公开(公告)号：US20230307352A1

公开(公告)日：2023-09-28

申请号：US17704410

申请日：2022-03-25

Applicant: Intel Corporation

Inventor： Miriam R. Reshotko ,  Van H. Le ,  Travis W. Lajoie ,  Abhishek Anil Sharma

IPC: H01L23/522 ,  H01L23/532 ,  H01L27/108

CPC classification number: H01L23/5226 ,  H01L23/5329 ,  H01L27/10814 ,  H01L27/10894

Abstract: Techniques are provided herein for forming backend memory structures with airgaps in an interconnect region above semiconductor devices. The airgaps may be provided between conductive features, such as wordlines, to reduce parasitic capacitance. An interconnect region above a plurality of semiconductor devices includes any number of interconnect layers. A first interconnect layer includes first conductive layers (e.g., wordlines) extending in a first direction with airgaps between adjacent first conductive layers. A second interconnect layer over the first interconnect layer includes at least portions of memory cells over corresponding first conductive layers. A third interconnect layer over the second interconnect layer includes a second conductive layer (e.g., bitline) extending in a second direction over one or more of the at least portions of memory cells. The presence of airgaps between the first conductive layers allows for a tighter pitch between memory cells and reduced total energy consumption among the memory cells.

公开(公告)号：US20200035839A1

公开(公告)日：2020-01-30

申请号：US16043593

申请日：2018-07-24

Applicant: Intel Corporation

Inventor： Shriram Shivaraman ,  Van H. Le ,  Abhishek A. Sharma ,  Gilbert W. Dewey ,  Benjamin Chu-Kung ,  Miriam R. Reshotko ,  Jack T. Kavalieros ,  Tahir Ghani

IPC: H01L29/786 ,  H01L29/66 ,  H01L29/06 ,  H01L29/423 ,  H01L21/02 ,  H01L21/768 ,  H01L23/00

Abstract: Disclosed herein are transistor gate-channel arrangements that may be implemented in nanowire thin film transistors (TFTs) with textured semiconductors, and related methods and devices. An example transistor gate-channel arrangement may include a substrate, a channel material that includes a textured thin film semiconductor material shaped as a nanowire, a gate dielectric that at least partially wraps around the nanowire, and a gate electrode material that wraps around the gate dielectric. Implementing textured thin film semiconductor channel materials shaped as a nanowire and having a gate stack of a gate dielectric and a gate electrode material wrapping around the nanowire advantageously allows realizing gate all-around or bottom-gate transistor architectures for TFTs with textured semiconductor channel materials.

公开(公告)号：US12183831B2

公开(公告)日：2024-12-31

申请号：US16638301

申请日：2017-09-29

Applicant: Intel Corporation

Inventor： Van H. Le ,  Abhishek A. Sharma ,  Benjamin Chu-Kung ,  Gilbert Dewey ,  Ravi Pillarisetty ,  Miriam R. Reshotko ,  Shriram Shivaraman ,  Li Huey Tan ,  Tristan A. Tronic ,  Jack T. Kavalieros

IPC: H01L29/786 ,  H01L27/12 ,  H01L29/40 ,  H01L29/417

Abstract: Embodiments herein describe techniques for a semiconductor device, which may include a substrate, and a U-shaped channel above the substrate. The U-shaped channel may include a channel bottom, a first channel wall and a second channel wall parallel to each other, a source area, and a drain area. A gate dielectric layer may be above the substrate and in contact with the channel bottom. A gate electrode may be above the substrate and in contact with the gate dielectric layer. A source electrode may be coupled to the source area, and a drain electrode may be coupled to the drain area. Other embodiments may be described and/or claimed.

公开(公告)号：US10665499B2

公开(公告)日：2020-05-26

申请号：US16021352

申请日：2018-06-28

Applicant: Intel Corporation

Inventor： Miriam R. Reshotko ,  Nafees A. Kabir ,  Manish Chandhok

IPC: H01L21/768 ,  H01L21/311 ,  H01L23/532 ,  H01L23/522 ,  H01L23/482

Abstract: An embodiment includes first, second, and third metal layers; first, second, and third metal lines included in the second metal layer; a layer including airgaps, the first metal layer being between the layer including airgaps and the second metal layer; a first void between the first and second metal lines and a second void between the second and third metal lines; a conformal layer between the first and second metal lines; an additional layer between the first and second metal layers; wherein the first void includes air and the second void includes air; wherein a first axis intersects the first, second, and third metal lines and the first and second voids; wherein a second axis, orthogonal to the first axis, intersects the conformal layer and the additional layer; wherein a third axis, orthogonal to the first axis, intersects the second metal line and the additional layer.

