Manufacturing method of semiconductor device including peeling step and semiconductor device using the same
    1.
    发明申请
    Manufacturing method of semiconductor device including peeling step and semiconductor device using the same 有权
    包括剥离步骤的半导体器件的制造方法和使用其的半导体器件

    公开(公告)号:US20060270189A1

    公开(公告)日:2006-11-30

    申请号:US11442216

    申请日:2006-05-30

    IPC分类号: H01L21/46 H01L23/00

    CPC分类号: H01L27/12 H01L21/84

    摘要: To simplify a peeling step in a method for manufacturing a semiconductor device including the peeling step. A first layer having a metal film is formed over a substrate; a second layer having a transistor is formed over the first layer having the metal film; a resin material is applied over the layer having the transistor; the resin material is cured by a heat treatment at a first heat treatment temperature to form a resin layer; the layer having the transistor is peeled from the substrate by a heat treatment at a second heat treatment temperature which is higher than the first heat treatment temperature; and the resin layer is peeled from the layer having the transistor by a heat treatment at a third heat treatment temperature which is higher than the second heat treatment temperature.

    摘要翻译: 为了简化包括剥离步骤的半导体器件的制造方法中的剥离步骤。 在基板上形成具有金属膜的第一层; 在具有金属膜的第一层上形成具有晶体管的第二层; 在具有晶体管的层上施加树脂材料; 通过在第一热处理温度下的热处理固化树脂材料,以形成树脂层; 通过在比第一热处理温度高的第二热处理温度下进行热处理从晶片上剥离具有晶体管的层; 在比第二热处理温度高的第三热处理温度下进行热处理,从具有晶体管的层剥离树脂层。

    Manufacturing method of semiconductor device including peeling step
    2.
    发明授权
    Manufacturing method of semiconductor device including peeling step 有权
    包括剥离步骤的半导体器件的制造方法

    公开(公告)号:US08030132B2

    公开(公告)日:2011-10-04

    申请号:US11442216

    申请日:2006-05-30

    IPC分类号: H01L21/027 H01L31/0392

    CPC分类号: H01L27/12 H01L21/84

    摘要: To simplify a peeling step in a method for manufacturing a semiconductor device including the peeling step. A first layer having a metal film is formed over a substrate; a second layer having a transistor is formed over the first layer having the metal film; a resin material is applied over the layer having the transistor; the resin material is cured by a heat treatment at a first heat treatment temperature to form a resin layer; the layer having the transistor is peeled from the substrate by a heat treatment at a second heat treatment temperature which is higher than the first heat treatment temperature; and the resin layer is peeled from the layer having the transistor by a heat treatment at a third heat treatment temperature which is higher than the second heat treatment temperature.

    摘要翻译: 为了简化包括剥离步骤的半导体器件的制造方法中的剥离步骤。 在基板上形成具有金属膜的第一层; 在具有金属膜的第一层上形成具有晶体管的第二层; 在具有晶体管的层上施加树脂材料; 通过在第一热处理温度下的热处理固化树脂材料,以形成树脂层; 通过在比第一热处理温度高的第二热处理温度下进行热处理从晶片上剥离具有晶体管的层; 在比第二热处理温度高的第三热处理温度下进行热处理,从具有晶体管的层剥离树脂层。

    Manufacturing method of semiconductor device
    3.
    发明授权
    Manufacturing method of semiconductor device 有权
    半导体器件的制造方法

    公开(公告)号:US07465674B2

    公开(公告)日:2008-12-16

    申请号:US11437983

    申请日:2006-05-22

    IPC分类号: H01L21/311

    摘要: An object of the present invention is to provide a method for manufacturing a semiconductor device with high reliability, at low cost, in which an element forming layer having a thin film transistor and the like provided over a substrate is peeled from the substrate, so that a semiconductor device is manufactured. According to the invention, a metal film is formed over a substrate, a plasma treatment is performed to the metal film in a dinitrogen monoxide atmosphere to form a metal oxide film over the metal film, a first insulating film is formed continuously without being exposed to the air, an element forming layer is formed over the first insulating film, and the element forming layer is peeled from the substrate, so that a semiconductor device is manufactured.

    摘要翻译: 本发明的目的是提供一种以低成本制造具有高可靠性的半导体器件的方法,其中设置在衬底上的薄膜晶体管等的元件形成层从衬底上剥离,使得 制造半导体器件。 根据本发明,在基板上形成金属膜,在一氧化二氮气氛中对金属膜进行等离子体处理,在金属膜上形成金属氧化物膜,连续形成第一绝缘膜而不暴露于 在第一绝缘膜上形成元件形成层的空气,并且元件形成层从基板剥离,从而制造半导体器件。

    Manufacturing method of semiconductor device
    4.
    发明申请
    Manufacturing method of semiconductor device 有权
    半导体器件的制造方法

    公开(公告)号:US20060270191A1

    公开(公告)日:2006-11-30

    申请号:US11437983

    申请日:2006-05-22

    IPC分类号: H01L21/30

    摘要: An object of the present invention is to provide a method for manufacturing a semiconductor device with high reliability, at low cost, in which an element forming layer having a thin film transistor and the like provided over a substrate is peeled from the substrate, so that a semiconductor device is manufactured. According to the invention, a metal film is formed over a substrate, a plasma treatment is performed to the metal film in a dinitrogen monoxide atmosphere to form a metal oxide film over the metal film, a first insulating film is formed continuously without being exposed to the air, an element forming layer is formed over the first insulating film, and the element forming layer is peeled from the substrate, so that a semiconductor device is manufactured.

