BIT-FLIP CODING
    3.
    发明申请
    BIT-FLIP CODING 审中-公开
    位转码

    公开(公告)号:US20160352358A1

    公开(公告)日:2016-12-01

    申请号:US15112013

    申请日:2014-01-24

    Abstract: Bit-flip coding uses a bit-flip encoder to flip bits in a redundancy-intersecting vector of a binary array having n rows and n columns until Hamming weights of the binary array are within a predetermined range Δ of n divided by two. Information bits of an input data word to the bit-flip coding apparatus are stored in locations within the binary array that are not occupied by n redundancy bits of a redundancy vector.

    Abstract translation: 位翻转编码使用位触发编码器翻转具有n行和n列的二进制数组的冗余相交向量中的位,直到二进制数组的汉明权重在n的预定范围Δ除以2。 位数翻转编码装置的输入数据字的信息位被存储在二进制数组内不被冗余向量的n个冗余比特占用的位置中。

    ENCODED CROSS-POINT ARRAY
    4.
    发明申请
    ENCODED CROSS-POINT ARRAY 有权
    编码交叉点阵列

    公开(公告)号:US20160343431A1

    公开(公告)日:2016-11-24

    申请号:US15113908

    申请日:2014-01-31

    Abstract: A device includes a cross-point array and an access circuit to access subsets of memory elements respectively corresponding to encoded blocks of data. For each of the subsets of memory elements, a row or a column of the cross-point array that includes a first memory element in the subset and a second memory element in the subset further includes a third memory element that is between the first and second memory elements along the row or column and is in one of the subsets corresponding to another of the encoded blocks.

    Abstract translation: 一种设备包括交叉点阵列和访问电路,以访问分别对应于编码的数据块的存储器元件的子集。 对于存储器元件的每个子集,包括子集中的第一存储器元件和该子集中的第二存储器元件的交叉点阵列的行或列还包括位于第一和第二存储器元件之间的第三存储器元件 沿着行或列的存储器元件,并且在对应于另一编码块的子集之一中。

    Encoding data within a crossbar memory array

    公开(公告)号:US10175906B2

    公开(公告)日:2019-01-08

    申请号:US15325118

    申请日:2014-07-31

    Abstract: In an example, in a method for encoding data within a crossbar memory array containing cells, bits of input data may be received. The received bits of data may be mapped to the cells in a row of the memory array, in which the cells are to be assigned to one of a low resistance state and a high resistance state. A subset of the mapped bits in the row may be grouped into a word pattern. The word pattern may be arranged such that more low resistance states are mapped to cells that are located closer to a voltage source of the row of the memory array than to cells that are located farther away from the voltage source.

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