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    Probe Card Assembly With A Mechanically Decoupled Wiring Substrate
    1.
    发明申请
    Probe Card Assembly With A Mechanically Decoupled Wiring Substrate 有权
    具有机械解耦接线基板的探头卡组件

    公开(公告)号：US20070126440A1

    公开(公告)日：2007-06-07

    申请号：US11551545

    申请日：2006-10-20

    申请人： Eric Hobbs ,  Alexander Slocum ,  Benjamin Eldridge ,  Keith Breinlinger ,  Shawn Powell

    发明人： Eric Hobbs ,  Alexander Slocum ,  Benjamin Eldridge ,  Keith Breinlinger ,  Shawn Powell

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2893

    摘要： A probe card assembly can comprise a probe head assembly and a wiring substrate. The probe head assembly can comprise a plurality of probes disposed to contact an electronic device disposed on a holder in a test housing. The wiring substrate can include an electrical interface to a test controller and a plurality of electrical wiring composing electrical paths between the electrical interface and ones of the probes, and the wiring substrate can comprise a first portion on which the electrical interface is disposed and a second portion composing the probe head assembly. The second portion of the wiring substrate can be moveable with respect to the first portion of the wiring substrate.

    摘要翻译： 探针卡组件可以包括探针头组件和布线衬底。 探针头组件可以包括多个探针，其设置成接触设置在测试壳体中的保持器上的电子设备。 布线基板可以包括与测试控制器的电接口以及构成电接口和探针之间的电气路径的多个电线，并且布线基板可以包括其上设置有电接口的第一部分和第二部分 组成探头组件的部分。 布线基板的第二部分能够相对于布线基板的第一部分移动。

    Method and apparatus for adjusting a multi-substrate probe structure
    2.
    发明申请
    Method and apparatus for adjusting a multi-substrate probe structure 失效
    用于调整多基板探针结构的方法和装置

    公开(公告)号：US20060290367A1

    公开(公告)日：2006-12-28

    申请号：US11165833

    申请日：2005-06-24

    申请人： Eric Hobbs ,  Benjamin Eldridge ,  Lunyu Ma ,  Gaetan Mathieu ,  Steven Murphy ,  Makarand Shinde ,  Alexander Slocum

    发明人： Eric Hobbs ,  Benjamin Eldridge ,  Lunyu Ma ,  Gaetan Mathieu ,  Steven Murphy ,  Makarand Shinde ,  Alexander Slocum

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2886 ,  G01R1/073 ,  G01R31/31905 ,  Y10T29/49128 ,  Y10T29/4913 ,  Y10T29/49133 ,  Y10T29/49147 ,  Y10T29/49208 ,  Y10T29/49222

    摘要： A probe card assembly comprises multiple probe substrates attached to a mounting assembly. Each probe substrate includes a set of probes, and together, the sets of probes on each probe substrate compose an array of probes for contacting a device to be tested. Adjustment mechanisms are configured to impart forces to each probe substrate to move individually each substrate with respect to the mounting assembly. The adjustment mechanisms may translate each probe substrate in an “x,” “y,” and/or “z” direction and may further rotate each probe substrate about any one or more of the forgoing directions. The adjustment mechanisms may further change a shape of one or more of the probe substrates. The probes can thus be aligned and/or planarized with respect to contacts on the device to be tested.

    摘要翻译： 探针卡组件包括附接到安装组件的多个探针基板。 每个探针衬底包括一组探针，并且每个探针衬底上的探针组合在一起组成一组探针，用于接触待测试的器件。 调整机构构造成赋予每个探针基板以相对于安装组件分别移动每个基板的力。 调节机构可以将每个探针基板转换成“x”，“y”和/或“z”方向，并且可以进一步围绕前述方向上的任何一个或多个旋转每个探针基板。 调节机构可以进一步改变一个或多个探针基板的形状。 因此，探针可以相对于要测试的装置上的触点对准和/或平坦化。

    Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
    3.
    发明申请
    Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly 有权
    用于管理探针卡组件的热诱导运动的装置和方法

    公开(公告)号：US20060255814A1

    公开(公告)日：2006-11-16

    申请号：US11306515

    申请日：2005-12-30

    申请人： Benjamin Eldridge ,  Gary Grube ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum ,  A. Sporck ,  Thomas Watson

    发明人： Benjamin Eldridge ,  Gary Grube ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum ,  A. Sporck ,  Thomas Watson

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2874 ,  G01R31/2863 ,  G01R31/2889 ,  Y10T29/5313

    摘要： A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus, and the stiffener plate can provide structure for attaching the probe card assembly to the testing apparatus. The stiffener plate can have a greater mechanical strength than the wiring substrate and can be less susceptible to thermally induced movement than the wiring substrate. The wiring substrate may be attached to the stiffener plate at a central location of the wiring substrate. Space may be provided at other locations where the wiring substrate is attached to the stiffener plate so that the wiring substrate can expand and contract with respect to the stiffener plate.

