公开(公告)号：US5862204A

公开(公告)日：1999-01-19

申请号：US763107

申请日：1996-12-10

申请人： Chul-Soo Kim ,  Hun-Ju Jung ,  Hae-Sook Kim

发明人： Chul-Soo Kim ,  Hun-Ju Jung ,  Hae-Sook Kim

IPC分类号： H04L12/54 ,  H04Q11/04 ,  H04M15/00

CPC分类号： H04L12/5601 ,  H04L43/08 ,  H04L43/16

摘要： An improved rare probability connection call registration method using an incomplete call causation message for an asynchronous transfer mode switching system, which includes the steps of receiving a candidate code from an operator and classifying a normal call and an abnormal call with respect to each call when a call cause message is received, increasing the number of completed calls when the received call is normally completed, and judging whether an incomplete call occurred due to the lack of a switching resource or the busy state of the subscriber at a destination in the case of the abnormal call, terminating the call when the cause of the abnormal call is due to another cause except for the lack of the switching resource, or the on-busy of the subscriber, increasing the number of the incomplete calls when the call is incompletely terminated due to the lack of the switching resource or the on-busy of the subscriber, and checking the call completion ratio, and terminating the call when the call completion ratio is greater than a predetermined threshold value that the operator designated, registering the call as the RPCC, informing the resultant operation of the operator terminal, and requesting a call control with respect to the corresponding code.

摘要翻译： 一种使用异步传输模式切换系统的不完整呼叫原因消息的改进的罕见概率连接呼叫注册方法，其包括以下步骤：从运营商接收候选代码并对正常呼叫进行分类和针对每个呼叫进行异常呼叫 接收到呼叫原因消息，当接收到的呼叫正常完成时增加完成的呼叫的数量，并且在目的地的情况下判断由于缺少交换资源还是目的地的用户的忙碌状态而发生不完整的呼叫 异常呼叫，当异常呼叫的原因是由于缺少切换资源的另一原因或​​用户的忙碌时终止呼叫，当呼叫未完全终止时增加不完整呼叫的数量 由于缺少用户的切换资源或忙碌，检查呼叫完成率，并终止呼叫 当呼叫完成率大于操作员指定的将呼叫注册为RPCC的预定阈值时，通知操作者终端的合成操作，并且请求相应代码的呼叫控制。

公开(公告)号：US07242232B2

公开(公告)日：2007-07-10

申请号：US11126428

申请日：2005-05-10

申请人： Chul-Soo Kim ,  Byung-Hoon Jeong

发明人： Chul-Soo Kim ,  Byung-Hoon Jeong

IPC分类号： H03L7/06

CPC分类号： H03L7/0812 ,  G11C7/1051 ,  G11C7/1066 ,  G11C7/222

摘要： We describe and claim an internal signal replication device and method. A circuit comprising a selector to select one of a plurality of internally generated clock signals, and a compensation circuit to replicate the selected clock signal from a reference clock signal.

摘要翻译： 我们描述并声明内部信号复制设备和方法。 一种电路，包括选择器以选择多个内部产生的时钟信号中的一个，以及补偿电路，以从参考时钟信号复制所选择的时钟信号。

公开(公告)号：US06323664B1

公开(公告)日：2001-11-27

申请号：US09620018

申请日：2000-07-20

申请人： Sung-Hoon Kim ,  Chul-Soo Kim

发明人： Sung-Hoon Kim ,  Chul-Soo Kim

IPC分类号： G01R3102

CPC分类号： G11C29/48 ,  G11C29/006

摘要： Disclosed herein is a semiconductor memory device that includes a memory cell array and a plurality of pads for providing data to and from the memory cell array. A plurality of input/output line pairs corresponds to the plurality of pads. A reading means reads out the data from the memory cell array through the plurality of input/output line pairs and pads. A switch control circuit generates sequential switch control signals during a test mode. A switch control means receives the data from the reading means during the test mode. The switching means sequentially transfers the data to a representative pad responsive to the switch control signals. The present invention allows testing for defective memory cells at a wafer level using a limited number of probe needles.

