, setting a matrix relation between the measured voltage values, values of currents flowing through the superconductive wires, and a variable matrix having variables defining relations between the voltage values and the current values, applying predetermined current levels to the superconductive wires a number of times and measuring voltage values through the hall sensors, substituting the predetermined current values and the measured voltage values into the matrix relation to calculate the variables of the variable matrix, and substituting the calculated variable matrix and unknown voltage values, measured by the hall sensors when unknown currents flow through the superconductive wires, into the matrix relation to calculate values of the unknown currents flowing through the superconductive wires.
摘要:
Provided is a method of identifying crystal defect regions of monocrystalline silicon using metal contamination and heat treatment. In the method, a sample in the shape of a silicon wafer or a slice of monocrystalline silicon ingot is prepared. At least one side of the sample is contaminated with metal at a contamination concentration of about 1×1014 to 5×1016 atoms/cm2. The contaminated sample is heat-treated. The contaminated side or the opposite side of the heat-treated sample is observed to identify a crystal defect region. The crystal defect region can be analyzed accurately, easily and quickly without the use of an additional check device, without depending on the concentration of oxygen in the monocrystalline silicon.
摘要:
A method for providing knowledge includes creating a three-dimensional virtual space, generating temporal and spatial information including knowledge and space information concerning the three-dimensional virtual space at a specific time point, and associating the temporal and spatial information with the three-dimensional virtual space to be stored in a memory. The creating the three-dimensional virtual space may be created based on a map or a two-dimensional image.