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公开(公告)号：US10453949B2
公开(公告)日：2019-10-22
申请号：US15625178
申请日：2017-06-16
Applicant: HITACHI, LTD.
Inventor： Takahiro Morikawa , Naoki Watanabe , Hiroyuki Yoshimoto
Abstract: A semiconductor device has an active region in which a plurality of unit cells are regularly arranged, each of the unit cells including: a channel region having a first conductivity type and formed over a front surface of a semiconductor substrate; a source region having a second conductivity type different from the first conductivity type and formed over the front surface of the semiconductor substrate in such a manner as to be in contact with the channel region; and a JFET region having the second conductivity type and is formed over the front surface of the semiconductor substrate on the opposite side of the channel region from the source region in such a manner as to be in contact with the channel region. The channel region is comprised of a first channel region and a second channel region higher than the first channel region in impurity concentration, over the front surface of the semiconductor substrate.
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2.发明授权公开(公告)号：US09653478B2
公开(公告)日：2017-05-16
申请号：US14933901
申请日：2015-11-05
Applicant: Hitachi, Ltd.
Inventor： Digh Hisamoto , Shinichi Saito , Akio Shima , Hiroyuki Yoshimoto
IPC: H01L27/12 , H01L21/8249 , H01L21/84 , H01L27/06 , H01L27/07 , H01L27/092 , H01L27/11 , H01L27/11521 , H01L27/11568 , H01L29/66 , H01L29/788 , H01L29/792 , G11C16/04 , H01L23/535 , H01L29/06 , H01L29/08 , H01L29/10 , H01L29/73 , H01L27/102 , G11C11/412
CPC classification number: H01L27/1203 , G11C11/412 , G11C16/0408 , H01L21/8249 , H01L21/84 , H01L23/535 , H01L27/0623 , H01L27/0705 , H01L27/092 , H01L27/1025 , H01L27/1026 , H01L27/11 , H01L27/11521 , H01L27/11568 , H01L29/0649 , H01L29/0804 , H01L29/0821 , H01L29/0847 , H01L29/0895 , H01L29/1004 , H01L29/1033 , H01L29/66825 , H01L29/66833 , H01L29/7311 , H01L29/788 , H01L29/792 , H01L2924/0002 , H01L2924/00
Abstract: Provided is a semiconductor element having, while maintaining the same integratability as a conventional MOSFET, excellent switch characteristics compared with the MOSFET, that is, having the S-value less than 60 mV/order at room temperature. Combining the MOSFET and a tunnel bipolar transistor having a tunnel junction configures a semiconductor element that shows an abrupt change in the drain current with respect to a change in the gate voltage (an S-value of less than 60 mV/order) even at a low voltage.
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3.发明申请Semiconductor Device, Method for Manufacturing Same, and Nonvolatile Semiconductor Memory Device 审中-公开半导体器件，制造方法和非易失性半导体存储器件公开(公告)号：US20160071882A1
公开(公告)日：2016-03-10
申请号：US14933901
申请日：2015-11-05
Applicant: Hitachi, Ltd.
Inventor： Digh Hisamoto , Shinichi Saito , Akio Shima , Hiroyuki Yoshimoto
CPC classification number: H01L27/1203 , G11C11/412 , G11C16/0408 , H01L21/8249 , H01L21/84 , H01L23/535 , H01L27/0623 , H01L27/0705 , H01L27/092 , H01L27/1025 , H01L27/1026 , H01L27/11 , H01L27/11521 , H01L27/11568 , H01L29/0649 , H01L29/0804 , H01L29/0821 , H01L29/0847 , H01L29/0895 , H01L29/1004 , H01L29/1033 , H01L29/66825 , H01L29/66833 , H01L29/7311 , H01L29/788 , H01L29/792 , H01L2924/0002 , H01L2924/00
Abstract: Provided is a semiconductor element having, while maintaining the same integratability as a conventional MOSFET, excellent switch characteristics compared with the MOSFET, that is, having the S-value less than 60 mV/order at room temperature. Combining the MOSFET and a tunnel bipolar transistor having a tunnel junction configures a semiconductor element that shows an abrupt change in the drain current with respect to a change in the gate voltage (an S-value of less than 60 mV/order) even at a low voltage.