    摘要翻译： 探针卡组件可以包括具有用于接触要测试的电子设备的探针的探针头组件。 探针头组件可以电连接到布线基板并且机械地附接到加强板。 布线基板可以提供到测试装置的电连接，并且加强板可以提供用于将探针卡组件附接到测试装置的结构。 加强板可以具有比布线基板更大的机械强度，并且可以比布线基板更不易受热引起的移动。 布线基板可以在布线基板的中心位置处附接到加强板。 可以在布线基板附接到加强板的其他位置处设置空间，使得布线基板相对于加强板可以膨胀和收缩。

    APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PROBE CARD ASSEMBLY
    4.
    发明申请
    APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PROBE CARD ASSEMBLY 有权
    用于管理探针卡组件的热诱导运动的装置和方法

    公开(公告)号：US20080042668A1

    公开(公告)日：2008-02-21

    申请号：US11877466

    申请日：2007-10-23

    申请人： Benjamin Eldridge ,  Gary Grube ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum ,  A. Sporck ,  Thomas Watson

    发明人： Benjamin Eldridge ,  Gary Grube ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum ,  A. Sporck ,  Thomas Watson

    IPC分类号： G01R1/073

    CPC分类号： G01R31/2874 ,  G01R31/2863 ,  G01R31/2889 ,  Y10T29/5313

    摘要： A probe card assembly can include a probe head assembly having probes for contacting an electronic device to be tested. The probe head assembly can be electrically connected to a wiring substrate and mechanically attached to a stiffener plate. The wiring substrate can provide electrical connections to a testing apparatus, and the stiffener plate can provide structure for attaching the probe card assembly to the testing apparatus. The stiffener plate can have a greater mechanical strength than the wiring substrate and can be less susceptible to thermally induced movement than the wiring substrate. The wiring substrate may be attached to the stiffener plate at a central location of the wiring substrate. Space may be provided at other locations where the wiring substrate is attached to the stiffener plate so that the wiring substrate can expand and contract with respect to the stiffener plate.

    摘要翻译： 探针卡组件可以包括具有用于接触要测试的电子设备的探针的探针头组件。 探针头组件可以电连接到布线基板并且机械地附接到加强板。 布线基板可以提供到测试装置的电连接，并且加强板可以提供用于将探针卡组件附接到测试装置的结构。 加强板可以具有比布线基板更大的机械强度，并且可以比布线基板更不易受热引起的移动。 布线基板可以在布线基板的中心位置处附接到加强板。 可以在将布线基板附接到加强板的其他位置处设置空间，使得布线基板能够相对于加强板膨胀和收缩。

    Apparatus And Method For Adjusting An Orientation Of Probes
    5.
    发明申请
    Apparatus And Method For Adjusting An Orientation Of Probes 失效
    用于调整探针取向的装置和方法

    公开(公告)号：US20070126435A1

    公开(公告)日：2007-06-07

    申请号：US11164737

    申请日：2005-12-02

    申请人： Benjamin Eldridge ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum

    发明人： Benjamin Eldridge ,  Eric Hobbs ,  Gaetan Mathieu ,  Makarand Shinde ,  Alexander Slocum

    IPC分类号： G01R31/02

    CPC分类号： G01R31/2891 ,  G01R31/31905

    摘要： Probes of a probe card assembly can be adjusted with respect to an element of the probe card assembly, which can be an element of the probe card assembly that facilitates mounting of the probe card assembly to a test apparatus. The probe card assembly can then be mounted in a test apparatus, and an orientation of the probe card assembly can be adjusted with respect to the test apparatus, such as a structural part of the test apparatus or a structural element attached to the test apparatus.

    摘要翻译： 可以相对于探针卡组件的元件调整探针卡组件的探针，探针卡组件可以是探针卡组件的元件，其有助于将探针卡组件安装到测试装置。 然后可以将探针卡组件安装在测试装置中，并且可以相对于测试装置（例如测试装置的结构部分或连接到测试装置的结构元件）来调整探针卡组件的取向。

    Methods and devices for sensing tissues and tissue compartments
    6.
    发明授权
    Methods and devices for sensing tissues and tissue compartments 有权
    用于感染组织和组织隔室的方法和装置

    公开(公告)号：US08920388B2

    公开(公告)日：2014-12-30

    申请号：US12525931

    申请日：2008-02-07

    申请人： Alexander Slocum ,  Erik Bassett ,  Jeffrey M. Karp ,  Robert S. Langer ,  Omid C. Farokhzad

    发明人： Alexander Slocum ,  Erik Bassett ,  Jeffrey M. Karp ,  Robert S. Langer ,  Omid C. Farokhzad

    IPC分类号： A61M5/32 ,  A61B17/34 ,  A61B19/00

    CPC分类号： A61M5/3287 ,  A61B17/3401 ,  A61B2090/064

    摘要： An apparatus provides feedback regarding the material in which tip of the apparatus is located as the tip is advance into matter of varying resistances. The apparatus responds to a change in pressure, force, or other parameter such that when the tip reaches matter of a certain resistance, a change in the parameter is sensed. The apparatus provides a driving force to a penetrating medical device, such as a needle, when the apparatus tip encounters material of high resistance. When the apparatus tip encounters a low resistance material, no further driving force is applied to the apparatus. An inner core may be advanced into the low resistance material for deployment of a gas or a liquid as desired.

