公开(公告)号：US20060099779A1

公开(公告)日：2006-05-11

申请号：US11305444

申请日：2005-12-16

申请人： Ian Cayrefourcq ,  Carlos Mazure ,  Konstantin Bourdelle

发明人： Ian Cayrefourcq ,  Carlos Mazure ,  Konstantin Bourdelle

IPC分类号： H01L21/20 ,  H01L21/28

CPC分类号： H01L21/76254

摘要： The present invention relates to a method for transferring a thin useful layer from a donor substrate having an ordered crystalline structure to a receiver substrate. The method includes creation of a weakened zone in the donor substrate to define the layer to be transferred from the donor substrate. The crystalline structure of a surface region of the donor substrate is disturbed so as to create a disturbed superficial region within the thickness of the donor substrate, and thus define a disturbance interface between the disturbed superficial region and a subjacent region of the donor substrate for which the crystalline structure remains unchanged. Next, the donor substrate is subjected to a recrystallization annealing in order to at least partial recrystallize of the disturbed region, starting from the crystalline structure of the subjacent region of the donor substrate, and to create a zone of crystalline defects in the plane of the disturbance interface. One or several species are introduced into the thickness of the donor substrate to create the weakened zone, with the species being introduced with introduction parameters that are adjusted to introduce a maximum number of species at the zone of crystalline defects.

摘要翻译： 本发明涉及一种从具有有序晶体结构的施主衬底向接收衬底转移薄有用层的方法。 该方法包括在施主衬底中产生弱化区以限定要从供体衬底转移的层。 施主衬底的表面区域的晶体结构受到干扰，从而在施主衬底的厚度内产生干扰的表面区域，从而限定受干扰的表面区域和施主衬底的下部区域之间的干扰界面， 晶体结构保持不变。 接下来，对施主衬底进行再结晶退火，以便从施主衬底的下部区域的结晶结构开始至少部分地重新结晶受阻区域，并在该平面内产生晶体缺陷区域 扰动界面。 将一个或多个物质引入施主衬底的厚度以产生弱化区域，其中引入物质，引入参数被调整以在晶体缺陷区域引入最大数量的物质。

公开(公告)号：US07799651B2

公开(公告)日：2010-09-21

申请号：US12165365

申请日：2008-06-30

申请人： Carlos Mazure ,  Ian Cayrefourcq ,  Konstantin Bourdelle

发明人： Carlos Mazure ,  Ian Cayrefourcq ,  Konstantin Bourdelle

IPC分类号： H01L21/331

CPC分类号： H01L21/187 ,  H01L21/02381 ,  H01L21/02532 ,  H01L21/02667 ,  H01L21/26506 ,  H01L21/324 ,  H01L21/76254 ,  H01L29/045

摘要： The present invention relates to a method of treating a structure produced from semiconductor materials, wherein the structure includes a first and second substrates defining a common interface that has defects. The method includes forming a layer, called the disorganized layer, which includes the interface, in which at least a part of the crystal lattice is disorganized; and reorganizing the crystal lattice of the disorganized layer in order to force the defects back deeper into the first substrate.

摘要翻译： 本发明涉及一种处理由半导体材料制成的结构的方法，其中该结构包括限定具有缺陷的公共接口的第一和第二基板。 所述方法包括形成称为所述无组织层的层，所述层包括所述界面，其中所述晶格的至少一部分被混杂; 并重新组织无组织层的晶格，以迫使缺陷更深地进入第一衬底。

公开(公告)号：US07387947B2

公开(公告)日：2008-06-17

申请号：US11305444

申请日：2005-12-16

申请人： Ian Cayrefourcq ,  Carlos Mazure ,  Konstantin Bourdelle

发明人： Ian Cayrefourcq ,  Carlos Mazure ,  Konstantin Bourdelle

IPC分类号： H01L21/20

CPC分类号： H01L21/76254

摘要： The present invention relates to a method for transferring a thin useful layer from a donor substrate having an ordered crystalline structure to a receiver substrate. The method includes creation of a weakened zone in the donor substrate to define the layer to be transferred from the donor substrate. The crystalline structure of a surface region of the donor substrate is disturbed so as to create a disturbed superficial region within the thickness of the donor substrate, and thus define a disturbance interface between the disturbed superficial region and a subjacent region of the donor substrate for which the crystalline structure remains unchanged. Next, the donor substrate is subjected to a recrystallization annealing in order to at least partial recrystallize of the disturbed region, starting from the crystalline structure of the subjacent region of the donor substrate, and to create a zone of crystalline defects in the plane of the disturbance interface. One or several species are introduced into the thickness of the donor substrate to create the weakened zone, with the species being introduced with introduction parameters that are adjusted to introduce a maximum number of species at the zone of crystalline defects.