公开(公告)号：US11749560B2

公开(公告)日：2023-09-05

申请号：US16141522

申请日：2018-09-25

Applicant: INTEL CORPORATION

Inventor： Thomas Marieb ,  Zhiyong Ma ,  Miriam R. Reshotko ,  Christopher Jezewski ,  Flavio Griggio ,  Rahim Kasim ,  Nikholas G. Toledo

IPC: H01L21/768 ,  H01L23/532 ,  C25D3/58 ,  C23C18/48

CPC classification number: H01L21/76802 ,  C23C18/48 ,  C25D3/58 ,  H01L21/76849 ,  H01L21/76852 ,  H01L23/53223 ,  H01L23/53238

Abstract: Techniques are disclosed for providing cladded metal interconnects. Given an interconnect trench, a barrier layer is conformally deposited onto the bottom and sidewalls of the trench. A first layer of a bilayer adhesion liner is selectively deposited on the barrier layer, and a second layer of the bilayer adhesion liner is selectively deposited on the first layer. An interconnect metal is deposited into the trench above the bilayer adhesion liner. Any excess interconnect metal is recessed to get the top surface of the interconnect metal to a proper plane. Recessing the excess interconnect metal may include recessing previously deposited excess adhesion liner and barrier layer materials. The exposed top surface of the interconnect metal in the trench is then capped with the bilayer adhesion liner materials to provide a cladded metal interconnect core. In some embodiments, the adhesion liner is a single layer adhesion liner.

公开(公告)号：US11610810B2

公开(公告)日：2023-03-21

申请号：US16230250

申请日：2018-12-21

Applicant: Intel Corporation

Inventor： Miriam R. Reshotko ,  Richard E. Schenker ,  Nafees Kabir

IPC: H01L21/768

Abstract: A method for fabricating an integrated circuit comprises forming one or more conductive features supported by pillars of a first insulating layer in a first metal layer. One or more vias are formed in a via layer, the one or more vias over and on the first metal layer and in electrical connection with ones of the one or more conductive features. Subsequent to via formation, air gaps are between adjacent ones of the one or more conductive features in the first metal layer to separate the one or more conductive features. A second insulating layer is formed over the one or more conductive features and over the one or more vias, such that the second insulating layer covers the first metal layer and the via layer while bridging over the air gaps, wherein tops the air gaps are substantially coplanar with tops of the one or more conductive features.

公开(公告)号：US20230371233A1

公开(公告)日：2023-11-16

申请号：US17742628

申请日：2022-05-12

Applicant: Intel Corporation

Inventor： Abhishek Anil Sharma ,  Travis W. Lajoie ,  Forough Mahmoudabadi ,  Shailesh Kumar Madisetti ,  Van H. Le ,  Timothy Jen ,  Cheng Tan ,  Jisoo Kim ,  Miriam R. Reshotko ,  Vishak Venkatraman ,  Eva Vo ,  Yue Zhong ,  Yu-Che Chiu ,  Moshe Dolejsi ,  Lorenzo Ferrari ,  Akash Kannegulla ,  Deepyanti Taneja ,  Mark Armstrong ,  Kamal H. Baloch ,  Afrin Sultana ,  Albert B. Chen ,  Vamsi Evani ,  Yang Yang ,  Juan G. Alzate-Vinasco ,  Fatih Hamzaoglu

IPC: H01L27/108 ,  H01L23/528 ,  H01L29/786 ,  H01L29/94

CPC classification number: H01L27/10805 ,  H01L23/5283 ,  H01L29/78696 ,  H01L29/94

Abstract: Techniques are provided herein for forming multi-tier memory structures with graded characteristics across different tiers. A given memory structure includes memory cells, with a given memory cell having an access device and a storage device. The access device may include, for example, a thin film transistor (TFT) structure, and the storage device may include a capacitor. Certain geometric or material parameters of the memory structures can be altered in a graded fashion across any number of tiers to compensate for process effects that occur when fabricating a given tier, which also affect any lower tiers. This may be done to more closely match the performance of the memory arrays across each of the tiers.

