摘要:
A method and system for increasing the expected availability of fast-delivery offers to customers. A method may include identifying a total number of units of a plurality of items to be stored in one or more fulfillment centers. In some cases, the items may be a product or a group of products. The method may also include receiving an order forecast of expected orders for each of the plurality of items and determining, for each of the plurality of items, a portion of the expected orders that is expected to be fulfilled by the one or more fulfillment centers. The method may then include calculating based, at least in part, on the total number of units, the order forecast, and the portion of the expected orders, a target inventory of each of the plurality of items that increases an expected availability of a given delivery offer to future customers.
摘要:
In various embodiments, approaches for the placement of inventory in a materials handling facility are described. A virtual representation of a plurality of storage locations in a materials handling facility is maintained in a computer system. Each one of a plurality of inventory items is assigned to a corresponding storage location in the virtual representation. A first portion of the inventory items is stocked, and a second portion of the inventory items is unstocked. Each of the assignments is associated with a profit value. An event related to a change in state of the materials handling facility is input into the computer system. Each one of the second portion of the inventory items is reassigned in the computer system to a corresponding storage location in the virtual representation.
摘要:
A method and system for inventory placement according to expected item picking rates. In one embodiment, a method may include determining a respective expected picking rate for each of a number of inventory items, and dependent upon the expected picking rate, selecting a corresponding one of a number of zones of an inventory storage area for each of the items. The zones may be physically arranged within the inventory storage area such that a first, innermost zone is successively and at least partially surrounded by one or more other zones. The method may further include storing each of the items within the corresponding zones, such that the expected picking rates of members of a given group of items stored in a given zone are less than the expected picking rates of members of another group of items stored in a successive zone that at least partially surrounds the given zone.
摘要:
The present invention relates to an extreme low formaldehyde emission UF resin with a novel structure, and a process for its preparation. This UF resin is produced from formaldehyde, urea, a long chain multi-aldehyde prepolymer, and some modifiers. Its process follows three steps: weak caustic, weak acid and weak caustic. By using this prepolymer, the modified UF resin has stable alkyl ether structure, and the residual aldehyde groups on the UF polymer chain could accelerate cross-linking instead of dissociative formaldehyde. The UF resin made from this invention has extreme low dissociative formaldehyde and simple technology. The boards produced from this resin have good physical performance and water resistance. Moreover, the formaldehyde emission of the boards is extreme low, achieving Japan F⋆⋆⋆⋆ grade, the average emission value≦0.3 mg/L.
摘要:
A method and system for inventory placement according to expected item picking rates. In one embodiment, a method may include determining a respective expected picking rate for each of a number of inventory items, and dependent upon the expected picking rate, selecting a corresponding one of a number of zones of an inventory storage area for each of the items. The zones may be physically arranged within the inventory storage area such that a first, innermost zone is successively and at least partially surrounded by one or more other zones. The method may further include storing each of the items within the corresponding zones, such that the expected picking rates of members of a given group of items stored in a given zone are less than the expected picking rates of members of another group of items stored in a successive zone that at least partially surrounds the given zone.
摘要:
Described are methods and circuits for identifying defective device layers and localizing defects. Production PLD tests extract statistically significant data relating failed interconnect resources to the associated conductive metal layer. Failure data thus collected is then analyzed periodically to identify layer-specific problems. Test circuits in accordance with some embodiments employ interconnect resources heavily weighted in favor of specific conductive layers to provide improved layer-specific failure data. Some such test circuits are designed to identify open defects, while others are designed to identify short defects.
摘要:
An electrically erasable programmable read only memory (EEPROM) comprises a stacked dielectric tunnel oxide region formed between a write transistor and a sense transistor. The tunnel oxide region permits electron tunneling from a floating gate electrode of a sense transistor to the write transistor. The tunnel oxide region includes a first region that has a single dielectric layer optimized for data retention requirements. The tunnel oxide region also includes a second region having a stacked structure optimized for programming speed and comprising a relatively thin first dielectric layer and a second high-K dielectric layer formed thereon.
摘要:
A non-volatile memory device includes a floating-gate electrode overlying a tunnel oxide layer. A portion of the floating-gate electrode forms the control gate electrode for a sense transistor that is used to determine the presence of charge on the floating-gate electrode. A composite insulation layer overlies the floating-gate electrode. The composite insulation layer includes a dielectric layer, a doped insulating layer overlying the dielectric layer, and a planarization layer overlying the doped insulating layer. The thicknesses of the dielectric layer and the doped insulating layer are precisely determined, such that the doped insulating layer getters mobile ions, such as hydrogen ions, away from the floating-gate electrode, while not capacitively coupling with the floating-gate electrode. In a preferred embodiment of the invention, the dielectric layer has a thickness of about 450 to about 550 Å, and the doped insulating layer has a thickness of about 2900 to about 3100 Å, and the planarization layer has a thickness of about 6000 to 8000 Å.
摘要:
A method of forming a region of impurity in a semiconductor substrate with minimal damage. The method includes the steps of: forming a reaction-inhibiting impurity region in the semiconductor substrate to a depth below the semiconductor substrate; and applying laser energy to the semiconductor substrate at a sufficient magnitude to liquify the semiconductor substrate in the region.
摘要:
A semiconductor device having an EEPROM array includes resistive elements capable of elevating the temperature of the EEPROM array during programming and erasing operations. The resistive elements are located in close proximity to individual EEPROM cells within an EEPROM array. By elevating the temperature of the EEPROM cell during programming and erasing operations, data errors associated with shifting threshold voltages of floating-gate devices within the EEPROM is reduced. An operating method for improving the long term reliability of an EEPROM device includes the step of providing thermal energy during programming and erasing sufficient to raise the temperature of the EEPROM device to at least about 70.degree. C.