摘要翻译： 本发明涉及一种从具有有序晶体结构的施主衬底向接收衬底转移薄有用层的方法。 该方法包括在施主衬底中产生弱化区以限定要从供体衬底转移的层。 施主衬底的表面区域的晶体结构受到干扰，从而在施主衬底的厚度内产生干扰的表面区域，从而限定受干扰的表面区域和施主衬底的下部区域之间的扰动界面， 晶体结构保持不变。 接下来，对施主衬底进行再结晶退火，以便从施主衬底的下部区域的结晶结构开始至少部分地重新结晶受阻区域，并在该平面内产生晶体缺陷区域 扰动界面。 将一个或多个物质引入施主衬底的厚度以产生弱化区域，其中引入物质，引入参数被调整以在晶体缺陷区域引入最大数量的物质。

公开(公告)号：US20090014720A1

公开(公告)日：2009-01-15

申请号：US12165365

申请日：2008-06-30

申请人： Carlos MAZURE ,  Ian Cayrefourcq ,  Konstantin Bourdelle

发明人： Carlos MAZURE ,  Ian Cayrefourcq ,  Konstantin Bourdelle

IPC分类号： H01L21/30 ,  H01L29/04

CPC分类号： H01L21/187 ,  H01L21/02381 ,  H01L21/02532 ,  H01L21/02667 ,  H01L21/26506 ,  H01L21/324 ,  H01L21/76254 ,  H01L29/045

摘要： The present invention relates to a method of treating a structure produced from semiconductor materials, wherein the structure includes a first and second substrates defining a common interface that has defects. The method includes forming a layer, called the disorganized layer, which includes the interface, in which at least a part of the crystal lattice is disorganized; and reorganizing the crystal lattice of the disorganized layer in order to force the defects back deeper into the first substrate.

摘要翻译： 本发明涉及一种处理由半导体材料制成的结构的方法，其中该结构包括限定具有缺陷的公共接口的第一和第二基板。 所述方法包括形成称为所述无组织层的层，所述层包括所述界面，其中所述晶格的至少一部分被混杂; 并重新组织无组织层的晶格，以迫使缺陷更深地进入第一衬底。

公开(公告)号：US07572331B2

公开(公告)日：2009-08-11

申请号：US11518366

申请日：2006-09-08

申请人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Mark Kennard

发明人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Mark Kennard

IPC分类号： C30B25/18

CPC分类号： H01L21/0262 ,  H01L21/02378 ,  H01L21/02381 ,  H01L21/02395 ,  H01L21/02439 ,  H01L21/0245 ,  H01L21/0251 ,  H01L21/02532

摘要： The present invention relates to a method of manufacturing a wafer comprising a single crystalline bulk substrate of a first material and at least one epitaxial layer of a second material which has a lattice different from the lattice of the first material. The present invention provides a method for manufacturing a wafer in which a layer which is lattice-mismatched with the substrate can be grown on the substrate with a high effectiveness and high quality at a low cost. A roughening step is included for roughening the surface of the bulk substrate and a growing step is included for growing the second material on the rough surface with a reduced number of threading dislocations and an enhanced strain relaxation compared to a second material that is epitaxially grown on a polished surface.

摘要翻译： 本发明涉及一种制造晶片的方法，该方法包括第一材料的单晶体体衬底和具有与第一材料的晶格不同的晶格的第二材料的至少一个外延层。 本发明提供了一种制造晶片的方法，其中可以以低成本以高效率和高质量在衬底上生长与衬底晶格失配的层。 包括粗糙化步骤以粗化本体衬底的表面，并且包括生长步骤，用于在粗糙表面上生长第二材料，数量较少的穿透位错和与外延生长的第二材料相比增强的应变松弛 抛光表面。

