公开(公告)号：US20160049511A1

公开(公告)日：2016-02-18

申请号：US14826439

申请日：2015-08-14

申请人： Jin-Bum KIM ,  Seok-Hoon KIM ,  Chul KIM ,  Kwan-Heum LEE ,  Byeong-Chan LEE ,  Cho-Eun LEE ,  Su-Jin JUNG ,  Bon-Young KOO

发明人： Jin-Bum KIM ,  Seok-Hoon KIM ,  Chul KIM ,  Kwan-Heum LEE ,  Byeong-Chan LEE ,  Cho-Eun LEE ,  Su-Jin JUNG ,  Bon-Young KOO

IPC分类号： H01L29/78 ,  H01L29/423 ,  H01L29/06 ,  H01L29/32

CPC分类号： H01L29/7848 ,  H01L21/3221 ,  H01L29/165 ,  H01L29/32 ,  H01L29/66545 ,  H01L29/66636 ,  H01L29/785

摘要： Provided are semiconductor devices that include an active pattern on a substrate, first and second gate electrodes on the active pattern and arranged in a first direction relative to one another and a first source/drain region in a first trench that extends into the active pattern between the first and second gate electrodes. The first source/drain region includes a first epitaxial layer that is configured to fill the first trench and that includes at least one plane defect that originates at a top portion of the first epitaxial layer and extends towards a bottom portion of the first epitaxial layer.

摘要翻译： 提供了在衬底上包括有源图案的半导体器件，在有源图案上的第一和第二栅电极，并且相对于彼此在第一方向上布置，并且第一沟槽中的第一源/漏区延伸到有源图案之间 第一和第二栅电极。 第一源极/漏极区域包括第一外延层，其被配置为填充第一沟槽并且包括起始于第一外延层的顶部并延伸朝向第一外延层的底部的至少一个平面缺陷。

公开(公告)号：US20110241653A1

公开(公告)日：2011-10-06

申请号：US12970921

申请日：2010-12-16

申请人： Chul KIM

发明人： Chul KIM

IPC分类号： G01R25/00

CPC分类号： H03K19/0005

摘要： An impedance calibration apparatus of a semiconductor integrated circuit includes: a D/A conversion unit configured to receive a code and generate an analog voltage depending on the code; a virtual code voltage generation unit configured to detect a level of the analog voltage and generate a plurality of virtual code voltages based on the level of the analog voltage; a comparison unit configured to receive the plurality of virtual code voltages and a reference voltage as inputs, and compare the plurality of virtual code voltages with the reference voltage to generate a plurality of comparison signals; and a code generation unit configured to receive the plurality of comparison signals and generate the code using the plurality of comparison signals.

摘要翻译： 半导体集成电路的阻抗校准装置包括：D / A转换单元，被配置为接收代码并根据代码生成模拟电压; 虚拟代码电压生成单元，被配置为基于模拟电压的电平来检测模拟电压的电平并生成多个虚拟代码电压; 比较单元，被配置为接收所述多个虚拟代码电压和参考电压作为输入，并且将所述多个虚拟代码电压与所述参考电压进行比较以生成多个比较信号; 以及代码生成单元，被配置为接收所述多个比较信号，并使用所述多个比较信号生成所述代码。

公开(公告)号：US20130038569A1

公开(公告)日：2013-02-14

申请号：US13312144

申请日：2011-12-06

申请人： Chul KIM ,  Su-Bin PARK ,  Seung Hwan MOON ,  Byoung Jun LEE

发明人： Chul KIM ,  Su-Bin PARK ,  Seung Hwan MOON ,  Byoung Jun LEE

IPC分类号： G06F3/044 ,  G06F3/045

CPC分类号： G06F3/044 ,  G06F3/0412 ,  G06F2203/04103

摘要： A display device includes: a first insulation substrate having an upper surface and a lower surface; a transparent conductive layer disposed on the upper surface of the first insulation substrate; a gate line disposed on the lower surface of the first insulation substrate; a gate insulating layer disposed on the gate line; a semiconductor layer disposed on the gate insulating layer; a data line disposed on the semiconductor layer and connected to a source electrode and a drain electrode facing the source electrode; and a pixel electrode electrically connected to the drain electrode, where the gate line, the gate insulating layer, the semiconductor layer and the data line are sequentially disposed on the lower surface of the first insulation substrate.

