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公开(公告)号:US09799759B2
公开(公告)日:2017-10-24
申请号:US15043935
申请日:2016-02-15
申请人: INTEL CORPORATION
发明人: Ravi Pillarisetty , Jack T. Kavalieros , Willy Rachmady , Uday Shah , Benjamin Chu-Kung , Marko Radosavljevic , Niloy Mukherjee , Gilbert Dewey , Been Y. Jin , Robert S. Chau
IPC分类号: H01L29/26 , H01L29/775 , B82Y10/00 , H01L29/267 , H01L29/66 , H01L29/778 , H01L21/76 , H01L29/78 , H01L29/10 , H01L29/06 , H01L29/15 , H01L29/51 , H01L29/165
CPC分类号: H01L29/775 , B82Y10/00 , H01L21/76 , H01L29/0653 , H01L29/1054 , H01L29/155 , H01L29/165 , H01L29/267 , H01L29/517 , H01L29/66431 , H01L29/66439 , H01L29/66477 , H01L29/66795 , H01L29/66977 , H01L29/7782 , H01L29/7849 , H01L29/785 , H01L29/7851
摘要: Techniques are disclosed for forming a non-planar germanium quantum well structure. In particular, the quantum well structure can be implemented with group IV or III-V semiconductor materials and includes a germanium fin structure. In one example case, a non-planar quantum well device is provided, which includes a quantum well structure having a substrate (e.g. SiGe or GaAs buffer on silicon), a IV or III-V material barrier layer (e.g., SiGe or GaAs or AlGaAs), a doping layer (e.g., delta/modulation doped), and an undoped germanium quantum well layer. An undoped germanium fin structure is formed in the quantum well structure, and a top barrier layer deposited over the fin structure. A gate metal can be deposited across the fin structure. Drain/source regions can be formed at respective ends of the fin structure.
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公开(公告)号:US10236369B2
公开(公告)日:2019-03-19
申请号:US15790907
申请日:2017-10-23
申请人: INTEL CORPORATION
发明人: Ravi Pillarisetty , Jack T. Kavalieros , Willy Rachmady , Uday Shah , Benjamin Chu-Kung , Marko Radosavljevic , Niloy Mukherjee , Gilbert Dewey , Been Y. Jin , Robert S. Chau
IPC分类号: H01L29/775 , B82Y10/00 , H01L29/267 , H01L29/66 , H01L29/778 , H01L21/76 , H01L29/78 , H01L29/10 , H01L29/06 , H01L29/15 , H01L29/51 , H01L29/165
摘要: Techniques are disclosed for forming a non-planar germanium quantum well structure. In particular, the quantum well structure can be implemented with group IV or III-V semiconductor materials and includes a germanium fin structure. In one example case, a non-planar quantum well device is provided, which includes a quantum well structure having a substrate (e.g. SiGe or GaAs buffer on silicon), a IV or III-V material barrier layer (e.g., SiGe or GaAs or AlGaAs), a doping layer (e.g., delta/modulation doped), and an undoped germanium quantum well layer. An undoped germanium fin structure is formed in the quantum well structure, and a top barrier layer deposited over the fin structure. A gate metal can be deposited across the fin structure. Drain/source regions can be formed at respective ends of the fin structure.
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公开(公告)号:US09153671B2
公开(公告)日:2015-10-06
申请号:US14141648
申请日:2013-12-27
申请人: Intel Corporation
发明人: Ravi Pillarisetty , Jack T. Kavalieros , Willy Rachmady , Uday Shah , Benjamin Chu-Kung , Marko Radosavljevic , Niloy Mukherjee , Gilbert Dewey , Been Y. Jin , Robert S. Chau
IPC分类号: H01L29/66 , B82Y10/00 , H01L29/267 , H01L29/775 , H01L29/778 , H01L21/76 , H01L29/78 , H01L29/10 , H01L29/51
CPC分类号: H01L29/775 , B82Y10/00 , H01L21/76 , H01L29/0653 , H01L29/1054 , H01L29/155 , H01L29/165 , H01L29/267 , H01L29/517 , H01L29/66431 , H01L29/66439 , H01L29/66477 , H01L29/66795 , H01L29/66977 , H01L29/7782 , H01L29/7849 , H01L29/785 , H01L29/7851
摘要: Techniques are disclosed for forming a non-planar germanium quantum well structure. In particular, the quantum well structure can be implemented with group IV or III-V semiconductor materials and includes a germanium fin structure. In one example case, a non-planar quantum well device is provided, which includes a quantum well structure having a substrate (e.g. SiGe or GaAs buffer on silicon), a IV or III-V material barrier layer (e.g., SiGe or GaAs or AlGaAs), a doping layer (e.g., delta/modulation doped), and an undoped germanium quantum well layer. An undoped germanium fin structure is formed in the quantum well structure, and a top barrier layer deposited over the fin structure. A gate metal can be deposited across the fin structure. Drain/source regions can be formed at respective ends of the fin structure.
摘要翻译: 公开了用于形成非平面锗量子阱结构的技术。 特别地,量子阱结构可以用IV或III-V族半导体材料实现,并且包括锗鳍结构。 在一个示例性情况下,提供了非平面量子阱器件,其包括具有衬底(例如硅上的SiGe或GaAs缓冲器),IV或III-V材料阻挡层(例如,SiGe或GaAs或 AlGaAs),掺杂层(例如,掺杂Δ/调制)和未掺杂的锗量子阱层。 在量子阱结构中形成未掺杂的锗鳍结构,以及沉积在鳍结构上的顶部势垒层。 栅极金属可以跨鳍片结构沉积。 排水/源极区域可以形成在翅片结构的相应端部处。
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