公开(公告)号：US20050188915A1

公开(公告)日：2005-09-01

申请号：US10916254

申请日：2004-08-11

申请人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Kennard Mark

发明人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Kennard Mark

IPC分类号： H01L21/20 ,  C30B1/00 ,  C30B23/00 ,  C30B25/00 ,  C30B28/12 ,  C30B28/14 ,  H01L21/31 ,  H01L21/469

CPC分类号： H01L21/0262 ,  H01L21/02378 ,  H01L21/02381 ,  H01L21/02395 ,  H01L21/02439 ,  H01L21/0245 ,  H01L21/0251 ,  H01L21/02532

摘要： The present invention relates to a method of manufacturing a wafer comprising a single crystalline bulk substrate of a first material and at least one epitaxial layer of a second material which has a lattice different from the lattice of the first material. The present invention provides a method for manufacturing a wafer in which a layer which is lattice-mismatched with the substrate can be grown on the substrate with a high effectiveness and high quality at a low cost. A roughening step is included for roughening the surface of the bulk substrate and a growing step is included for growing the second material on the rough surface with a reduced number of threading dislocations and an enhanced strain relaxation compared to a second material that is epitaxially grown on a polished surface.

摘要翻译： 本发明涉及一种制造晶片的方法，该方法包括第一材料的单晶体体衬底和具有与第一材料的晶格不同的晶格的第二材料的至少一个外延层。 本发明提供了一种制造晶片的方法，其中可以以低成本以高效率和高质量在衬底上生长与衬底晶格失配的层。 包括粗糙化步骤以粗化本体衬底的表面，并且包括生长步骤，用于在粗糙表面上生长第二材料，数量较少的穿透位错和与外延生长的第二材料相比增强的应变松弛 抛光表面。

公开(公告)号：US08309431B2

公开(公告)日：2012-11-13

申请号：US10577175

申请日：2004-10-28

申请人： Nguyet-Phuong Nguyen ,  Ian Cayrefourcq ,  Christelle Lagahe-Blanchard ,  Konstantin Bourdelle ,  Aurélie Tauzin ,  Franck Fournel

发明人： Nguyet-Phuong Nguyen ,  Ian Cayrefourcq ,  Christelle Lagahe-Blanchard ,  Konstantin Bourdelle ,  Aurélie Tauzin ,  Franck Fournel

IPC分类号： H01L21/46

CPC分类号： H01L21/76254

摘要： A method for self-supported transfer of a fine layer, in which at least one species of ions is implanted in a source-substrate at a specified depth in relation to the surface of the source-substrate. A stiffener is applied in intimate contact with the source-substrate and the source-substrate undergoes a heat treatment at a specified temperature during a specified period of time in order to create an embrittled buried area substantially at the specified depth without causing a thin layer, defined between the surface and the embrittled buried layer in relation to the remainder of the source-substrate, to become thermally detached. A controlled localized energy pulse is applied to the source-substrate in order to cause the self-supported detachment of the thin layer.

摘要翻译： 一种用于自支撑转移细层的方法，其中将至少一种离子注入相对于源 - 衬底表面的指定深度的源极 - 衬底中。 施加加强件以与源 - 基板紧密接触，并且源 - 基板在特定时间段内在特定温度下进行热处理，以便在基本上在指定深度处产生脆弱的掩埋区域而不产生薄层， 相对于源极 - 基板的其余部分，在表面和脆化的掩埋层之间限定为热分离。 将受控的局部能量脉冲施加到源 - 衬底，以引起薄层的自支撑分离。

公开(公告)号：US07645486B2

公开(公告)日：2010-01-12

申请号：US11677696

申请日：2007-02-22

申请人： Konstantin Bourdelle ,  Nicolas Daval ,  Ian Cayrefourcq ,  Steven R. A. Van Aerde ,  Marinus J. M. De Blank ,  Cornelius A. Van Der Jeugd

发明人： Konstantin Bourdelle ,  Nicolas Daval ,  Ian Cayrefourcq ,  Steven R. A. Van Aerde ,  Marinus J. M. De Blank ,  Cornelius A. Van Der Jeugd

IPC分类号： C23C16/40

CPC分类号： H01L21/31612 ,  C23C16/402 ,  H01L21/02164 ,  H01L21/02216 ,  H01L21/02271

摘要： The invention relates to a of manufacturing a silicon dioxide layer of low roughness, that includes depositing a layer of silicon dioxide over a substrate by a low pressure chemical vapor deposition (LPCVD) process, the deposition process employing simultaneously a flow of tetraethylorthosilicate (TEOS) as the source material for the film deposition and a flow of a diluant gas that it not reactive with TEOS, so that the diluant gas/TEOS flow ratio is between 0.5 and 100; and annealing the silicon dioxide layer at a temperature between 600° C. and 1200° C., for a duration between 10 minutes and 6 hours.