摘要翻译： 这里公开了一种半导体存储器件，其包括存储单元阵列和用于向存储单元阵列提供数据的多个焊盘。 多个输入/输出线对对应于多个焊盘。 读取装置通过多个输入/输出线对和焊盘从存储单元阵列中读出数据。 开关控制电路在测试模式期间产生顺序的开关控制信号。 开关控制装置在测试模式期间从读取装置接收数据。 切换装置响应于开关控制信号顺序地将数据传送到代表性焊盘。 本发明允许使用有限数量的探针针对晶片级的缺陷存储单元进行测试。

公开(公告)号：US20080246506A1

公开(公告)日：2008-10-09

申请号：US12059380

申请日：2008-03-31

申请人： Chul-Soo Kim

发明人： Chul-Soo Kim

IPC分类号： G01R31/26

CPC分类号： G01R31/2621

摘要： An apparatus and a method for measuring an effective channel. The apparatus includes an automatic measurement system including a testing terminal for a substrate, a switching matrix disposed at one side of the automatic measurement system, a leakage current measuring device and a capacitance measuring device electrically connected to the switching matrix by a predetermined terminal, and a controller which controls the automatic measurement system, the leakage current measuring device, and the capacitance measuring device.

摘要翻译： 一种用于测量有效信道的装置和方法。 该装置包括：自动测量系统，包括：基板测试端子;设置在自动测量系统一侧的开关矩阵;漏电流测量装置;以及通过预定端子与开关矩阵电连接的电容测量装置;以及 控制自动测量系统的控制器，漏电流测量装置和电容测量装置。

公开(公告)号：US20070047367A1

公开(公告)日：2007-03-01

申请号：US11506878

申请日：2006-08-21

申请人： Doo-Young Kim ,  Soon-Seob Lee ,  Chul-Soo Kim

发明人： Doo-Young Kim ,  Soon-Seob Lee ,  Chul-Soo Kim

IPC分类号： G11C8/00

CPC分类号： G11C8/10

摘要： Semiconductor memory devices, block select decoding circuits and a method of activating a word line are provided. An example semiconductor memory device may include a plurality of memory banks. Each of the plurality of memory banks may include memory blocks which may be arranged in different addressable orders. If two edge memory blocks are activated in a given one of the plurality of memory banks, a non-edge memory block may be concurrently activated in at least one of remaining memory banks other than the given one memory bank. Accordingly, a number of concurrently activated memory blocks, a voltage required to enable a word line and noise may be reduced. The example semiconductor device may include the example block select decoding circuit, and likewise may perform the example method of activating a word line with an activation of a reduced number of memory blocks.

摘要翻译： 提供半导体存储器件，块选择解码电路和激活字线的方法。 示例性半导体存储器件可以包括多个存储体。 多个存储体中的每一个可以包括可以以不同的可寻址顺序排列的存储块。 如果在多个存储体中的给定的一个存储体中激活了两个边缘存储器块，则非边缘存储器块可以在除给定的一个存储体之外的剩余存储体的至少一个中同时激活。 因此，可以减少多个同时激活的存储块，使得字线和噪声所需的电压。 示例性半导体器件可以包括示例块选择解码电路，并且同样可以执行用减少数量的存储器块的激活来激活字线的示例方法。

公开(公告)号：US6072846A

公开(公告)日：2000-06-06

申请号：US896788

申请日：1997-07-18

申请人： Gye-Hyun Kyung ,  Chul-Soo Kim

发明人： Gye-Hyun Kyung ,  Chul-Soo Kim

IPC分类号： H03L7/00 ,  G06F1/10 ,  H03L7/06 ,  H03L7/081 ,  H03L7/089 ,  H03L7/16 ,  H04L7/00 ,  H03K5/13

CPC分类号： H03L7/06 ,  G06F1/10 ,  H03L7/0812 ,  H04L7/0012 ,  H03L7/0891

摘要： A clock supply device for distributing a source clock signal to memory elements in a synchronous memory system reduces skew and improves accuracy by transmitting a first clock signal from a synchronization section located at a first position to a clock distribution section located at a second position and then feeding back a second clock signal to the synchronization section which includes a phase locked loop or delay locked loop. The synchronization section locks the first signal with the source clock signal, thereby controlling the skew between the first clock signal and the source clock signal. The clock distributing section distributes the first clock signal to memory elements and generates the second clock signal as a feedback signal responsive to the first clock signal. The clock supply device includes a first transmission line for transmitting the first clock signal from the first position to the second position, and a second transmission line for transmitting the second clock signal back to the first position. A third transmission line is optionally provided to transmit the source clock signal from a clock generating section located at a third position to the synchronization section at the first position. The signal delay characteristics of the second and third transmission lines are preferably equal.

