COMPOSITE DRY FILM RESIST FOR PHOTOLITHOGRAPHY

    公开(公告)号:US20210318612A1

    公开(公告)日:2021-10-14

    申请号:US17356536

    申请日:2021-06-24

    Abstract: The present disclosure is directed to a patterning process that includes providing a composite dry film resist on a surface, in which the composite dry film resist includes a base film, a barrier layer and a resist layer, in which the base film is disposed over the barrier layer and the barrier layer is disposed over the resist layer. In another aspect, the patterning process includes removing the base film from the barrier layer and exposing the barrier layer to form an exposure precursor, which has a first area and a second area, further exposing the first area of the exposure precursor to electromagnetic irradiation, which passes through the barrier layer and the resist layer in the exposed first area becomes water-insoluble, and removing the barrier layer and the unexposed second area to form a pattern template.

    TOOLS AND METHODS FOR SURFACE LEVELING
    2.
    发明公开

    公开(公告)号:US20240282591A1

    公开(公告)日:2024-08-22

    申请号:US18171683

    申请日:2023-02-21

    CPC classification number: H01L21/486 C23F1/02

    Abstract: The present disclosure is directed to a planarization tool having at least one module with a target holder for supporting a target with a metal layer, at least one of a plurality of etch inhibitor dispensers for discharging an etch inhibitor toward the target, and a plurality of nozzles for discharging a chemical etchant at an angle towards the target to perform selective removal of the metal layer for planarization of the target. In an aspect, the plurality of etch inhibitor dispensers and the plurality of nozzles may be combined as a single unit to discharge the chemical etchant and the etch inhibitor together. In another aspect, the plurality of etch inhibitor dispensers and the plurality of nozzles may be configured in a single module or separate modules.

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