摘要翻译： 本发明涉及一种制造低粗糙度的二氧化硅层的方法，其包括通过低压化学气相沉积（LPCVD）工艺在衬底上沉积二氧化硅层，该沉积工艺同时采用原硅酸四乙酯（TEOS ）作为膜沉积的源材料和与TEOS不反应的稀释气体流，使得稀释气体/ TEOS流量比在0.5和100之间; 并在600℃和1200℃之间的温度下将二氧化硅层退火10分钟至6小时。

公开(公告)号：US07407548B2

公开(公告)日：2008-08-05

申请号：US10916254

申请日：2004-08-11

申请人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Mark Kennard

发明人： Konstantin Bourdelle ,  Ian Cayrefourcq ,  Mark Kennard

IPC分类号： C30B25/04

CPC分类号： H01L21/0262 ,  H01L21/02378 ,  H01L21/02381 ,  H01L21/02395 ,  H01L21/02439 ,  H01L21/0245 ,  H01L21/0251 ,  H01L21/02532

摘要： The present invention relates to a method of manufacturing a wafer comprising a single crystalline bulk substrate of a first material and at least one epitaxial layer of a second material which has a lattice different from the lattice of the first material. The present invention provides a method for manufacturing a wafer in which a layer which is lattice-mismatched with the substrate can be grown on the substrate with a high effectiveness and high quality at a low cost. A roughening step is included for roughening the surface of the bulk substrate and a growing step is included for growing the second material on the rough surface with a reduced number of threading dislocations and an enhanced strain relaxation compared to a second material that is epitaxially grown on a polished surface.

摘要翻译： 本发明涉及一种制造晶片的方法，该方法包括第一材料的单晶体体衬底和具有与第一材料的晶格不同的晶格的第二材料的至少一个外延层。 本发明提供了一种制造晶片的方法，其中可以以低成本以高效率和高质量在衬底上生长与衬底晶格失配的层。 包括粗糙化步骤以粗化本体衬底的表面，并且包括生长步骤，用于在粗糙表面上生长第二材料，数量较少的穿透位错和与外延生长的第二材料相比增强的应变松弛 抛光表面。

公开(公告)号：US20070281445A1

公开(公告)日：2007-12-06

申请号：US10577175

申请日：2004-10-28

申请人： Nguyet-Phuong Nguyen ,  Ian Cayrefourcq ,  Christelle Lagahe-Blanchard ,  Konstantin Bourdelle ,  Aurelie Tauzin ,  Franck Fournel

发明人： Nguyet-Phuong Nguyen ,  Ian Cayrefourcq ,  Christelle Lagahe-Blanchard ,  Konstantin Bourdelle ,  Aurelie Tauzin ,  Franck Fournel

IPC分类号： H01L21/304

CPC分类号： H01L21/76254

摘要： A method for self-supported transfer of a fine layer, in which at least one species of ions is implanted in a source-substrate at a specified depth in relation to the surface of the source-substrate. A stiffener is applied in intimate contact with the source-substrate and the source-substrate undergoes a heat treatment at a specified temperature during a specified period of time in order to create an embrittled buried area substantially at the specified depth without causing a thin layer, defined between the surface and the embrittled buried layer in relation to the remainder of the source-substrate, to become thermally detached. A controlled localized energy pulse is applied to the source-substrate in order to cause the self-supported detachment of the thin layer.

摘要翻译： 一种用于自支撑转移细层的方法，其中将至少一种离子注入相对于源 - 衬底表面的指定深度的源极 - 衬底中。 施加加强件以与源 - 基板紧密接触，并且源 - 基板在特定时间段内在特定温度下进行热处理，以便在基本上在指定深度处产生脆弱的掩埋区域而不产生薄层， 相对于源极 - 基板的其余部分，在表面和脆化的掩埋层之间限定为热分离。 将受控的局部能量脉冲施加到源 - 衬底，以引起薄层的自支撑分离。