Abstract translation: 提供了与MOSFET相比具有与常规MOSFET相同的可集成性的半导体元件，即在室温下S值小于60mV /阶的优异的开关特性。 组合MOSFET和具有隧道结的隧道双极晶体管配置了一个半导体元件，其相对于栅极电压的变化（S值小于60mV /次）显示出漏极电流的突然变化，即使在 低电压。
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公开(公告)号：US11835412B2
公开(公告)日：2023-12-05
申请号：US17345354
申请日：2021-06-11
Applicant: Hitachi, Ltd.
Inventor： Hiroyuki Yoshimoto , Ryotaro Kawahara , Ryohei Matsui , Nobuyuki Sugii , Tsuneya Kurihara , Hirohiko Sagawa , Naoko Ushio , Motoki Tajima , Shingo Kirita
CPC classification number: G01L5/16 , G01B7/18 , G01L5/0095
Abstract: Provided is a digitalization system capable of digitalizing the skills of delicate work. This digitalization system comprises a first sensor mounted on a work tool and which detects a deformation of the work tool when the work tool is pressed against a work target, a second sensor which detects a force applied to the work target or a force applied to the work tool when the work tool is pressed against the work target, and a computer which calculates an angle of a corner formed with the work tool and the work target based on sensor values acquired with the first sensor, and calculates a force applied to the work target when the work tool is pressed against the work target based on sensor values acquired with the second sensor.
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公开(公告)号：US11508018B2
公开(公告)日：2022-11-22
申请号：US16970717
申请日：2018-07-30
Applicant: Hitachi, Ltd.
Inventor： Hiroyuki Yoshimoto , Noriyuki Haga , Masayoshi Ishibashi , Nobuyuki Sugii
Abstract: The present invention comprises: a wearable sensor that is worn by a worker, the wearable sensor having a sensor that receives sensor data from a sensing object, and a transmitter that transmits to a terminal the sensor data received by the sensor; and a computer that determines operation content for the worker on the basis of the sensor data received from the wearable sensor, and outputs the result of the determination to a display unit.
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Patent Agency Ranking
公开(公告)号：US10948904B1
公开(公告)日：2021-03-16
申请号：US16817839
申请日：2020-03-13
Applicant: Hitachi, Ltd.
Inventor： Hiroyuki Yoshimoto , Naoko Ushio , Ryohei Matsui , Hiroki Ohashi , Toshinari Ishii , Daiji Iwasa
IPC: G06Q30/00 , G05B19/418 , G06T7/00 , H04N7/18
Abstract: The product inspection system comprises an inspection information collecting unit which collects inspection information acquired from an inspection target, an inspection time acquisition unit which acquires an inspection time that the inspection information was acquired, a recording unit which mutually associates and records the inspection information collected by the inspection information collecting unit and the inspection time acquired by the inspection time acquisition unit, and a display control unit which displays the inspection information recorded in the recording unit on a display terminal.
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公开(公告)号：US09490247B2
公开(公告)日：2016-11-08
申请号：US14914883
申请日：2013-08-29
Applicant: HITACHI, LTD.
Inventor： Hiroyuki Yoshimoto , Akio Shima , Digh Hisamoto
IPC: H01L29/74 , H01L21/332 , H01L27/06 , H01L29/739 , H01L29/66 , H01L29/10 , H01L29/08 , H01L29/36 , H01L21/8249
CPC classification number: H01L27/0623 , H01L21/2253 , H01L21/8249 , H01L29/0619 , H01L29/0804 , H01L29/0821 , H01L29/1095 , H01L29/36 , H01L29/407 , H01L29/6634 , H01L29/66348 , H01L29/7396 , H01L29/7397 , H01L29/78
Abstract: An IGBT (50) includes a p+ collector region (3) and an n−− drift region (1), in which a first transistor (TR1) and a second transistor (TR2) are formed on the n−− drift region (1). In the n−− drift region (1), a p-type hole extraction region (14) is formed in contact with the second transistor (TR2). When the IGBT (50) is in an on-state, electrons and holes flow through the first transistor (TR1), but a current does not flow through the second transistor (TR2). On the other hand, when the IGBT (50) is switched from the on-state to an off-state, holes flow through the first transistor (TR1), and holes flow through the hole extraction region (14) and the second transistor (TR2).
