摘要:
A display controller includes a controller input connectable to receive first image data representing a non-safety relevant part of an image to be displayed on a display and to receive second image data representing a safety relevant part of the image. A merging unit is connected to the controller input, for composing the image from the first image data and second image data. A controller output is connectable to the display, for outputting display data representing the image. An image monitor is connected to the controller output, for comparing a part of the image corresponding to the safety relevant part with an reference for the part.
摘要:
A display controller includes a controller input connectable to receive first image data representing a non-safety relevant part of an image to be displayed on a display and to receive second image data representing a safety relevant part of the image. A merging unit is connected to the controller input, for composing the image from the first image data and second image data. A controller output is connectable to the display, for outputting display data representing the image. An image monitor is connected to the controller output, for comparing a part of the image corresponding to the safety relevant part with an reference for the part.
摘要:
A system for testing a logic circuit which has two or more test routine modules. Each module contains a set of instructions which is executable by (a part of) the logic circuit. The set forms a test routine for performing a self-test by the part of the logic circuit. The self-test includes the part of the logic circuit testing itself for faulty behavior, and the part of the logic circuit determining a self-test result of the testing. The system includes a test module which can execute a test application which subjects the logic circuit to a test by performing the self-test on at least a part of the logic circuit by causes the part of the logic circuit to execute a selected test routine, and determining, by the test module, an overall test result at least based on a performed self-tests. The test module includes a control output interface for activates the execution of the a selected test routine. A second test module input interface can receive the self-test result from a selected test routine. At a test module output interface the overall test result may be outputted. The test routine includes instructions for outputting, by the part of the logic circuit, data to a test routine output interface which is not connected to the second test module input interface, for outputting information about the self-test result by the test routines without passing the information through the test module.
摘要:
A data processing system may include a first data path and a second data path. A set of components may include a system component and a partner component, each having a communication interface for communicating data. The components are operable in a synchronized mode and a non-synchronized mode with respect to each other. The set may further include a configuration control system connected to the system component and the partner component, for controlling the set to be in a synchronized mode configuration or a non-synchronized mode configuration. The configuration control system may include a first path selector module connecting the communication interface of the system component to the first data path and the second data path and a partner path selector module connecting the communication interface of the partner component to the first data path and the second data path. The path selector modules may be arranged to enable, depending on the configuration, communication of data to the respective component via one or more selected data path, selected from the first data path and the second data path, and to inhibit communication via the not selected data paths.
摘要:
A timer unit includes a timer for timing the period of time the logic circuit has been in the self-test mode. A comparator is connected to the timer, for comparing the period of time with a maximum for the period of time the logic circuit is allowed to be in the self-test mode and outputting an error signal when the period of time exceeds the maximum. The test timer unit further includes a mode detector for detecting a switching of the logic circuit to the self-test mode. The mode detector is connected to the timer, for starting the timer upon the switching to the self-test mode and stopping the timer upon a switching of the logic circuit out of the self-test mode. The timer unit can be used in a system for testing a logic circuit which includes a test routine module containing a set of instructions which forms a test routine for performing a test on a tested part of the logic circuit. The system has a mode control unit containing a set of instructions which is executable by the logic circuit, for switching the logic circuit from and to a test mode in which a part of the logic circuit can be subjected to a selected test by executing a selected test routine.
摘要:
A device receives a request for an amount of a resource. It determines for each resource provider in a set of resource providers a current load, a requested load corresponding to the requested amount of the resource, and an additional load corresponding to an expected state of an application. It determines for each of the resource providers an expected total load on the basis of the current load, the requested load, and the additional load. It subsequently selects from the set of resource providers a preferred resource provider on the basis of the expected total loads. The resource may be one of the following: memory, processing time, data throughput, power, and usage of a device.
摘要:
A request controller for controlling processing of requests by one or more semiconductor data processing unit. The resource controller includes a controller input for receiving a request for the processing unit to switch a context of the processing unit or to switch the processing unit from a current an operation to another operation. The resource controller includes a resource budget memory in which one or more budget value can be stored. The budget value represents an amount of a resource of the processing unit. The resource controller further has a budget controller which includes a first budget controller input connected to the request controller input. A second budget controller input is connected to the memory. A comparator is connected to the first budget controller input and the second controller input, for comparing a consumption value associated with the request with the budget value. The comparator includes a comparator output for outputting a request grant signal when the comparison satisfies a predetermined grant criterion and outputting a request reject value when the comparison meets a predetermined reject criterion. A data controller is connected to the resource budget memory and the comparator output, for adjusting the budget value when the request grant signal is outputted.
摘要:
The invention refers to a method for monitoring a communication media access schedule of a communication controller (5) of a communication system (1) by means of a bus guardian (6). The communication system (1) comprises a communication media (2) and nodes (3) connected to the communication media (2). Each node (3) comprises a communication controller (5) and a bus guardian (6) assigned to the communication controller (5). Messages are transmitted among the nodes (3) across the communication media (2) based on a cyclic time triggered communication media access scheme. In order to provide a mechanism which allows the bus guardian (6) to monitor the communication media access scheme of the communication controller (5) even during startup of the communication it is suggested, that the bus guardian (6) has a priori knowledge about possible deviations from the communication media access schedule during startup of the communication and that the bus guardian (6) during startup makes use of the a priori knowledge to distinguish between an allowed deviation and a forbidden deviation caused by a failure of the communication controller (5).
摘要:
A data processing system includes a processor having a multi-way cache which has a first and a second way. The second way is configurable to either be redundant to the first way or to operate as an associative way independent of the first way. The system may further include a memory, where the processor, in response to a read address missing in the cache, provides the read address to the memory. The second way may be dynamically configured to be redundant to the first way during operation of the processor in response to an error detection signal. In one aspect, when the second way is configured to be redundant, in response to the read address hitting in the cache, data addressed by an index portion of the read address is provided from both the first and second way and compared to each other to determine if a comparison error exists.
摘要:
A timer unit includes a timer for timing the period of time the logic circuit has been in the self-test mode. A comparator is connected to the timer, for comparing the period of time with a maximum for the period of time the logic circuit is allowed to be in the self-test mode and outputting an error signal when the period of time exceeds the maximum. The test timer unit further includes a mode detector for detecting a switching of the logic circuit to the self-test mode. The mode detector is connected to the timer, for starting the timer upon the switching to the self-test mode and stopping the timer upon a switching of the logic circuit out of the self-test mode. The timer unit can be used in a system for testing a logic circuit which includes a test routine module containing a set of instructions which forms a test routine for performing a test on a tested part of the logic circuit. The system has a mode control unit containing a set of instructions which is executable by the logic circuit, for switching the logic circuit from and to a test mode in which a part of the logic circuit can be subjected to a selected test by executing a selected test routine.