摘要翻译： 显示装置包括：具有上表面和下表面的第一绝缘基板; 设置在所述第一绝缘基板的上表面上的透明导电层; 设置在所述第一绝缘基板的下表面上的栅极线; 设置在栅极线上的栅极绝缘层; 设置在所述栅极绝缘层上的半导体层; 数据线，设置在所述半导体层上，并连接到面对所述源电极的源电极和漏电极; 以及与所述漏电极电连接的像素电极，其中所述栅极线，所述栅极绝缘层，所述半导体层和所述数据线依次配置在所述第一绝缘基板的下表面上。

公开(公告)号：US20130265244A1

公开(公告)日：2013-10-10

申请号：US13571459

申请日：2012-08-10

申请人： Chul KIM ,  Su Bin PARK ,  Ji Woong KIM ,  Seung Hwan MOON ,  Nam-Hee GOO ,  Seok-Hyun JUNG

发明人： Chul KIM ,  Su Bin PARK ,  Ji Woong KIM ,  Seung Hwan MOON ,  Nam-Hee GOO ,  Seok-Hyun JUNG

IPC分类号： G06F3/041

CPC分类号： G06F3/0412 ,  G06F3/044

摘要： A display device includes a first substrate including a first surface, on which a touch by an external object occurs, and a second surface opposite to the first surface, a plurality of driving signal lines positioned on the second surface of the first substrate, where the plurality of driving signal lines transmits a driving signal for displaying an image, a plurality of pixels including a plurality of switching elements connected to the plurality of driving signal lines, a sensing signal line positioned on one of the first surface and the second surface of the first substrate, where the sensing signal line transmits a sensing signal generated based on the touch by the external object, and a touch sensor unit including a sensing capacitor defined by at least one driving signal line of the plurality of driving signal lines and the sensing signal line.

摘要翻译： 显示装置包括：第一基板，包括第一表面，外部物体发生触摸，第一表面与第一表面相对的第二表面;位于第一基板的第二表面上的多个驱动信号线， 多个驱动信号线传输用于显示图像的驱动信号，多个像素包括连接到多个驱动信号线的多个开关元件，位于第一表面和第二表面中的一个上的感测信号线 第一基板，其中感测信号线传输基于外部物体的触摸产生的感测信号，以及触摸传感器单元，其包括由多个驱动信号线中的至少一个驱动信号线和感测信号限定的感测电容器 线。

公开(公告)号：US20130234326A1

公开(公告)日：2013-09-12

申请号：US13604481

申请日：2012-09-05

申请人： Chul KIM ,  Jae Jin LEE ,  Jong Chern LEE

发明人： Chul KIM ,  Jae Jin LEE ,  Jong Chern LEE

IPC分类号： H01L23/00 ,  H01L21/82

CPC分类号： H01L23/562 ,  H01L21/82 ,  H01L23/481 ,  H01L24/05 ,  H01L24/13 ,  H01L24/16 ,  H01L25/0657 ,  H01L2224/0401 ,  H01L2224/0557 ,  H01L2224/05571 ,  H01L2224/05572 ,  H01L2224/06181 ,  H01L2224/131 ,  H01L2224/16146 ,  H01L2224/81191 ,  H01L2225/06513 ,  H01L2225/06541 ,  H01L2924/351 ,  H01L2924/00014 ,  H01L2924/00012 ,  H01L2924/014

摘要： A semiconductor apparatus comprises of a first semiconductor chip having a through silicon via (TSV) and a second semiconductor chip also having a TSV, wherein the respective semiconductor chips are stacked vertically and are connected through a conductive connection member without the assistance of an additional bump between the conductive connection member and the second semiconductor chip.

摘要翻译： 半导体装置包括具有贯通硅通孔（TSV）的第一半导体芯片和也具有TSV的第二半导体芯片，其中各个半导体芯片垂直堆叠并通过导电连接构件连接，而无需附加凸块 在导电连接部件和第二半导体芯片之间。

公开(公告)号：US20130088444A1

公开(公告)日：2013-04-11

申请号：US13608167

申请日：2012-09-10

申请人： Chul KIM ,  Ji-Woong KIM ,  Su-Bin PARK ,  Seung-Hwan MOON ,  Byoung-Jun LEE

发明人： Chul KIM ,  Ji-Woong KIM ,  Su-Bin PARK ,  Seung-Hwan MOON ,  Byoung-Jun LEE

IPC分类号： G06F3/041

CPC分类号： G06F3/0416 ,  G02F1/13338 ,  G06F3/044

摘要： A method of driving a touch display panel includes sequentially providing gate signals to a plurality of gate lines, outputting data signals to a plurality of data lines, the data lines being disposed on the first surface and crossing the gate lines, and reading out a first sensing signal through a plurality of sensing lines in response to the gate signals. The gate lines are disposed on a first surface of a base substrate, the touch display panel including the base substrate. The data signals are synchronized with the gate signals. The sensing line is disposed on a second surface of the base substrate, the second surface being opposite to the first surface.