摘要翻译： 用于将源时钟信号分配到同步存储器系统中的存储器元件的时钟提供装置通过从位于第一位置的同步部分发送第一时钟信号到位于第二位置的时钟分配部分来减少偏差并提高精度，然后 将第二时钟信号反馈到包括锁相环或延迟锁定环的同步部分。 同步部分用源时钟信号锁定第一信号，由此控制第一时钟信号和源时钟信号之间的偏斜。 时钟分配部分将第一时钟信号分配给存储器元件，并响应于第一时钟信号产生第二时钟信号作为反馈信号。 时钟供给装置包括用于将第一时钟信号从第一位置发送到第二位置的第一传输线和用于将第二时钟信号发送回第一位置的第二传输线。 可选地提供第三传输线，以将来自位于第三位置的时钟产生部分的源时钟信号从第一位置发送到同步部分。 第二和第三传输线的信号延迟特性优选相等。

公开(公告)号：US20110069568A1

公开(公告)日：2011-03-24

申请号：US12952328

申请日：2010-11-23

申请人： Sang-Woong Shin ,  Chul-Soo Kim ,  Young-Hyun Jun ,  Sang-Bo Lee

发明人： Sang-Woong Shin ,  Chul-Soo Kim ,  Young-Hyun Jun ,  Sang-Bo Lee

IPC分类号： G11C7/08 ,  G11C7/12 ,  G11C7/22

CPC分类号： G11C7/06 ,  G11C11/4091 ,  G11C2207/005 ,  G11C2207/065

摘要： A semiconductor memory device includes a plurality of memory cell array blocks, a bit line sense amplifier, a local sense amplifier that can be controlled to be turned on or off, a data sense amplifier, and a controller. The controller activates a local sense control signal for a predetermined duration in response to first and second signals. The first signal is a bit line sense enable signal that activates the bit line sense amplifier, and the local sense amplifier is activated for a predetermined duration after the bit line sense enable signal is activated. The second signal is activated or deactivated in phase with a column selection line signal that connects a pair of bit lines and a pair of local input/output lines. Accordingly, it is possible to turn on or off the local sense amplifier according to operating conditions, thereby increasing a tRCD parameter and reducing the consumption of current. The operating speed of the semiconductor memory device can be improved by combining the local sense amplifier with a current type data sense amplifier that does not require precharging and equalization during a read operation.

摘要翻译： 半导体存储器件包括多个存储单元阵列块，位线读出放大器，可被控制为导通或截止的本地读出放大器，数据读出放大器和控制器。 控制器响应于第一和第二信号激活预定持续时间的局部感测控制信号。 第一信号是激活位线读出放大器的位线检测使能信号，并且在位线检测使能信号被激活之后局部读出放大器被激活预定的持续时间。 第二信号与连接一对位线和一对本地输入/输出线的列选择线信号同相激活或去激活。 因此，可以根据操作条件接通或关闭本地读出放大器，由此增加tRCD参数并减少电流消耗。 可以通过组合本地读出放大器与在读取操作期间不需要预充电和均衡的电流型数据读出放大器来提高半导体存储器件的工作速度。

公开(公告)号：US07859290B2

公开(公告)日：2010-12-28

申请号：US12059380

申请日：2008-03-31

申请人： Chul-Soo Kim

发明人： Chul-Soo Kim

IPC分类号： G01R31/26

CPC分类号： G01R31/2621

摘要： An apparatus and a method for measuring an effective channel. The apparatus includes an automatic measurement system including a testing terminal for a substrate, a switching matrix disposed at one side of the automatic measurement system, a leakage current measuring device and a capacitance measuring device electrically connected to the switching matrix by a predetermined terminal, and a controller which controls the automatic measurement system, the leakage current measuring device, and the capacitance measuring device.

