ARRAY SUBSTRATE, DISPLAY PANEL, DISPLAY DEVICE AND METHOD FOR DESIGNING DISPLAY PANEL

    公开(公告)号:US20200219456A1

    公开(公告)日:2020-07-09

    申请号:US15753340

    申请日:2017-07-13

    摘要: An array substrate, a display panel, a display device and a method for designing the display panel are provided. The array substrate includes a plurality of pixel units, wherein each of the pixel units includes a plurality of sub-pixels, each of the sub-pixels includes a pixel electrode, and the pixel electrode includes a plurality of strip-shaped sub-pixel electrodes arranged in a comb-teeth form, and the sub-pixels of one of the pixel units include at least two sub-pixels. A width of the strip-shaped sub-pixel electrode of any one of the at least two sub-pixels is different from a width of the strip-shaped sub-pixel electrode of any other one of the at least two sub-pixels, and/or an interval between the strip-shaped sub-pixel electrodes of any one of the at least two sub-pixels is different from an interval between the strip-shaped sub-pixel electrodes of any other one of the at least two sub-pixels.

    MEASURING DEVICE AND METHOD FOR SUBSTRATE WARPING AMOUNT

    公开(公告)号:US20180051981A1

    公开(公告)日:2018-02-22

    申请号:US15658630

    申请日:2017-07-25

    发明人: Xuebing JIANG

    IPC分类号: G01B11/16

    摘要: A measuring device and method for a substrate warping amount includes a first substrate and a second substrate disposed oppositely. The measuring device includes a light source, a measuring eyepiece and a processor. The light source is configured to emit a monochromatic light to a region to be measured of the display motherboard, and form a Newton ring interference pattern. The measuring eyepiece is configured to acquire the Newton ring interference pattern and measure a diameter and a corresponding order number of each interference fringe in the Newton ring interference pattern. The processor is connected to the measuring eyepiece and configured to obtain a thickness of an air layer at each interference fringe according to the diameter and the corresponding order number of each interference fringe and a wavelength of the monochromatic light, to obtain a warping amount of the region to be measured of the display motherboard.