    摘要翻译： 一种装置提供关于当尖端进入变化的电阻的问题时设备的尖端位于其中的材料的反馈。 该装置响应压力，力或其他参数的变化，使得当尖端到达某一阻力的物质时，检测参数的变化。 当装置尖端遇到高电阻的材料时，该装置向穿透性医疗装置（例如针）提供驱动力。 当装置尖端遇到低电阻材料时，不会向装置施加进一步的驱动力。 可以根据需要将内核推进到用于展开气体或液体的低电阻材料中。

    METHODS AND DEVICES FOR SENSING TISSUES AND TISSUE COMPARTMENTS
    7.
    发明申请
    METHODS AND DEVICES FOR SENSING TISSUES AND TISSUE COMPARTMENTS 有权
    感染组织和组织间隔的方法和装置

    公开(公告)号：US20110125107A1

    公开(公告)日：2011-05-26

    申请号：US12525931

    申请日：2008-02-07

    申请人： Alexander Slocum ,  Erik Bassett ,  Jeffrey M. Karp ,  Robert S. Langer ,  Omid C. Farokhzad

    发明人： Alexander Slocum ,  Erik Bassett ,  Jeffrey M. Karp ,  Robert S. Langer ,  Omid C. Farokhzad

    IPC分类号： A61M5/32

    CPC分类号： A61M5/3287 ,  A61B17/3401 ,  A61B2090/064

    摘要： An apparatus provides feedback regarding the material in which tip of the apparatus is located as the tip is advance into matter of varying resistances. The apparatus responds to a change in pressure, force, or other parameter such that when the tip reaches matter of a certain resistance, a change in the parameter is sensed. The apparatus provides a driving force to a penetrating medical device, such as a needle, when the apparatus tip encounters material of high resistance. When the apparatus tip encounters a low resistance material, no further driving force is applied to the apparatus. An inner core may be advanced into the low resistance material for deployment of a gas or a liquid as desired.

    摘要翻译： 一种装置提供关于当尖端进入变化的电阻的问题时设备的尖端位于其中的材料的反馈。 该装置响应压力，力或其他参数的变化，使得当尖端到达某一阻力的物质时，检测参数的变化。 当装置尖端遇到高电阻的材料时，该装置向穿透性医疗装置（例如针）提供驱动力。 当装置尖端遇到低电阻材料时，不会向装置施加进一步的驱动力。 可以根据需要将内核推进到用于展开气体或液体的低电阻材料中。

    Methods and devices for growth and/or assembly of nanostructures
    9.
    发明申请
    Methods and devices for growth and/or assembly of nanostructures 有权
    用于生长和/或组装纳米结构的方法和装置

    公开(公告)号：US20060067871A1

    公开(公告)日：2006-03-30

    申请号：US11138881

    申请日：2005-05-26

    申请人： Anastasios Hart ,  Alexander Slocum

    发明人： Anastasios Hart ,  Alexander Slocum

    IPC分类号： D01F9/12

    CPC分类号： B82Y40/00 ,  B82Y30/00 ,  C01B32/162 ,  C01B32/18 ,  C01B2202/34 ,  D01F9/127 ,  Y10S977/843 ,  Y10S977/89

    摘要： The present invention relates to the synthesis and processing of materials, including nanostructures such as carbon nanotubes (CNTs). Methods and devices are presented for controlling the growth and/or assembly of nanostructures, in some cases using small channel-type environments (e.g., microfluidic channels). In these micro-scale environments, forces can be applied to nanostructures during their growth process, for instance, to control the rate and/or direction of growth of the nanostructures. These forces can also be used to direct the assembly of nanostructures into ordered configurations such as strands or other assemblies having micro- and macroscopic length scales. In some embodiments, multiple forces are applied simultaneously to direct the growth and/or assembly of nanostructures.

    摘要翻译： 本发明涉及包括纳米结构如碳纳米管（CNTs）在内的材料的合成和加工。 呈现用于控制纳米结构的生长和/或组装的方法和装置，在一些情况下使用小通道型环境（例如微流体通道）。 在这些微尺度环境中，力可以在其生长过程中施加于纳米结构，例如，以控制纳米结构生长的速率和/或方向。 这些力也可以用于将纳米结构的组装引导成有序构造，例如具有微观和宏观长度尺度的股线或其他组件。 在一些实施例中，同时施加多个力以指导纳米结构的生长和/或组装。