    摘要翻译: 本发明的目的是提供一种以低成本制造具有高可靠性的半导体器件的方法,其中设置在衬底上的薄膜晶体管等的元件形成层从衬底上剥离,使得 制造半导体器件。 根据本发明,在基板上形成金属膜,在一氧化二氮气氛中对金属膜进行等离子体处理,在金属膜上形成金属氧化物膜,连续形成第一绝缘膜而不暴露于 在第一绝缘膜上形成元件形成层的空气,并且元件形成层从基板剥离,从而制造半导体器件。

    Method for manufacturing semiconductor device, and semiconductor device
    6.
    发明授权
    Method for manufacturing semiconductor device, and semiconductor device 有权
    半导体装置的制造方法以及半导体装置

    公开(公告)号:US07588969B2

    公开(公告)日:2009-09-15

    申请号:US11417182

    申请日:2006-05-04

    IPC分类号: H01L21/00

    摘要: The present invention provides a manufacturing method of a thinned semiconductor device with high reliability at low cost and a semiconductor device manufactured by the method. A peeling layer, a transistor, and an insulating layer are formed in this order over a substrate, an opening is formed so as to expose at least a part of the peeling layer, and the transistor is peeled off from the substrate by a physical means. The peeling layer is formed by forming a metal film and a metal oxide film so as to be in contact with the metal film by a method using a solution.

    摘要翻译: 本发明提供一种以低成本实现高可靠性的薄型半导体器件的制造方法以及通过该方法制造的半导体器件。 在衬底上依次形成剥离层,晶体管和绝缘层,形成开口以使至少一部分剥离层露出,并且晶体管通过物理手段从衬底剥离 。 通过使用溶液的方法,通过形成金属膜和金属氧化物膜以与金属膜接触来形成剥离层。

    Semiconductor device and manufacturing method of semiconductor device
    7.
    发明授权
    Semiconductor device and manufacturing method of semiconductor device 有权
    半导体器件及半导体器件的制造方法

    公开(公告)号:US08039353B2

    公开(公告)日:2011-10-18

    申请号:US12854060

    申请日:2010-08-10

    摘要: The present invention provides a thin and bendable semiconductor device utilizing an advantage of a flexible substrate used in the semiconductor device, and a method of manufacturing the semiconductor device. The semiconductor device has at least one surface covered by an insulating layer which serves as a substrate for protection. In the semiconductor device, the insulating layer is formed over a conductive layer serving as an antenna such that the value in the thickness ratio of the insulating layer in a portion not covering the conductive layer to the conductive layer is at least 1.2, and the value in the thickness ratio of the insulating layer formed over the conductive layer to the conductive layer is at least 0.2. Further, not the conductive layer but the insulating layer is exposed in the side face of the semiconductor device, and the insulating layer covers a TFT and the conductive layer. In addition, a substrate covering an element formation layer side is a substrate having a support on its surface is used in the manufacturing process.

    摘要翻译: 本发明提供了利用半导体器件中使用的柔性衬底的优点的薄且可弯曲的半导体器件以及半导体器件的制造方法。 半导体器件具有被绝缘层覆盖的至少一个表面,该绝缘层用作用于保护的衬底。 在半导体器件中,绝缘层形成在用作天线的导电层上,使得不覆盖导电层的部分中的绝缘层的厚度比值至少为1.2,并且该值 在导电层上形成的绝缘层与导电层的厚度比为至少0.2。 此外,导电层而不是绝缘层不会在半导体器件的侧面露出,并且绝缘层覆盖TFT和导电层。 此外,在制造过程中使用覆盖元件形成层侧的基板是其表面上具有支撑体的基板。

    Carbazole compound, light-emitting element material, and organic semiconductor material
    10.
    发明授权
    Carbazole compound, light-emitting element material, and organic semiconductor material 有权
    咔唑化合物,发光元件材料和有机半导体材料

    公开(公告)号:US08674114B2

    公开(公告)日:2014-03-18

    申请号:US13469619

    申请日:2012-05-11

    IPC分类号: C07D409/14

    摘要: A novel carbazole compound that can be used for a transport layer, a host material, or a light-emitting material in a light-emitting element. In the carbazole compound, two carbazole skeletons each include carbazole, the 3-position of which is bonded to the 4-position of a dibenzofuran skeleton or a dibenzothiophene skeleton and these two carbazole skeletons are linked via benzene or biphenyl. The carbazole compound has an excellent carrier-transport property and a wide energy gap and can be suitably used for a material in a light-emitting element or for an organic semiconductor material.

    摘要翻译: 可用于发光元件中的输送层,主体材料或发光材料的新型咔唑化合物。 在咔唑化合物中,两个咔唑骨架各自包含咔唑,其3-位与二苯并呋喃骨架或二苯并噻吩骨架的4-位结合,并且这两个咔唑骨架通过苯或联苯连接。 咔唑化合物具有优异的载流子传输性和宽的能隙,并且可以适用于发光元件或有机半导体材料中的材料。