Electrostatic chuck electrical balancing circuit repair
    3.
    发明授权
    Electrostatic chuck electrical balancing circuit repair 有权
    静电卡盘电气平衡电路维修

    公开(公告)号:US08320099B2

    公开(公告)日:2012-11-27

    申请号:US13297203

    申请日:2011-11-15

    IPC分类号: H01L21/683 H01T23/00

    摘要: The present invention includes methods and apparatus for repairing an electrical connection between bipolar electrodes contained within an electrostatic chuck and a conductive mask disposed atop the electrostatic chuck, known as a balancing circuit. Embodiments of the invention are particularly useful after removal of an electrostatic chuck for refurbishment.

    摘要翻译: 本发明包括用于修复包含在静电卡盘内的双极电极之间的电连接的方法和装置以及设置在静电卡盘上方的导电掩模,称为平衡电路。 在移除用于翻新的静电卡盘之后,本发明的实施例是特别有用的。

    Electrostatic chuck electrical balancing circuit repair
    4.
    发明授权
    Electrostatic chuck electrical balancing circuit repair 有权
    静电卡盘电气平衡电路维修

    公开(公告)号:US08064185B2

    公开(公告)日:2011-11-22

    申请号:US12205428

    申请日:2008-09-05

    IPC分类号: H01L21/683 H01T23/00

    摘要: The present invention includes methods and apparatus for repairing an electrical connection between bipolar electrodes contained within an electrostatic chuck and a conductive mask disposed atop the electrostatic chuck, known as a balancing circuit. Embodiments of the invention are particularly useful after removal of an electrostatic chuck for refurbishment.

    摘要翻译: 本发明包括用于修复包含在静电卡盘内的双极电极之间的电连接的方法和装置以及设置在静电卡盘上方的导电掩模,称为平衡电路。 在移除用于翻新的静电卡盘之后,本发明的实施例特别有用。

    Wafer heater assembly
    7.
    发明授权
    Wafer heater assembly 失效
    晶圆加热器总成

    公开(公告)号:US5796074A

    公开(公告)日:1998-08-18

    申请号:US565185

    申请日:1995-11-28

    CPC分类号: C23C14/50 C23C16/4586

    摘要: A wafer heater assembly (8) for a deposition/etch chamber (2) includes a base (32) and a wafer support or chuck (36), having a wafer-chucking surface (76), spaced apart from the base by a circumferential barrier support (38). A heater sub-assembly (54) is mounted to the wafer support. Bolts (48) are used to secure the wafer support to the base with the barrier support therebetween to press the barrier support against an elastomeric O-ring, a metal V-seal or other fluid seal (46) positioned between the base and base end (42) of the barrier support. This eliminates the need to discard the entire heater assembly if the dielectric wafer-chucking surface becomes damaged. The temperature of the fluid seal is about 50.degree.-70.degree. C. lower than the temperature of the wafer-chucking surface when the wafer-chucking surface is about 200.degree.-300.degree. C.

    摘要翻译: 用于沉积/蚀刻室(2)的晶片加热器组件(8)包括基部(32)和具有晶片夹持表面(76)的晶片支撑或卡盘(36),所述晶片夹持表面与基部间隔开圆周 屏障支撑(38)。 加热器子组件(54)安装到晶片支撑件上。 螺栓(48)用于将晶片支撑件固定到底座上,其间具有阻挡支撑件,以将阻挡支撑件压靠在弹性体O形环,金属V形密封件或位于基部和基端之间的其它流体密封件(46) (42)。 这就消除了如果介质晶片夹紧表面损坏,则放弃整个加热器组件的需要。 当晶片夹紧表面约为200-300℃时,流体密封件的温度比晶片夹持表面的温度低约50-70℃。

    Electrostatic chuck and methods of use thereof
    10.
    发明授权
    Electrostatic chuck and methods of use thereof 有权
    静电吸盘及其使用方法

    公开(公告)号:US08559159B2

    公开(公告)日:2013-10-15

    申请号:US13198204

    申请日:2011-08-04

    IPC分类号: H01T23/00

    摘要: An electrostatic chuck and method of use thereof is provided herein. In some embodiments, an electrostatic chuck may include a disk having a first side to support a substrate thereon and a second side, opposing the first side, to provide an interface to selectively couple the disk to a thermal control plate, a first electrode disposed within the disk proximate the first side to electrostatically couple the substrate to the disk and a second electrode disposed within the disk proximate the opposing side of the disk to electrostatically couple the disk to the thermal control plate. In some embodiments, the second electrode may also be configured to heat the disk.

    摘要翻译: 本文提供了静电卡盘及其使用方法。 在一些实施例中,静电卡盘可以包括具有支撑其上的基板的第一侧的盘和与第一侧相对的第二侧,以提供用于选择性地将盘耦合到热控制板的界面,第一电极设置在 靠近第一侧的盘,以将衬底静电耦合到盘,以及设置在靠近盘的相对侧的盘内的第二电极,以将盘静电耦合到热控制板。 在一些实施例中,第二电极也可以被配置为加热盘。