On-axis detector for charged particle beam system
    3.
    发明授权
    On-axis detector for charged particle beam system 有权
    用于带电粒子束系统的轴上探测器

    公开(公告)号:US08759764B2

    公开(公告)日:2014-06-24

    申请号:US13538851

    申请日:2012-06-29

    IPC分类号: H01J37/256

    摘要: A split grid multi-channel secondary particle detector for a charged particle beam system includes a first grid segment and a second grid segment, each having independent bias voltages creating an electric field such that the on-axis secondary particles that are emitted from the target are directed to one of the grids. The bias voltages of the grids can be changed or reversed so that each grid can be used to detect the secondary particles and the multi-channel particle detector as a whole can extend its lifetime.

    摘要翻译: 用于带电粒子束系统的分裂网格多通道二次粒子检测器包括第一栅格区段和第二栅极区段,每个区段具有独立的偏置电压,从而产生电场,使得从靶发射的轴上二次颗粒为 指向其中一个网格。 网格的偏置电压可以改变或反转,以便每个网格可以用于检测次级粒子,并且多通道粒子检测器作为一个整体可以延长其寿命。

    On-Axis Detector for Charged Particle Beam System
    10.
    发明申请
    On-Axis Detector for Charged Particle Beam System 有权
    带电粒子束系统的轴上检测器

    公开(公告)号:US20140001357A1

    公开(公告)日:2014-01-02

    申请号:US13538851

    申请日:2012-06-29

    IPC分类号: H01J37/26

    摘要: A split grid multi-channel secondary particle detector for a charged particle beam system includes a first grid segment and a second grid segment, each having independent bias voltages creating an electric field such that the on-axis secondary particles that are emitted from the target are directed to one of the grids. The bias voltages of the grids can be changed or reversed so that each grid can be used to detect the secondary particles and the multi-channel particle detector as a whole can extend its lifetime.

    摘要翻译: 用于带电粒子束系统的分裂网格多通道二次粒子检测器包括第一栅格区段和第二栅极区段,每个区段具有独立的偏置电压,从而产生电场,使得从靶发射的轴上二次颗粒为 指向其中一个网格。 网格的偏置电压可以改变或反转,以便每个网格可以用于检测次级粒子,并且多通道粒子检测器作为一个整体可以延长其寿命。