Abstract translation: IGBT（50）包括p +集电极区（3）和n漂移区（1），其中在漂移区（1）上形成第一晶体管（TR1）和第二晶体管（TR2） ）。 在n漂移区域（1）中，形成与第二晶体管（TR2）接触的p型空穴提取区域（14）。 当IGBT（50）处于导通状态时，电子和空穴流过第一晶体管（TR1），但电流不流过第二晶体管（TR2）。 另一方面，当IGBT（50）从导通状态切换到断开状态时，空穴流过第一晶体管（TR1），空穴流过空穴取出区域（14）和第二晶体管（ TR2）。
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公开(公告)号：US11900777B2
公开(公告)日：2024-02-13
申请号：US17435894
申请日：2020-02-13
Applicant: Hitachi, Ltd.
Inventor： Tetsuya Ishimaru , Hiroyuki Yoshimoto , Yoshihiro Wakisaka , Nobuyuki Sugii
Abstract: A work detection determination system performs detection determination on a work with high accuracy.
The work detection determination system includes a glove that is worn on a hand of a worker and includes a microphone detecting a work sound of a hand operation in which the hand works on a work target through a contact of the hand with the work target, a pressure sensor detecting a pressure of a work of the hand operation, a motion sensor detecting a motion of the hand operation, and a transmitting unit transmitting a sound signal of the microphone, a pressure signal of the pressure sensor, and a motion signal of the motion sensor; a receiving unit that receives the sound signal, the pressure signal, and the motion signal transmitted from the transmitting unit; a work determination unit that performs detection determination of a work content of the worker by using the sound signal, the pressure signal, and the motion signal; and a notification unit that notifies a determination result of the work determination unit.-
公开(公告)号：US11653882B2
公开(公告)日：2023-05-23
申请号：US16808892
申请日：2020-03-04
Applicant: Hitachi, Ltd.
Inventor： Yoshihiro Wakisaka , Nobuyuki Sugii , Noriyuki Haga , Tetsuya Ishimaru , Hiroyuki Yoshimoto
CPC classification number: A61B5/7214 , A61B5/11 , A61B5/6843 , A61B5/742 , A61B5/746 , G01L5/00 , G01P13/00 , A61B2562/0252
Abstract: A sensor data correction system, includes: a standard motion mechanism unit for performing a standard motion of a wearable sensor; a determination unit calculating a relationship between first sensor data that is sensed by a first wearable sensor provided with the standard motion mechanism unit and second sensor data that is sensed by a second wearable sensor provided with the standard motion mechanism unit; and a correction unit correcting the first sensor data or the second sensor data, on the basis of the relationship that is calculated by the determination unit.
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公开(公告)号：US12266252B2
公开(公告)日：2025-04-01
申请号：US18520323
申请日：2023-11-27
Applicant: Hitachi, Ltd.
Inventor： Tetsuya Ishimaru , Hiroyuki Yoshimoto , Yoshihiro Wakisaka , Nobuyuki Sugii
Abstract: A work detection determination system performs detection determination on a work with high accuracy.
The work detection determination system includes a glove that is worn on a hand of a worker and includes a microphone detecting a work sound of a hand operation in which the hand works on a work target through a contact of the hand with the work target, a pressure sensor detecting a pressure of a work of the hand operation, a motion sensor detecting a motion of the hand operation, and a transmitting unit transmitting a sound signal of the microphone, a pressure signal of the pressure sensor, and a motion signal of the motion sensor; a receiving unit that receives the sound signal, the pressure signal, and the motion signal transmitted from the transmitting unit; a work determination unit that performs detection determination of a work content of the worker by using the sound signal, the pressure signal, and the motion signal; and a notification unit that notifies a determination result of the work determination unit.
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