PACKAGE ARCHITECTURE WITH IMPROVED VIA DRILL PROCESS AND METHOD FOR FORMING SUCH PACKAGE

    公开(公告)号:US20190393183A1

    公开(公告)日:2019-12-26

    申请号:US16017393

    申请日:2018-06-25

    Abstract: Embodiments include a package substrate, a method of forming the package substrate, and a self-assembled monolayers (SAM) layer. The package substrate includes a SAM layer on portions of a conductive pad, where the SAM layer includes alight-reflective moieties. The package substrate also includes a via on a surface portion of the conductive pad, and a dielectric on and around the via, the SAM layer, and the conductive pad, where the SAM layer surrounds and contacts a surface of the via. The SAM layer may be an interfacial organic layer. The light-reflective moieties may include a hemicyanine, a cyclic-hemicyanine, an oligothiophene, and/or a conjugated aromatic compound. The SAM layer may include a molecular structure having a first end group of a first monolayer, an intermediate group, a fifth end group of a second monolayer, and one or more of a first and second light-reflective moieties.

    METHOD OF FORMING A PACKAGE SUBSTRATE
    3.
    发明公开

    公开(公告)号:US20240188222A1

    公开(公告)日:2024-06-06

    申请号:US18060595

    申请日:2022-12-01

    Abstract: The present disclosure is directed to a method providing a substrate core having a glass core layer with top and bottom surfaces and a build-up process performing operations to form a plurality of through-glass vias formed through the glass core layer and a plurality of conductive layers on the top and bottom surfaces of the glass core layer. As an integral part of the build-up process, a defect detection method may be used to detect defects in the glass core layer. The inspection for defects may be performed after selected operations. After one or more defect (e.g., crack) is uncovered, a repair process may be performed to repair the defects in the glass core layer. The repair of a defect may be performed immediately upon detection or after selected operations as a comprehensive repair of a group of defects.

    CHIPLET FIRST ARCHITECTURE FOR DIE TILING APPLICATIONS

    公开(公告)号:US20220238458A1

    公开(公告)日:2022-07-28

    申请号:US17716947

    申请日:2022-04-08

    Abstract: Embodiments disclosed herein include electronic packages and methods of forming such electronic packages. In an embodiment, the electronic package comprises a mold layer having a first surface and a second surface opposite the first surface, and a plurality of first dies embedded in the mold layer. In an embodiment, each of the plurality of first dies has a surface that is substantially coplanar with the first surface of the mold layer. In an embodiment, the electronic package further comprises a second die embedded in the mold layer. In an embodiment, the second die is positioned between the plurality of first dies and the second surface of the mold layer.

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