公开(公告)号：US11417775B2

公开(公告)日：2022-08-16

申请号：US16043593

申请日：2018-07-24

Applicant: Intel Corporation

Inventor： Shriram Shivaraman ,  Van H. Le ,  Abhishek A. Sharma ,  Gilbert W. Dewey ,  Benjamin Chu-Kung ,  Miriam R. Reshotko ,  Jack T. Kavalieros ,  Tahir Ghani

IPC: H01L29/786 ,  H01L29/66 ,  H01L29/06 ,  H01L29/423 ,  H01L21/02 ,  H01L21/768 ,  H01L23/00

Abstract: Disclosed herein are transistor gate-channel arrangements that may be implemented in nanowire thin film transistors (TFTs) with textured semiconductors, and related methods and devices. An example transistor gate-channel arrangement may include a substrate, a channel material that includes a textured thin film semiconductor material shaped as a nanowire, a gate dielectric that at least partially wraps around the nanowire, and a gate electrode material that wraps around the gate dielectric. Implementing textured thin film semiconductor channel materials shaped as a nanowire and having a gate stack of a gate dielectric and a gate electrode material wrapping around the nanowire advantageously allows realizing gate all-around or bottom-gate transistor architectures for TFTs with textured semiconductor channel materials.

公开(公告)号：US20230369506A1

公开(公告)日：2023-11-16

申请号：US17742649

申请日：2022-05-12

Applicant: Intel Corporation

Inventor： Abhishek Anil Sharma ,  Miriam R. Reshotko ,  Van H. Le ,  Travis W. Lajoie ,  Mark Armstrong ,  Cheng Tan ,  Timothy Jen ,  Moshe Dolejsi ,  Deepyanti Taneja

IPC: H01L29/786 ,  H01L23/528 ,  H01L23/522 ,  H01L27/108

CPC classification number: H01L29/78645 ,  H01L23/5283 ,  H01L23/5226 ,  H01L27/10814

Abstract: Techniques are provided herein for forming thin film transistor structures having a laterally recessed gate electrode. The gate electrode may be recessed such that it does not extend under one or both conductive contacts of the transistor. Recessing the lateral dimensions of the gate electrode can reduce gate leakage current and parasitic capacitance. According to an example, a given memory structure generally includes memory cells, with each memory cell having an access device and a storage device. According to some such embodiments, the memory cells are arranged in a two-dimensional array within one or more interconnect layers and stacked in a vertical direction such that multiple tiers of memory cell arrays are formed within the interconnect region. Any of the given TFT structures may include a gate electrode that is laterally recessed such that one or more of the contacts are not directly over the gate electrode.

公开(公告)号：US20220406782A1

公开(公告)日：2022-12-22

申请号：US17351301

申请日：2021-06-18

Applicant: Intel Corporation

Inventor： Abhishek A. Sharma ,  Albert B. Chen ,  Wilfred Gomes ,  Fatih Hamzaoglu ,  Travis W. Lajoie ,  Van H. Le ,  Alekhya Nimmagadda ,  Miriam R. Reshotko ,  Hui Jae Yoo

IPC: H01L27/108 ,  H01L29/06 ,  H01L23/528

Abstract: An example IC device includes a frontend layer and a backend layer with a metallization stack. The metallization stack includes a backend memory layer with a plurality of memory cells with backend transistors, and a layer with a plurality of conductive interconnects (e.g., a plurality of conductive lines) and air gaps between adjacent ones of the plurality of interconnects. Providing air gaps in upper metal layers of metallization stacks of IC devices may advantageously reduce parasitic effects in the IC devices because such effects are typically proportional to the dielectric constant of a surrounding medium. In turn, reduction in the parasitic effects may lead to improvements in performance of, or requirements placed on, the backend memory.