摘要翻译： 驱动触摸显示面板的方法包括向多条栅极线顺序地提供栅极信号，将数据信号输出到多条数据线，数据线被布置在第一表面上并与栅极线交叉，并且读出第一 响应于门信号通过多个感测线感测信号。 栅极线设置在基底基板的第一表面上，触摸显示面板包括基底。 数据信号与门信号同步。 感测线设置在基底基板的第二表面上，第二表面与第一表面相对。

公开(公告)号：US20130206567A1

公开(公告)日：2013-08-15

申请号：US13570141

申请日：2012-08-08

申请人： Won-Ki HONG ,  Seung Ho NAM ,  Chul KIM ,  Hyun-Ju LEE

发明人： Won-Ki HONG ,  Seung Ho NAM ,  Chul KIM ,  Hyun-Ju LEE

IPC分类号： H03K17/98

CPC分类号： G06F3/044

摘要： A touch panel is provided that includes: a substrate; a plurality of X-axis lines disposed on the substrate; a plurality of Y-axis lines crossing the plurality of X-axis lines; and an insulating layer interposed between the X-axis lines and the Y-axis lines, in which at least one first X-axis line and at least one second X-axis line selected from among the plurality of X-axis lines are connected by a first connection portion, and among the plurality of Y-axis lines, a Y-axis line crossing the first X-axis line and the second X-axis line has a first area in a region where the Y-axis line overlaps the first X-axis line and a second area in a region where the Y-axis line overlaps the second X-axis line, and the first area and the second area are different from each other.

摘要翻译： 提供一种触摸面板，其包括：基板; 设置在所述基板上的多个X轴线; 与所述多个X轴线交叉的多个Y轴线; 以及介于X轴线和Y轴线之间的绝缘层，其中从多个X轴线中选择的至少一个第一X轴线和至少一个第二X轴线通过 第一连接部分，并且在所述多个Y轴线之中，与所述第一X轴线和所述第二X轴线交叉的Y轴线具有在所述Y轴线与所述第一连接部分的所述第一 X轴线和Y轴线与第二X轴线重叠的区域中的第二区域，第一区域和第二区域彼此不同。

公开(公告)号：US20120153280A1

公开(公告)日：2012-06-21

申请号：US13041003

申请日：2011-03-04

申请人： Dae-Suk KIM ,  Jong-Chern LEE ,  Chul KIM

发明人： Dae-Suk KIM ,  Jong-Chern LEE ,  Chul KIM

IPC分类号： H01L23/52

CPC分类号： H01L22/34 ,  G01R31/2853 ,  G01R31/2884 ,  H01L23/481 ,  H01L24/05 ,  H01L2225/06544 ,  H01L2225/06596 ,  H01L2924/12032 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/00

摘要： An integrated circuit that detects whether a through silicon via has defects or not, at a wafer level. The integrated circuit includes a semiconductor substrate, a through silicon via configured to be formed in the semiconductor substrate to extend to a certain depth from the surface of the semiconductor substrate, an output pad, and a current path providing unit configured to provide a current, flowing between the semiconductor substrate and the through silicon via, to the output pad during a test mode.

摘要翻译： 在晶圆级别检测贯通硅通孔是否具有缺陷的集成电路。 集成电路包括：半导体衬底;通孔构造成形成在半导体衬底中以从半导体衬底的表面延伸到一定深度的通硅通孔，输出焊盘和电流通路提供单元，其被配置为提供电流， 在测试模式期间，在半导体衬底和贯穿硅通孔之间流动到输出焊盘。

公开(公告)号：US20120025900A1

公开(公告)日：2012-02-02

申请号：US12911138

申请日：2010-10-25

申请人： Chul KIM

发明人： Chul KIM

IPC分类号： G05F1/10

CPC分类号： G11C11/4074 ,  G11C5/143 ,  G11C5/147

摘要： A semiconductor device includes a first internal voltage driving unit configured to drive an internal voltage, a second internal voltage driving unit configured to drive the internal voltage in an operation period corresponding to an enable signal, a current amount detection unit configured to detect amount of current supplied by the first internal voltage driving unit, and a current amount comparison unit configured to compare the amount of detected current by the current amount detection unit with amount of a reference current, and determine whether or not to activate the enable signal in response to a comparison result.

摘要翻译： 一种半导体器件，包括：被配置为驱动内部电压的第一内部电压驱动单元，配置成在与使能信号对应的运行期间内驱动内部电压的第二内部电压驱动单元，被配置为检测电流量的电流量检测单元 由第一内部电压驱动单元提供的电流量比较单元，以及电流量比较单元，被配置为将当前量检测单元的检测电流量与参考电流的量进行比较，并且确定是否响应于 比较结果。

公开(公告)号：US20110156673A1

公开(公告)日：2011-06-30

申请号：US12716836

申请日：2010-03-03

申请人： Chul KIM

发明人： Chul KIM

IPC分类号： G05F1/10

CPC分类号： G05F1/575

摘要： A semiconductor device includes an enable unit configured to enable an output terminal, a feedback unit configured to receive an output of the output terminal and output a feedback signal, an amplifying unit configured to amplify a difference between a reference signal and the feedback signal, and a transfer unit configured to transfer an amplified signal of the amplifying unit as an enable control signal of the enable unit, and to have an output resistance value smaller than an output resistance value of the amplifying unit.

摘要翻译： 半导体器件包括：使能单元，被配置为使能输出端子;反馈单元，被配置为接收输出端子的输出并输出反馈信号;放大单元，被配置为放大参考信号和反馈信号之间的差;以及 传送单元，被配置为传送放大单元的放大信号作为使能单元的使能控制信号，并且具有小于放大单元的输出电阻值的输出电阻值。