摘要翻译： 一种用于测量有效信道的装置和方法。 该装置包括：自动测量系统，包括：基板测试端子;设置在自动测量系统一侧的开关矩阵;漏电流测量装置;以及通过预定端子与开关矩阵电连接的电容测量装置;以及 控制自动测量系统的控制器，泄漏电流测量装置和电容测量装置。

公开(公告)号：US07543201B2

公开(公告)日：2009-06-02

申请号：US11463965

申请日：2006-08-11

申请人： Chul-Soo Kim

发明人： Chul-Soo Kim

IPC分类号： G01R31/28 ,  G06F11/00 ,  G06F13/42 ,  H04L5/00

CPC分类号： G01R31/31922 ,  G01R31/3016 ,  G01R31/31725

摘要： A semiconductor device may include a control signal generator configured to generate a test control signal in response to an externally applied test command signal. First and second transmission gates may be configured to open and close together in response to a test clock signal pulse and the test control signal. A delay circuit may be coupled between the first and second transmission gates so that the delay circuit is configured to receive a test input signal through the first transmission gate and to transmit a delayed test input signal to the second transmission gate, and the delayed test input signal may correspond to the test input signal. A latch may be coupled between the second transmission gate and an output of the semiconductor device, and the latch may be configured to latch a first logic value when a duration of the test clock signal pulse is less than a delay of the delay circuit and to latch a second logic value when a duration of the test clock signal pulse is greater than the delay of the delay circuit, and the first and second logic values be different. Related methods are also discussed.

摘要翻译： 半导体器件可以包括被配置为响应于外部施加的测试命令信号而产生测试控制信号的控制信号发生器。 第一和第二传输门可以被配置为响应于测试时钟信号脉冲和测试控制信号而一起打开和关闭。 延迟电路可以耦合在第一和第二传输门之间，使得延迟电路被配置为通过第一传输门接收测试输入信号，并将延迟的测试输入信号发送到第二传输门，并且延迟测试输入 信号可以对应于测试输入信号。 闩锁可以耦合在第二传输门和半导体器件的输出之间，并且锁存器可以被配置为当测试时钟信号脉冲的持续时间小于延迟电路的延迟时锁存第一逻辑值，并且 当测试时钟信号脉冲的持续时间大于延迟电路的延迟时，锁存第二逻辑值，并且第一和第二逻辑值不同。 还讨论了相关方法。

公开(公告)号：US5898700A

公开(公告)日：1999-04-27

申请号：US748211

申请日：1996-11-12

申请人： Chul-Soo Kim

发明人： Chul-Soo Kim

IPC分类号： G01R31/28 ,  G01R31/317 ,  G01R31/3185 ,  G11C29/00 ,  G11C29/48 ,  H01L21/66 ,  H01L21/82 ,  H01L21/822 ,  H01L27/04

CPC分类号： G11C29/48 ,  G01R31/31712 ,  G01R31/31715 ,  G01R31/318505 ,  G01R31/318511

摘要： A test signal generator and method for testing a semiconductor wafer having a plurality of memory chips. A plurality of input buffers buffer test timing signals applied through a plurality of input terminals to the memory chips in test mode. A direct current source supplies a direct current of a given level to each of the terminals. The direct current source comprises a MOS transistor for supplying the direct current including a fuse with a first node connected between the terminal and buffer and a second node for receiving the direct current. The fuse is cut by an electric or laser cutter after wafer testing is complete. This enables a probe card for performing the wafer testing to be fabricated with a reduced number of probe tips, thereby overcoming the limitation of a test driver and allowing the simultaneous testing of semiconductor wafers having a plurality of memory chips having different pad configurations.

摘要翻译： 一种用于测试具有多个存储器芯片的半导体晶片的测试信号发生器和方法。 多个输入缓冲器通过多个输入端子在测试模式下将测试定时信号缓冲到存储器芯片。 直流电源向每个端子提供给定电平的直流电流。 直流电源包括MOS晶体管，用于将包括熔丝的直流电源与连接在端子和缓冲器之间的第一节点以及用于接收直流电流的第二节点提供。 晶圆测试完成后，保险丝由电动或激光切割机切割。 这使得用于执行晶片测试的探针卡被制造成具有减少数量的探针尖端，从而克服了测试驱动器的限制，并允许同时测试具有不同衬垫配置的多个存储器芯片的半导体晶片。