摘要:
In one embodiment, an environment for testing integrated circuits includes a first die coupled to a tester. The first die includes a removable connection configured to couple a signal from the first die with an adapter layer to a second die being tested. The removable connection may be an elastomeric interposer or a probe, for example.
摘要:
A ball grid array (BGA) package is disclosed. An interconnect structure is formed on a substrate that electrically connects the electrical device to be housed in the BGA package to the solder balls thereon. Contact pads are formed over the top surface of the substrate. These contact pads electrically connect to the interconnect structure. A layer of solder mask is formed over the substrate that includes openings that overlie the contact pads. The BGA is then completed using conventional process steps. Thereby, a BGA package is formed that includes contact pads disposed such that the contact pads are accessible from the top of the BGA package, making these contact pads easily accessible. Thus, when the BGA is attached to a circuit board, connection to circuits of the electrical device is obtainable.
摘要:
Architecture, circuitry, and methods are provided for programming, writing to, or reading from one or more integrated circuits which may be arranged upon a printed circuit board. Programming and read/write operations can, therefore, be done after integrated circuits are populated upon a printed circuit board to control those integrated circuits using a standard JTAG interface, well-known as the IEEE Std. 1149.1 interface. A shift register used to control one or more electronic subcomponents can be programmed, written to, or read from using JTAG programming languages. However, the shift register, or multiple shift registers, used to control electronic subcomponents need not be JTAG compliant. The shift registers may be those found within proprietary circuits, such as analog-to-digital converters or digital-to-analog converters, and include any shift register than receives serial data and produces parallel data, or vice-versa, where the loading and serial shifting of data is controlled using a generic interface, such as enable, reset, capture, etc. One or more shift registers can be distributed among one or more integrated circuits proprietary to the manufacturer of that circuit, and the circuits which embody the shift registers need not have a JTAG interface. Yet, the shift registers can be controlled by a single test access port (TAP) external to the integrated circuits, but which controls the non-JTAG compliant shift registers of each integrated circuit bearing the same. This allows a JTAG programming language which can be readily obtained off-the-shelf to control integrated circuits which do not recognize JTAG control signals, nor do such integrated circuits necessarily have a JTAG four-pin interface.
摘要:
A system is provided for testing a physical layer device, or various network portions connected to that physical layer device. The test system includes a random bit generator that, during use, produces a random pattern of bits clocked in parallel onto the transmit portion of the physical device. The parallel-fed information can then be serialized and selectably fed back to the receive input of the same physical device. The receive portion of the physical device can then deserialize the random pattern of bits, and present those bits to logic within the test system. The test system can, therefore, compare each of the random pattern of bits presented to the physical device with corresponding bits derived from the deserializer. If each bit within the random pattern of m bits forwarded to the serializer does not compare with each corresponding m bits forwarded from the deserializer, then the physical device is known to be a failure. Instructions which begin and end the test operation are forwarded from a test device that is linked to the test system by a JTAG access port configured according to IEEE Std. 1149.1. This allows non-proprietary instructions to be sent into the access port controller, using only a single input pin among the four-pin JTAG access port, where a decoder within the test system is programmed to decode that instruction and either begin or end the test operation. A clock generation circuit will generate a high speed clock, for use by the physical device, to allow the physical device to operate at speed without requiring a costly test system to generate a high-speed clock and signals proprietary to that test system.
摘要:
An embodiment of the present invention provides a method and apparatus that effectuates a direct functional interface directly with individual constituent subcomponents of the internal die component, or with particular circuit nodes or conductive trace locales of the surface mount package, without high frequency signal degradation or other electrical problems. An embodiment of the present invention also provides a method and apparatus that effectuates testing access, directly to the internal die component of the surface mount package or to a particular circuit node or conductive trace locale of the surface mount package, enabling performance evaluation and system debugging. Further, an embodiment of the present invention provides a method and apparatus that effectuates integration of surface mount package with an opto-electronic package. Further still, an embodiment of the present invention provides a method and apparatus that achieves these advantages with minimal cost.
摘要:
In one embodiment, a device is packaged using a low-cost thermally enhanced ball grid array (LCTE-BGA) package. The device may include a die with its backside mounted to the bottom side of a multi-layer packaging substrate. Thermal vias may be formed through the substrate to allow heat to be conducted away from the backside of the die to a top most metal layer of the substrate. Thermal balls may be attached to the bottom side of the substrate on the same plane as the die.
摘要:
An apparatus and method integrates optical transceivers for transfer of signals between optical and electronic media with surface mount packages, such as ball grid arrays and quad flat packs. A surface mount package is positioned directly beneath a modular optical transceiver. The surface mount package provides for electrically coupling external signals to the optical transceiver, so as to allow full performance functionality of data transfer components. An electrical coupling mechanism with high performance at high frequency is positioned between the surface mount package and the optical transceiver, electrically connecting them. In one implementation, the optical transceiver module is mounted directly to said surface mount package such that it is removable. In one embodiment, heat dissipation is provided by integral components and thermal vias, in addition to heat sinks. The apparatus, in one embodiment, allows optical transceivers to be modular and changeable, without connectors which can degrade high frequency signal transfer.