Semiconductor device having a resistor and methods of forming the same
    8.
    发明授权
    Semiconductor device having a resistor and methods of forming the same 有权
    具有电阻器的半导体器件及其形成方法

    公开(公告)号:US08154104B2

    公开(公告)日:2012-04-10

    申请号:US12077379

    申请日:2008-03-19

    IPC分类号: H01L27/06

    摘要: In a semiconductor device and a method of making the same, the semiconductor device comprises a substrate including a first region and a second region. At least one first gate structure is on the substrate in the first region, the at least one first gate structure including a first gate insulating layer and a first gate electrode layer on the first gate insulating layer. At least one isolating structure is in the substrate in the second region, a top surface of the isolating structure being lower in height than a top surface of the substrate. At least one resistor pattern is on the at least one isolating structure.

    摘要翻译: 在半导体器件及其制造方法中,半导体器件包括包括第一区域和第二区域的衬底。 至少一个第一栅极结构在第一区域中的衬底上,所述至少一个第一栅极结构包括第一栅极绝缘层和第一栅极绝缘层上的第一栅极电极层。 至少一个隔离结构位于第二区域中的衬底中,隔离结构的顶表面的高度低于衬底的顶表面。 至少一个隔离结构上至少有一个电阻器图案。

    Semiconductor device having a resistor and methods of forming the same
    9.
    发明申请
    Semiconductor device having a resistor and methods of forming the same 有权
    具有电阻器的半导体器件及其形成方法

    公开(公告)号:US20090051008A1

    公开(公告)日:2009-02-26

    申请号:US12077379

    申请日:2008-03-19

    IPC分类号: H01L27/06 H01L21/02 H01L21/28

    摘要: In a semiconductor device and a method of making the same, the semiconductor device comprises a substrate including a first region and a second region. At least one first gate structure is on the substrate in the first region, the at least one first gate structure including a first gate insulating layer and a first gate electrode layer on the first gate insulating layer. At least one isolating structure is in the substrate in the second region, a top surface of the isolating structure being lower in height than a top surface of the substrate. At least one resistor pattern is on the at least one isolating structure.

    摘要翻译: 在半导体器件及其制造方法中,半导体器件包括包括第一区域和第二区域的衬底。 至少一个第一栅极结构在第一区域中的衬底上,所述至少一个第一栅极结构包括第一栅极绝缘层和第一栅极绝缘层上的第一栅极电极层。 至少一个隔离结构位于第二区域中的衬底中,隔离结构的顶表面的高度低于衬底的顶表面。 至少一个隔离结构上至少有一个电阻器图案。